Abstract: A method, including: identifying static application features of an application; identifying resource access features of the application; labeling a translation lookaside buffer (TLB) miss threshold of a runtime feature of the application; determining utilization of larger pages during the runtime based on the TLB miss threshold; and setting the TLB miss threshold based on the determined utilization of the larger pages.

Abstract: Methods, systems, and computer program products for de-duplicating data in executable files in a container image are disclosed. The method may include receiving a request to read a file in a first layer in a container image including a plurality of layers, wherein the file is a delta file which is from an updated executable file based on a base executable file, the base executable file is in a lower layer than the first layer in the container image, and the delta file includes block mappings between the updated executable file and the base executable file and different data between the two files, and blocks included in the two files are based on respective file structure. The method may also include restoring the updated executable file based on the delta file and the base executable file. The method may further include returning data in the updated executable file.

Abstract: An embodiment includes generating a caller list of callers that issue requests for calling a designated program at runtime. The embodiment also includes generating an authorized caller list of authorized callers allowed to call the designated program, wherein the authorized callers are selected from among callers on the caller list. The embodiment also includes generating an authorization key for each of the authorized callers that the designated program will require as a condition for completing call requests.

Abstract: Mechanisms are provided for scheduling a workload in a cloud computing system. A cloud affinity factor (CAF) computer model is trained, via a machine learning process based on a training dataset comprising static characteristics of a workload binary for a workload, and dynamic characteristics corresponding to historical performance data for the workload, such that the trained CAF computer model predicts a performance classification for a given workload binary. The trained CAF computer model processes a new workload to generate a performance classification for the new workload. Cloud affinity factor(s) are generated based on the performance classification for the new workload. Node affinity and dispatch rule(s) are applied to the cloud affinity factor(s) to select one or more nodes of the cloud computing system to which to dispatch the workload. The workload is then scheduled on the selected one or more nodes.

Abstract: Water-soluble, cell-permeable nanomicelles containing ceramides and a steviol glycoside, such as rubusoside, are disclosed. The ceramide-steviol glycoside complex has high water solubility, and can be used for treating cancers with p53 mutations. Preliminary results have shown that the Cer nanomicelles are effective in restoring p53 protein expression, and that they are functionally dominant over p53 mutants. The novel nanomicelles restore a wild-type phenotype, and have very low toxicity to noncancerous cells. The novel Cer nanomicelles may be used in treating p53-associated cancers.

Abstract: The invention relates generally to a color 3D printer based on ultraviolet (UV) energy-curable high quality color coating on transparent or translucent base material. More particularly, the invention deals with the use of a Light Emitting Diode (LED) UV-curable ink-jet printing technique with high spatial and color selectivity for coating the base material deposited using additive manufacturing technology in a repeated process for building color 3D object. Each layer of the deposited base material is selectively colored with 2D pattern based on the required 3D color representation of the 3D object, either effectively inside the build volume or on the build surface, or both effectively inside the build volume and on the build surface of the 3D object. The colored 3D object formed using the method described in the present invention is capable of achieving high quality color rendering at relatively high spatial and color resolutions.

Abstract: One aspect of the present disclosure provides a probing apparatus with on-probe device-mapping function. A probing apparatus according to this aspect of the present disclosure comprises a housing, at least one probe stage positioned on the housing and configured to retain at least one probe, a device holder positioned in the housing and configured to receive at least one semiconductor device under test, and an inspection module having a predetermined field of view configured to capture an image showing at least the semiconductor device, wherein the probe stage includes a driving unit configured to move the probe out of focus of the inspection module in a mapping phase while keeping the device under test in the field of view of the optical inspection module.

Abstract: One aspect of the present disclosure provides a probing apparatus with on-probe device-mapping function. A probing apparatus according to this aspect of the present disclosure comprises a housing, at least one probe stage positioned on the housing and configured to retain at least one probe, a device holder positioned in the housing and configured to receive at least one semiconductor device under test, and an inspection module having a predetermined field of view configured to capture an image showing at least the semiconductor device, wherein the probe stage includes a driving unit configured to move the probe out of focus of the inspection module in a mapping phase while keeping the device under test in the field of view of the optical inspection module.

Abstract: A probing apparatus for semiconductor devices includes a housing configured to define a testing chamber, a device holder positioned in the housing and configured to receive at least one device under test, and at least one probe stage positioned in the housing. In one embodiment of the present disclosure, the probe stage includes a base, a retaining arm pivotally coupled with the base and having a retaining portion configured to retain at least one probe, and a stepper positioned on the base. In one embodiment of the present disclosure, the stepper is configured in response to an electric signal to move the probe downward through the retaining arm to contact a device under test and to move the probe upward through the retaining arm to separate from the device under test such that the up-and-down movement of the probe can be performed at relatively high frequency of typically greater than six cycles per second.

