Patents by Inventor Yongdong Wang
Yongdong Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20030210399Abstract: An optical resonance analysis system comprising a sensor means (60) and an illumination means (400) for generating non-monochromatic illumination. The illumination means (400) further comprises a means for generating illumination at a plurality of angles, a lens system for projecting said illumination at said plurality of angles (390) and a dispersive device (380) for dispersing said illumination at each of said plurality of angles so that there is a correlation between said plurality of angles and the wavelengths of said illumination such that a resonance condition is generated on said sensor mean (60) for all wavelengths generated by said non-monochromatic source simultaneously. The analysis system also comprises a detection means (90) for detecting the reflected or transmitted illumination. Another embodiment comprises an anamorphic imaging means (120).Type: ApplicationFiled: April 28, 2003Publication date: November 13, 2003Applicant: Applera CorporationInventors: Dar Bahatt, Jerry E. Cahill, Koichi Nishikida, Enrico G. Picozza, Paul G. Saviano, David H. Tracy, Yongdong Wang
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Patent number: 6629039Abstract: A method and apparatus is provided for detecting an impurity in a sample where an index can be calculated to assess purity in the presence of n major components with signal averaging or noise-filtering automatically built-in. The method and apparatus can be applied to liquid chromatography impurity detection using UV-VIS spectrophotometry based on robust matrix algebra representing the entire spectral space generated by the sample.Type: GrantFiled: April 27, 2000Date of Patent: September 30, 2003Assignee: PerkinElmer Instruments LLCInventor: Yongdong Wang
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Publication number: 20030160954Abstract: In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process to such an extent that variations of certain parameters, which alter the shape and/or occurrence of a spectral line, are compensated, a comparison spectral line or spectrum of a known comparison material is produced under substantially the same parameters as the sample. The comparison spectral line or spectrum is compared with an ideal comparison spectral line or spectrum in order to calculate a transfer function, and the transfer function is applied to the test spectral line or spectrum in order to calculate a corrected test spectral line or spectrum.Type: ApplicationFiled: February 20, 2003Publication date: August 28, 2003Inventors: Yongdong Wang, Bernhard H. Radziuk, David H. Tracy
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Patent number: 6600563Abstract: An optical resonance analysis system comprising a sensor means (60) and an illumination means (400) for generating non-monochromatic illumination. The illumination means (400) further comprises a means for generating illumination at a plurality of angles, a lens system for projecting said illumination at said plurality of angles (390) and a dispersive device (380) for dispersing said illumination at each of said plurality of angles so that there is a correlation between said plurality of angles and the wavelengths of said illumination such that a resonance condition is generated on said sensor mean (60) for all wavelengths generated by said non-monochromatic source simultaneously. The analysis system also comprises a detection means (90) for detecting the reflected or transmitted illumination. Another embodiment comprises an anamorphic imaging means (120).Type: GrantFiled: July 17, 2000Date of Patent: July 29, 2003Assignee: Applera CorporationInventors: Dar Bahatt, Jerry E. Cahill, Koichi Nishikida, Enrico G. Picozza, Paul G. Saviano, David H. Tracy, Yongdong Wang
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Publication number: 20030092194Abstract: A luminescence detecting apparatus and method for analyzing luminescent samples is disclosed. Luminescent samples are placed in a plurality of sample wells in a tray, and the tray is placed in a visible-light impervious chamber containing a charge coupled device camera. The samples may be injected in the wells, and the samples may be injected with buffers and reagents, by an injector. In the chamber, light from the luminescent samples pass through a collimator, a Fresnel field lens, a filter, and a camera lens, whereupon a focused image is created by the optics on the charge-coupled device (CCD) camera. The use of a Fresnel field lens, in combination with a collimator and filter, reduces crosstalk between samples below the level attainable by the prior art. Preferred embodiments of the luminescence detecting apparatus and method disclosed include central processing control of all operations, multiple wavelength filter wheel, and robot handling of samples and reagents.Type: ApplicationFiled: December 20, 2002Publication date: May 15, 2003Inventors: Michael R. Gambini, John C. Voyta, John Atwood, Bruce E. DeSimas, Edward Lakatos, Jeff Levi, Israel Metal, George Sabak, Yongdong Wang
