Abstract: A full-screen optical component, applied to an electronic device comprising a display screen, comprising a backlight module, an active light sensor including a sensor and a light emitter, and a dimmer. The display screen and the active light sensor are located on two opposite sides of the backlight module. The backlight module includes a first prism film and a second prism film stacked on the first prism film. The first prism film includes several first prisms. The second prism film includes several second prisms. The first prism includes a first in-light surface, and the second prism includes a second in-light surface. A display surface of the display screen, the first in-light surface, and the second in-light surface are disposed in parallel. The dimmer is configured to direct light emitted by the light emitter to the first in-light surface at an incident angle that is inclined relative to a vertical direction.

Abstract: A full-screen optical component, applied to an electronic device comprising a display screen, comprising a backlight module, an active light sensor including a sensor and a light emitter, and a dimmer. The display screen and the active light sensor are located on two opposite sides of the backlight module. The backlight module includes a first prism film and a second prism film stacked on the first prism film. The first prism film includes several first prisms. The second prism film includes several second prisms. The first prism includes a first in-light surface, and the second prism includes a second in-light surface. A display surface of the display screen, the first in-light surface, and the second in-light surface are disposed in parallel. The dimmer is configured to direct light emitted by the light emitter to the first in-light surface at an incident angle that is inclined relative to a vertical direction.

Abstract: A calibration method for an absolute responsivity of a terahertz quantum well detector and a calibration device thereof, in which the device at least comprises: a driving power supply, a single frequency laser source, an optic, a terahertz array detector, a terahertz dynamometer, a current amplifier and an oscilloscope. The calibration method adopts a power detectable single frequency laser source as a calibration photosource, to obtain the absolute responsivity parameters of the detector at the laser frequency; a normalized photocurrent spectrum of the detector is used to further calculate the absolute responsivity parameters of the detector at any detectable frequency. the single frequency laser source with periodically output is adopted as a calibration photosource, the terahertz array detector and the dynamometer are adopted to directly measure and obtain the incident power of the calibrated detector.

Abstract: A calibration method for an absolute responsivity of a terahertz quantum well detector and a calibration device thereof, in which the device at least comprises: a driving power supply, a single frequency laser source, an optic, a terahertz array detector, a terahertz dynamometer, a current amplifier and an oscilloscope. The calibration method adopts a power detectable single frequency laser source as a calibration photosource, to obtain the absolute responsivity parameters of the detector at the laser frequency; a normalized photocurrent spectrum of the detector is used to further calculate the absolute responsivity parameters of the detector at any detectable frequency. the single frequency laser source with periodically output is adopted as a calibration photosource, the terahertz array detector and the dynamometer are adopted to directly measure and obtain the incident power of the calibrated detector.