Patents by Inventor Yongnan CHEN

Yongnan CHEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12352794
    Abstract: A capacitance measurement circuit includes an analog front-end (AFE) circuit with current mirror circuits, a parasitic capacitor, an AD converter, an output shift register, and a controller. The controller disconnects a capacitor to be measured and connects one current mirror circuit to record an AFE output voltage VN collected at an inverting input terminal of the AD converter, then connects the capacitor to be measured to collect an AFE output voltage VP at a non-inverting input terminal of the AD converter, and converts a value of (VP?VN) into a first digital signal; determines, based on the value of the first digital signal, a connection number m of the current mirror circuits, controls the analog front-end circuit to connect m current mirror circuits, and repeat the steps to obtain a second digital signal; and shift the second digital signal based on the connection number m to obtain a capacitance measurement value.
    Type: Grant
    Filed: April 12, 2023
    Date of Patent: July 8, 2025
    Assignee: Guangzhou University
    Inventors: Yanhan Zeng, Haochang Zhi, Yongnan Chen, Junkai Chen, Jingci Yang, Tianxian Wu
  • Publication number: 20230314495
    Abstract: A capacitance measurement circuit includes an analog front-end (AFE) circuit with current mirror circuits, a parasitic capacitor, an AD converter, an output shift register, and a controller. The controller disconnects a capacitor to be measured and connects one current mirror circuit to record an AFE output voltage VN collected at an inverting input terminal of the AD converter, then connects the capacitor to be measured to collect an AFE output voltage VP at a non-inverting input terminal of the AD converter, and converts a value of (VP?VN) into a first digital signal; determines, based on the value of the first digital signal, a connection number m of the current mirror circuits, controls the analog front-end circuit to connect m current mirror circuits, and repeat the steps to obtain a second digital signal; and shift the second digital signal based on the connection number m to obtain a capacitance measurement value.
    Type: Application
    Filed: April 12, 2023
    Publication date: October 5, 2023
    Inventors: Yanhan ZENG, Haochang ZHI, Yongnan CHEN, Junkai CHEN, Jingci YANG, Tianxian WU