Patents by Inventor Yonghwee Kim

Yonghwee Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • IDENTIFYING WEIGHTING MATERIAL SAG WITH PULSED NEUTRON LOGS
    Publication number: 20170192122
    Abstract: A method of identifying barite in a subterranean annulus that surrounds a wellbore, where the method includes detecting gamma rays in the wellbore that are generated from the annulus, obtaining a count rate of the detected gamma rays, comparing the count rate with reference data, and determining the presence of barite in the wellbore based on the comparison. The count rate can be a ratio of counts of detected gamma rays obtained from spaced apart receivers on a downhole tool, or a ratio of detected inelastic and capture gamma rays. The reference data is obtained by using a simulation algorithm.
    Type: Application
    Filed: January 6, 2016
    Publication date: July 6, 2017
    Inventors: Sandeep Gade, Qiong Zhang, David Chace, Feyzi Inanc, Otto N. Fanini, Yonghwee Kim
  • Identifying weighting material sag with pulsed neutron logs
    Patent number: 9696454
    Abstract: A method of identifying barite in a subterranean annulus that surrounds a wellbore, where the method includes detecting gamma rays in the wellbore that are generated from the annulus, obtaining a count rate of the detected gamma rays, comparing the count rate with reference data, and determining the presence of barite in the wellbore based on the comparison. The count rate can be a ratio of counts of detected gamma rays obtained from spaced apart receivers on a downhole tool, or a ratio of detected inelastic and capture gamma rays. The reference data is obtained by using a simulation algorithm.
    Type: Grant
    Filed: January 6, 2016
    Date of Patent: July 4, 2017
    Assignee: Baker Hughes Incorporated
    Inventors: Sandeep Gade, Qiong Zhang, David Chace, Feyzi Inanc, Otto N. Fanini, Yonghwee Kim