Abstract: Provided is a memory system and wear-leveling method. A memory system includes a flash memory device and a memory controller. The flash memory device includes a plurality of memory blocks, each including a plurality of memory cells. The memory controller is configured to control the flash memory device based on erase event information and error checking and correction (ECC) event information of each of the memory blocks such that use of the memory blocks is distributed more uniformly.

Abstract: Provided is a memory system and wear-leveling method. A memory system includes a flash memory device and a memory controller. The flash memory device includes a plurality of memory blocks, each including a plurality of memory cells. The memory controller is configured to control the flash memory device based on erase event information and error checking and correction (ECC) event information of each of the memory blocks such that use of the memory blocks is distributed more uniformly.

Abstract: Disclosed are program and read methods for a nonvolatile memory system, including determining to program first data in which one of fast and normal modes; providing the first data with an error code generated by a multi-bit ECC engine, in the fast mode, and generating second data; programming the second data in a cell array by a program voltage having a second start level higher than a first start level; and reading the second data from the cell array, the second data being output after processed by the multi-bit ECC engine that detects and corrects an error from the second data.

Abstract: Provided is a memory system and wear-leveling method. A memory system includes a flash memory device and a memory controller. The flash memory device includes a plurality of memory blocks, each including a plurality of memory cells. The memory controller is configured to control the flash memory device based on erase event information and error checking and correction (ECC) event information of each of the memory blocks such that use of the memory blocks is distributed more uniformly.

Abstract: A data processing method of a memory controller includes receiving first partial data of a last sector data among a plurality of sector data to be stored in an n-th page of a non-volatile memory in a program operation; padding the first partial data with first dummy data and generating a first error correction code (ECC) parity in the program operation; and transferring the first partial data and the first ECC parity to the non-volatile memory in the program operation, while refraining from transferring the first dummy data to the non-volatile memory. Related devices and systems are also described.

Abstract: A memory system is provided. The memory system includes a nonvolatile memory and a controller. The nonvolatile memory includes a memory cell array and a read/write circuit configured to perform a read/write operation in the memory cell array during a read operation. The controller is configured to receive the read data from the nonvolatile memory, perform an error detection and correction operation on the read data. Upon detecting an error in a received portion of the read data, the controller is further configured to halt further transmission of the read data from the nonvolatile memory, perform the error detection and correction operation on the received portion of the read data to correct the detected error. After correcting the detected error in the received portion of the read data, the controller is configured to resume transmission of the read data from the nonvolatile memory.

Abstract: A data processing method of a memory controller includes receiving first partial data of a last sector data among a plurality of sector data to be stored in an n-th page of a non-volatile memory in a program operation; padding the first partial data with first dummy data and generating a first error correction code (ECC) parity in the program operation; and transferring the first partial data and the first ECC parity to the non-volatile memory in the program operation, while refraining from transferring the first dummy data to the non-volatile memory. Related devices and systems are also described.

Abstract: An error correction circuit, an error correction method, and a semiconductor memory device including the error correction circuit are provided. The error correction circuit includes a partial syndrome generator, first and second error position detectors, a coefficient calculator, and a determiner. The partial syndrome generator calculates at least two partial syndromes using coded data. The first error position detector calculates a first error position using a part of the partial syndromes. The coefficient calculator calculates coefficients of an error position equation using the at least two partial syndromes. The determiner determines an error type based on the coefficients. The second error position detector optionally calculates a second error position based on the error type.

Abstract: An error correction circuit and method for reducing a miscorrection probability and a semiconductor memory device including the circuit are provided. The error correction circuit includes an error check and correction (ECC) encoder and an ECC decoder. The ECC encoder generates syndrome data enabling h-bit error correction based on information data and a generator polynomial, where “h” is 2 or an integer greater than 2. The ECC decoder may operate in a single mode for detecting an error position with respect to a maximum of (h?j) bits in the information data based on encoded data including the information and the syndrome data, where “j” is 1 or an integer greater than 1.

Abstract: A memory controller includes a microprocessor, a queue configured to store a plurality of first commands provided by the microprocessor, a queue management block configured to interpret and control said plurality of first commands, and a command generator configured to provide a plurality of second commands under control of the queue management block. The queue management block may simultaneously perform the plurality of second commands so as to simultaneously access a plurality of non-volatile memory units.

Abstract: An error correction circuit, an error correction method, and a semiconductor memory device including the error correction circuit are provided. The error correction circuit includes a partial syndrome generator, first and second error position detectors, a coefficient calculator, and a determiner. The partial syndrome generator calculates at least two partial syndromes using coded data. The first error position detector calculates a first error position using a part of the partial syndromes. The coefficient calculator calculates coefficients of an error position equation using the at least two partial syndromes. The determiner determines an error type based on the coefficients. The second error position detector optionally calculates a second error position based on the error type.

Abstract: A memory system is provided. The memory system includes a nonvolatile memory and a controller. The nonvolatile memory includes a memory cell array and a read/write circuit configured to perform a read/write operation in the memory cell array during a read operation. The controller is configured to receive the read data from the nonvolatile memory, perform an error detection and correction operation on the read data. Upon detecting an error in a received portion of the read data, the controller is further configured to halt further transmission of the read data from the nonvolatile memory, perform the error detection and correction operation on the received portion of the read data to correct the detected error. After correcting the detected error in the received portion of the read data, the controller is configured to resume transmission of the read data from the nonvolatile memory.

Abstract: Provided is a memory system and wear-leveling method. A memory system includes a flash memory device and a memory controller. The flash memory device includes a plurality of memory blocks, each including a plurality of memory cells. The memory controller is configured to control the flash memory device based on erase event information and error checking and correction (ECC) event information of each of the memory blocks such that use of the memory blocks is distributed more uniformly.

Abstract: Disclosed are program and read methods for a nonvolatile memory system, including determining to program first data in which one of fast and normal modes; providing the first data with an error code generated by a multi-bit ECC engine, in the fast mode, and generating second data; programming the second data in a cell array by a program voltage having a second start level higher than a first start level; and reading the second data from the cell array, the second data being output after processed by the multi-bit ECC engine that detects and corrects an error from the second data.

Abstract: An error correction circuit and method for reducing a miscorrection probability and a semiconductor memory device including the circuit are provided. The error correction circuit includes an error check and correction (ECC) encoder and an ECC decoder. The ECC encoder generates syndrome data enabling h-bit error correction based on information data and a generator polynomial, where “h” is 2 or an integer greater than 2. The ECC decoder may operate in a single mode for detecting an error position with respect to a maximum of (h?j) bits in the information data based on encoded data including the information and the syndrome data, where “j” is 1 or an integer greater than 1.

Abstract: An error correction circuit, an error correction method, and a semiconductor memory device including the error correction circuit are provided. The error correction circuit includes a partial syndrome generator, first and second error position detectors, a coefficient calculator, and a determiner. The partial syndrome generator calculates at least two partial syndromes using coded data. The first error position detector calculates a first error position using a part of the partial syndromes. The coefficient calculator calculates coefficients of an error position equation using the at least two partial syndromes. The determiner determines an error type based on the coefficients. The second error position detector optionally calculates a second error position based on the error type.