Patents by Inventor Yong-Shun Liao

Yong-Shun Liao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6936408
    Abstract: Within a method for fabricating a microelectronic fabrication there is employed a patterned positive photoresist residue layer as a protective layer within an aperture when processing an upper region of a topographic microelectronic layer having formed therein the aperture. The patterned positive photoresist residue layer is formed employing an incomplete vertical, but complete horizontal, blanket photoexposure and development of a blanket positive photoresist layer formed upon the topographic microelectronic layer and filling the aperture. The method provides the microelectronic fabrication with enhanced reliability.
    Type: Grant
    Filed: July 16, 2002
    Date of Patent: August 30, 2005
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Yong-Shun Liao, Juing-Yi Wu, Dian-Hau Chen, Zhen-Cheng Chou
  • Publication number: 20040013981
    Abstract: Within a method for fabricating a microelectronic fabrication there is employed a patterned positive photoresist residue layer as a protective layer within an aperture when processing an upper region of a topographic microelectronic layer having formed therein the aperture. The patterned positive photoresist residue layer is formed employing an incomplete vertical, but complete horizontal, blanket photoexposure and development of a blanket positive photoresist layer formed upon the topographic microelectronic layer and filling the aperture. The method provides the microelectronic fabrication with enhanced reliability.
    Type: Application
    Filed: July 16, 2002
    Publication date: January 22, 2004
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yong-Shun Liao, Juing-YI Wu, Dian-Hau Chen, Zhen-Cheng Chou
  • Patent number: 6219171
    Abstract: An apparatus and a method for stepper exposure control by utilizing a shutter assembly formed of electro-optic crystal materials in a photolithographic process are disclosed. In the apparatus, a series of control panels are stacked together to form a shutter assembly. Each of the control panel is formed by depositing a multiplicity of parallel, spaced-apart lines of electro-optic crystal material on a polarizer sheet. Two of such polarizer sheets are then stacked together with the lines parallel to each other and the lines on the top panel overlapping the spacing on the bottom panel. Two bottom panels are formed similarly however, positioned with the lines perpendicular to the lines in the first and second control panel when assembled together in the shutter assembly. A suitable electro-optic crystal material used should withstand a high temperature environment. One of such suitable material is LiNbO3.
    Type: Grant
    Filed: June 3, 1999
    Date of Patent: April 17, 2001
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd
    Inventors: Yong-Shun Liao, Wen-Jye Chung