Abstract: A unified test system for testing the performance of a printed circuit board assembly, and a test method using the same. A masking board and a printed circuit board assembly are loaded onto a pin board from which test process connection pins having different height project. The test process connection pins, a power input connector and a signal interface connector are connected with the printed circuit board assembly and pins installed on the printed circuit board assembly. Thereafter, in-circuit-test signals are generated to test the printed circuit board assembly. Only function-circuit-test connection pins among the test process connection pins are connected with the printed circuit board assembly, and functions between the printed circuit board assembly and a head disk assembly are tested. Finally, results of the in-circuit-test process and the function-circuit-test process are displayed.