Patents by Inventor Yongpeng Mu

Yongpeng Mu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device under test simulation equipment
    Patent number: 12174244
    Abstract: Device under test (DUT) simulation equipment includes: a first circuit board including a first field programmable gate array (FPGA); a second circuit board including a processor; and a power distribution board, wherein the first circuit board is connected to the power distribution board, and the power of the first circuit board is supplied by the power distribution board, wherein the second circuit board is connected to the power distribution board, and the power of the second circuit board is supplied by the power distribution board, wherein when the DUT simulation equipment is connected to a tester to perform testing, the DUT simulation equipment simulates the performance of a DUT providing a response signal after receiving a test signal from the tester, and wherein, in the DUT simulation equipment, only the first circuit board receives the test signal from the tester, and the second circuit board controls the first circuit board by means of a control signal.
    Type: Grant
    Filed: July 22, 2021
    Date of Patent: December 24, 2024
    Assignee: Teradyne (Asia) Pte. Ltd.
    Inventors: Min Nie, Yi Hou, Siqiang Jia, Yang Xu, Jun Tang, Yongpeng Mu, Jun Liu, Bo Yu
  • DEVICE UNDER TEST SIMULATION EQUIPMENT
    Publication number: 20230366922
    Abstract: Device under test (DUT) simulation equipment includes: a first circuit board including a first field programmable gate array (FPGA); a second circuit board including a processor; and a power distribution board, wherein the first circuit board is connected to the power distribution board, and the power of the first circuit board is supplied by the power distribution board, wherein the second circuit board is connected to the power distribution board, and the power of the second circuit board is supplied by the power distribution board, wherein when the DUT simulation equipment is connected to a tester to perform testing, the DUT simulation equipment simulates the performance of a DUT providing a response signal after receiving a test signal from the tester, and wherein, in the DUT simulation equipment, only the first circuit board receives the test signal from the tester, and the second circuit board controls the first circuit board by means of a control signal.
    Type: Application
    Filed: July 22, 2021
    Publication date: November 16, 2023
    Applicant: Teradyne (Asia) Pte. Ltd.
    Inventors: Min Nie, Yi Hou, Siqiang Jia, Yang Xu, Jun Tang, Yongpeng Mu, Jun Liu, Bo Yu