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Patent number: 6518068Abstract: A luminescence detecting apparatus and method for analyzing luminescent samples is disclosed. Luminescent samples are placed in a plurality of sample wells in a tray, and the tray is placed in a visible-light impervious chamber containing a charge coupled device camera. The samples may be injected in the wells, and the samples may be injected with buffers and reagents, by an injector. In the chamber, light from the luminescent samples pass through a collimator, a Fresnel field lens, a filter, and a camera lens, whereupon a focused image is created by the optics on the charge-coupled device (CCD) camera. The use of a Fresnel field lens, in combination with a collimator and filter, reduces crosstalk between samples below the level attainable by the prior art. Preferred embodiments of the luminescence detecting apparatus and method disclosed include central processing control of all operations, multiple wavelength filter wheel, and robot handling of samples and reagents.Type: GrantFiled: July 21, 2000Date of Patent: February 11, 2003Assignee: Tropix, Inc.Inventors: Michael R. Gambini, John C. Voyta, John Atwood, Bruce E. DeSimas, II, Edward Lakatos, Jeff Levi, Israel Metal, George Sabak, Yongdong Wang
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Patent number: 6442606Abstract: A method and apparatus are provided for indexing electronic documents that include one or more visible text portions and one or more non-visible text portions. The method includes the step of identifying an electronic document. Once the electronic document is identified, a set of words is selected from a particular tag type that is associated with one or more non-visible text portions of the electronic document. Each word in the selected set of words is compared with words in the one or more visible text portions of the electronic document. An index word set is then determined for the electronic document based on matches between words in the selected set of words and words in the one or more visible text portions of the electronic document.Type: GrantFiled: August 12, 1999Date of Patent: August 27, 2002Assignee: Inktomi CorporationInventors: Ram Subbaroyan, Yongdong Wang, Paul Andre Gauthier, Douglas Michael Cook, Douglass Russell Judd
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Patent number: 6430513Abstract: Constituents such as oxy- and deoxy-hemoglobin are monitored non-invasively in an animal organ such as a brain with a spectrometric instrument by passing radiation through the organ. Concentrations are computed from the spectral intensities and from a statistical correlation model. To predetermine the correlation model, the procedures are effected for a plurality of organs of a same type with each organ having established concentrations of the selected constituents, and the correlation model is statistically determined from the concentrations and corresponding intensities. For more accuracy computations are normalized to path length which may be determined by utilizing several discrete wavelengths with RF modulations.Type: GrantFiled: January 7, 2000Date of Patent: August 6, 2002Assignee: PerkinElmer Instruments LLCInventors: Yongdong Wang, David H. Tracy, Paul G. Saviano, Alan M. Ganz, Koichi Nishikida, Gitesh Kumar
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Patent number: 6418383Abstract: An iterative method and apparatus for correction and compensation of analytical signals, such as spectrometric data, is provided which corrects for spectral cross-talk; compensates for spectral shift; and reduces error propagation. The method and apparatus can be applied to a multicomponent sample analysis using least squares procedure with differentiation while reducing noise propagation.Type: GrantFiled: February 11, 2000Date of Patent: July 9, 2002Assignee: PerkinElmer Instruments LLCInventor: Yongdong Wang
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Patent number: 6138082Abstract: For conversion of spectral information of an FTIR spectrometric instrument for comparison with that of a dispersion instrument, a first standard function is selected for spectral line shape for the first instrument, and a second standard function for line shape is selected for the second instrument. A conversion factor is computed for converting the first standard function to the second standard function. In ordinary operations, first spectral information is obtained with the first instrument for a first sample, and second spectral information is obtained with the second instrument for a second sample. The conversion factor is applied to the first spectral information to effect converted information, and the converted information is compared with the second spectral information. Such conversion also is applied between chromatographic instruments.Type: GrantFiled: December 18, 1997Date of Patent: October 24, 2000Assignee: The Perkin Elmer CorporationInventors: Yongdong Wang, Alan M. Ganz, David H. Tracy, David A. Huppler, John P. Coates
