Patents by Inventor Yong-Lin Wu

Yong-Lin Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Linear chromatic confocal microscopic system
    Patent number: 8599372
    Abstract: The present invention provides a chromatic confocal microscopic system in which two conjugate fiber modules are spatially configured and employed to conduct a detecting light from a light source and an object light reflected from an object, respectively. By means of the two spatially corresponding fiber modules, the detecting light is projected on the object and the reflected light from the object is entered into the other fiber module. Since each fiber of the fiber module is capable of filtering out the unfocused light and stray lights and allowing the focused light pass therethrough a line slit, thereby minimizing potential interference from light cross talk caused by the overlapped light spots, not only can the present invention obtain the information of surface profile of the object with high vertical measurement resolution, but also achieve high lateral resolution during confocal measurement.
    Type: Grant
    Filed: July 22, 2011
    Date of Patent: December 3, 2013
    Assignee: National Taipei University of Technology
    Inventors: Liang-Chia Chen, Yong-Lin Wu, Yi-Wei Chang
  • LINEAR CHROMATIC CONFOCAL MICROSCOPIC SYSTEM
    Publication number: 20120019821
    Abstract: The present invention provides a chromatic confocal microscopic system in which two conjugate fiber modules are spatially configured and employed to conduct a detecting light from a light source and an object light reflected from an object, respectively. By means of the two spatially corresponding fiber modules, the detecting light is projected on the object and the reflected light from the object is entered into the other fiber module. Since each fiber of the fiber module is capable of filtering out the unfocused light and stray lights and allowing the focused light pass therethrough a line slit, thereby minimizing potential interference from light cross talk caused by the overlapped light spots, not only can the present invention obtain the information of surface profile of the object with high vertical measurement resolution, but also achieve high lateral resolution during confocal measurement.
    Type: Application
    Filed: July 22, 2011
    Publication date: January 26, 2012
    Applicant: NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY
    Inventors: LIANG-CHIA CHEN, Yong-Lin Wu, Yi-Wei Chang