Abstract: A microscope includes an object splitter configured to split the object image into a first optical path and a second optical path, a first imaging module positioned on the first path and a second imaging module positioned on the second path. The object splitter includes a first beam splitter configured to direct an illumination light to an object, an objective lens configured to collect the reflected light from the object and couple the reflected light on the first beam splitter, and a second beam splitter configured to split the reflected light into the first optical path and the second optical path, wherein the distance between the object and the objective lens is constant.

Abstract: A microscope comprises an object splitter and a plurality of image-outputting devices configured to receive object images. The object splitter includes a first beam splitter configured to direct an illumination light to an object, a positive lens configured to collect a reflected light from the object and focus the reflected light on the first beam splitter, a second beam splitter configured to split the reflected light into a plurality of optical paths and a plurality of negative lenses positioned on the optical paths to render object images. A probing apparatus for an integrated circuit device comprises at least one probe pin configured to contact a pad of the integrated circuit device and a microscope including an object splitter and a plurality of image-outputting devices configured to receive images from the object splitter.

Abstract: A mechanical scanning stage for high speed image acquisition in a focused beam system. The mechanical scanning stage preferably is a combination of four stages. A first stage provides linear motion. A second stage, above the first stage, provides rotational positioning. A third stage above the rotational stage is moveable in a first linear direction, and the fourth stage above the third stage is positionable in a second linear direction orthogonal to the first direction. The four stages are responsive to input from a controller programmed with a polar coordinate pixel addressing method, for positioning a specimen mounted on the mechanical stage to allow an applied static focus beam to irradiate selected areas of interest, thereby imaged by collecting signals from the specimen using a polar coordinate pixel addressing method.

Abstract: A mechanical scanning stage for high speed image acquisition in a focused beam system. The mechanical scanning stage preferably is a combination of four stages. A first stage provides linear motion. A second stage, above the first stage, provides rotational positioning. A third stage above the rotational stage is moveable in a first linear direction, and the fourth stage above the third stage is positionable in a second linear direction orthogonal to the first direction. The four stages are responsive to input from a controller programmed with a polar coordinate pixel addressing method, for positioning a specimen mounted on the mechanical stage to allow an applied static focus beam to irradiate selected areas of interest, thereby imaged by collecting signals from the specimen using a polar coordinate pixel addressing method.

Abstract: A mechanical scanning stage for high speed image acquisition in a focused beam system. The mechanical scanning stage preferably is a combination of four stages. A first stage provides linear motion. A second stage, above the first stage, provides rotational positioning. A third stage above the rotational stage is moveable in a first linear direction, and the fourth stage above the third stage is positionable in a second linear direction orthogonal to the first direction. The four stages are responsive to input from a controller programmed with a polar coordinate pixel addressing method, for positioning a specimen mounted on the mechanical stage to allow an applied static focus beam to irradiate selected areas of interest, thereby imaged by collecting signals from the specimen using a polar coordinate pixel addressing method.

Abstract: A mechanical scanning stage for high speed image acquisition in a focused beam system. The mechanical scanning stage preferably is a combination of four stages. A first stage provides linear motion. A second stage, above the first stage, provides rotational positioning. A third stage above the rotational stage is moveable in a first linear direction, and the fourth stage above the third stage is positionable in a second linear direction orthogonal to the first direction. The four stages are responsive to input from a controller programmed with a polar coordinate pixel addressing method, for positioning a specimen mounted on the mechanical stage to allow an applied static focus beam to irradiate selected areas of interest, thereby imaged by collecting signals from the specimen using a polar coordinate pixel addressing method.

Abstract: This invention relates in general to methods and compositions for reversing the drug resistance of cancer cells. In particular this invention is directed to inhibition of drug resistance in cancer cells or to the induction of apoptosis in cancer cells by the use of glucosylceramide synthase antisense compounds. This invention is further directed to compositions comprising glucosylceramide synthase antisense compounds and a kit or drug delivery system comprising the compositions.

Abstract: An integrated emission microscope with an emitted radiation detection system for collecting and analyzing radiation from a device under test. A semi-ellipsoidal mirror of high ellipticity directs emitted radiation from the device under test through an aperture to a radiation guide, Which transmits the radiation to spectral analyzer. The device under test may be mounted on a scanning stage. The system permits high spatial resolution selected area spectroscopic analysis, panchromatic imaging, and spectroscopic mapping of the emitted radiation from the device under test.

Abstract: A mechanical scanning stage for high speed image acquisition in a focused beam system. The mechanical scanning stage preferably is a combination of four stages. A first stage provides linear motion. A second stage, above the first stage, provides rotational positioning. A third stage above the rotational stage is moveable in a first linear direction, and the fourth stage above the third stage is positionable in a second linear direction orthogonal to the first direction. The four stages are responsive to input from a controller programmed with a polar coordinate pixel addressing method, for positioning a specimen mounted on the mechanical stage to allow an applied static focus beam to irradiate selected areas of interest, thereby imaged by collecting signals from the specimen using a polar coordinate pixel addressing method.