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Patent number: 6049762Abstract: Standardization is achieved for FTIR spectrometric instruments that effect an intrinsic distortion in spectral information, the distortion being associated with an aperture size. An idealized function of spectral line shape is specified. With a small calibration aperture, spectral data is obtained for a basic sample having known "true" spectral data, and standard spectral data also is obtained for a standard sample. With a larger, normal sized aperture, standard spectral data is obtained again for the calibration sample. A transformation factor, that is a function of this data and the standardized function, is applied to spectral data for test samples to effect standardized information. In another embodiment, the standard sample has known true spectral data, and the basic sample is omitted. In either case, the transformation factor is applied to the sample data in logarithm form, the antilogarithm of the result effects the standardized information.Type: GrantFiled: December 18, 1997Date of Patent: April 11, 2000Assignee: Perkin Elmer LLCInventors: Alan M. Ganz, Yongdong Wang, David H. Tracy, Robert A. Hoult, Jerry E. Cahill, David A. Huppler
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Patent number: 6029115Abstract: A spectrometric instrument includes a detector with detecting subarrays on small portions of the surface. Spectral data are acquired for selected subarrays at a first time for a drift standard, and compared to a zero position to obtain first offset data. Data are acquired similarly at a second time to obtain second offset data. The offset data are utilized to obtain a spectral shift for any subarray position at any selected time. The shift is applied to a matrix model used for converting test data to compositional information. Archive data for the model is obtained in the foregoing manner, using slit scanning in the instrument to achieve sub-increments smaller than the detector pixel size, with a procedure to assure that there is an integral number of scanning steps across one pixel. The drift standard may be chemical analytes, or an optical interference element producing fringes related to spectral positions in each subarray.Type: GrantFiled: September 30, 1997Date of Patent: February 22, 2000Assignee: Perkin Elmer LLCInventors: David H. Tracy, Alan M. Ganz, Yongdong Wang, David A. Huppler, Juan C. Ivaldi, Christopher B. Hanna
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Patent number: 5559728Abstract: A method for calibrating two-dimensional responses measured on multiple instruments or on a single instrument under different operating conditions. The method calculates two separate banded diagonal transformation matrices using the responses of a common standard sample to simultaneously correct for the response channel shift and intensity variations in both dimensions or orders. The two transformational matrices are estimated from a set of simultaneous non-linear equations via the Gauss-Newton method. The effects of noise and transformation matrix bandwidth on the standardization performance were studied through computer simulation. From computer simulation and experimental data, it was found that the design of the standard sample is crucial for the parameter estimations and response standardization.Type: GrantFiled: May 3, 1994Date of Patent: September 24, 1996Assignee: University of WashingtonInventors: Bruce R. Kowalski, Yongdong Wang
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Patent number: 5428558Abstract: A method and apparatus are provided for correction of spectra for stray radiation in a spectrometric instrument, involving a sequence of steps as follows. Spectral patterns are obtained with the instrument initially for monochromatic radiation at a plurality of selected calibration wavelengths. By computer program, the peak profile at the calibration wavelength in each pattern is replaced with a substitute based on the remaining pattern. The resulting data are interpolated to effect values denoted "stray proportions" for the ordered wavelengths of the instrument. Spectral data at each ordered wavelength are obtained with the instrument for a sample, and multiplied in the computer program by stray proportions for corresponding wavelengths to effect further sets of values denoted "stray portions" that are identified to the ordered wavelengths. Each set is identified to one of the wavelength increments of the instrument across the spectral range.Type: GrantFiled: December 17, 1993Date of Patent: June 27, 1995Assignee: The Perkin-Elmer CorporationInventors: Jerry E. Cahill, Alan M. Ganz, Paul Saviano, David Tracy, Yongdong Wang