Patents by Inventor Yong Su Kwon

Yong Su Kwon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10494343
    Abstract: The present invention relates to a novel organic compound, a near-infrared fluorescent constant medium containing the same, and a method for nano-granulating the constant medium.
    Type: Grant
    Filed: January 11, 2016
    Date of Patent: December 3, 2019
    Assignees: COLLEGE OF MEDICINE POCHON CHA UNIV. INDUSTRY-ACADEMIC COOPERATION FOUNDATION, CHAMEDITECH CO., LTD.
    Inventors: Tae Jong Yoon, Kwang Hoe Chung, Jeongbeob Seo, Sin Wook Kang, Kwang Hyuong Lee, Yong Su Kwon, Hye Sun Jeon, Chae Woon Lee, Jin Sung Kim
  • Publication number: 20180327357
    Abstract: The present invention relates to a novel organic compound, a near-infrared fluorescent constant medium containing the same, and a method for nano-granulating the constant medium.
    Type: Application
    Filed: January 11, 2016
    Publication date: November 15, 2018
    Inventors: Tae Jong Yoon, Kwang Hoe Chung, Jeongbeob Seo, Sin Wook Kang, Kwang Hyuong Lee, Yong Su Kwon, Hye Sun Jeon, Chae Woon Lee, Jin sung Kim
  • Patent number: 6051968
    Abstract: A test board is provided to reduce the test time for integrated circuits required by the necessity to stabilize bias voltages applied to IC devices. The test board includes a capacitor connected to specific input terminals of the IC device and a capacitor charging circuit connected between the input terminals of the IC device and the capacitor charging circuit via switches. A testing method using this circuit includes the steps of mounting a test board to a tester, placing the IC device onto the test board, charging the capacitor by driving the capacitor charging circuit, and testing the IC devices according to test items. The test board used in this method includes application circuits for applying bias voltages to the IC device, a capacitor connected between the IC device and a ground terminal, and a capacitor charging circuit for charging the capacitor.
    Type: Grant
    Filed: August 1, 1997
    Date of Patent: April 18, 2000
    Assignee: Samsung Electroincs Co., Ltd.
    Inventors: Weon Seob Shim, Weon Sik Park, Chan Ho Choi, Yong Su Kwon
  • Patent number: 6043442
    Abstract: A test method for testing an integrated circuit (IC) device, including a step of checking the handler contacts with IC devices to be tested after a test apparatus and a handler are completely set up and before actual testing operations commence. The handler contact check device includes a handler contact check board mounted to the handler, which is provided with a plurality of pins directly contacting outer terminals of the IC devices, and wiring circuits for transferring contact check electrical signals from a test apparatus to the contacts between the plurality of pins and the outer terminals, and for transferring output electrical signals from the contacts to the test apparatus, and a contact check package device having the same shape and outer terminals as the IC devices to be tested.
    Type: Grant
    Filed: February 27, 1997
    Date of Patent: March 28, 2000
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Won Sik Park, Weon Seob Shim, Chan Ho Choi, Yong Su Kwon
  • Patent number: D1017611
    Type: Grant
    Filed: June 26, 2023
    Date of Patent: March 12, 2024
    Assignee: Samsung Display Co., Ltd.
    Inventors: Ho Jung Lee, Kyung Hyun Ko, Yong Woo Koo, Jun Il Kwon, Pablo Kim, Young-Su Kim, Jun Woo Kim, Hoon Kim, Hye Suk An, Hyun Joo Lee, Ki Ho Lim