Abstract: The present inventive concept relates to: a radiation detector including a bendable radiation detecting panel and a radiation inspection apparatus including same. The radiation detector includes: a radiation detecting panel which is flexible, extending in a first direction, and detecting radiation incident to a first face; and a bending support unit which is plate-shaped, provided on a second face of the radiation detecting panel opposite to the first face to support the radiation detecting panel, and having a flexibility. The flexibility of the bending support unit is less than a flexibility of the radiation detecting panel.

Abstract: Provided is a machine learning-based semiconductor manufacturing yield prediction system and method. A result prediction method according to an embodiment of the present invention comprises: learning different neural network models by classifying different types of data according to their types and respectively inputting the classified different types of data to the different neural network models; and predicting result values by classifying input data according to their types and respectively inputting the classified input data to different neural network models. Therefore, it is possible to apply different neural network models to respective data according to their types, thereby ensuring a neural network model having a structure appropriate for the characteristics of each type of data and thus accurately predicting a result value.

Abstract: A method and a system for providing a virtual semiconductor product replicating a real semiconductor product are provided. The method for providing the virtual semiconductor product according to an exemplary embodiment of the present disclosure includes: obtaining data which is used for manufacturing a real semiconductor; virtually producing a semiconductor product using the obtained manufacturing data; and providing the virtually produced virtual semiconductor product. Accordingly, the virtual semiconductor product replicating the real semiconductor product is provided in real time with real processing steps, such that time and expense required to measure and examine a semiconductor product can be minimized and a delay in producing semiconductor products is not caused.

Abstract: Provided is a machine learning-based semiconductor manufacturing yield prediction system and method. A result prediction method according to an embodiment of the present invention comprises: learning different neural network models by classifying different types of data according to their types and respectively inputting the classified different types of data to the different neural network models; and predicting result values by classifying input data according to their types and respectively inputting the classified input data to different neural network models. Therefore, it is possible to apply different neural network models to respective data according to their types, thereby ensuring a neural network model having a structure appropriate for the characteristics of each type of data and thus accurately predicting a result value.

Abstract: A method and a system for providing a virtual semiconductor product replicating a real semiconductor product are provided. The method for providing the virtual semiconductor product according to an exemplary embodiment of the present disclosure includes: obtaining data which is used for manufacturing a real semiconductor; virtually producing a semiconductor product using the obtained manufacturing data; and providing the virtually produced virtual semiconductor product. Accordingly, the virtual semiconductor product replicating the real semiconductor product is provided in real time with real processing steps, such that time and expense required to measure and examine a semiconductor product can be minimized and a delay in producing semiconductor products is not caused.

Abstract: Provided are a method of improving the gradation of an image, and an image display apparatus for performing the method.

Abstract: Provided are a method of improving the gradation of an image, and an image display apparatus for performing the method.

Abstract: Disclosed is an apparatus for projection display using reflection type LCDs. The apparatus for projection display using reflection type LCDs according to the invention comprises an illuminating device including a lamp and a polarizing element for illuminating S wave or P wave, a color splitter/synthesizer, including the reflection type LCDs for providing an image corresponding to an inputted image and converting a polarizing state of incident light when reflecting the light, a retarder stack for differentiating the polarized state of a predetermined color from the incident light, and polarizing beam splitters composed of a material having a photoelastic constant less than 0.03×10−6 mm2/N at a wavelength of 589.3 nm and a minimum transmittance higher than 90% in transmitting the thickness of 25 mm at a wavelength ranged 0.42 &mgr;m-0.