Patents by Inventor Yonjun Jeff Hu

Yonjun Jeff Hu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7411300
    Abstract: Structures and methods of fabricating portions of integrated circuit devices to reduce agglomeration tendencies of high surface-energy metals used in interconnects and contacts. Early transition metals having relatively low surface energies are chosen to form stable crystalline compounds rich in the high surface-energy metal. Agglomeration control layers containing such alloy compounds facilitate adhesion between the high surface-energy metal and an underlying layer of the integrated circuit device, such as a diffusion barrier layer. These agglomeration control layers may be nitrided to improve robustness at higher temperatures.
    Type: Grant
    Filed: February 3, 2006
    Date of Patent: August 12, 2008
    Assignee: Micron Technology, Inc.
    Inventor: Yonjun Jeff Hu
  • Patent number: 7071558
    Abstract: Structures and methods of fabricating portions of integrated circuit devices to reduce agglomeration tendencies of high surface-energy metals used in interconnects and contacts. Early transition metals having relatively low surface energies are chosen to form stable crystalline compounds rich in the high surface-energy metal. Agglomeration control layers containing such alloy compounds facilitate adhesion between the high surface-energy metal and an underlying layer of the integrated circuit device, such as a diffusion barrier layer. These agglomeration control layers may be nitrided to improve robustness at higher temperatures.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: July 4, 2006
    Assignee: Micron Technology, Inc.
    Inventor: Yonjun Jeff Hu
  • Patent number: 6900119
    Abstract: Structures and methods of fabricating portions of integrated circuit devices to reduce agglomeration tendencies of high surface-energy metals used in interconnects and contacts. Early transition metals having relatively low surface energies are chosen to form stable crystalline compounds rich in the high surface-energy metal. Agglomeration control layers containing such alloy compounds facilitate adhesion between the high surface-energy metal and an underlying layer of the integrated circuit device, such as a diffusion barrier layer. These agglomeration control layers may be nitrided to improve robustness at higher temperatures.
    Type: Grant
    Filed: June 28, 2001
    Date of Patent: May 31, 2005
    Assignee: Micron Technology, Inc.
    Inventor: Yonjun Jeff Hu
  • Publication number: 20040171203
    Abstract: Structures and methods of fabricating portions of integrated circuit devices to reduce agglomeration tendencies of high surface-energy metals used in interconnects and contacts. Early transition metals having relatively low surface energies are chosen to form stable crystalline compounds rich in the high surface-energy metal. Agglomeration control layers containing such alloy compounds facilitate adhesion between the high surface-energy metal and an underlying layer of the integrated circuit device, such as a diffusion barrier layer. These agglomeration control layers may be nitrided to improve robustness at higher temperatures.
    Type: Application
    Filed: February 27, 2004
    Publication date: September 2, 2004
    Applicant: Micron Technology, Inc.
    Inventor: Yonjun Jeff Hu
  • Publication number: 20030001266
    Abstract: Structures and methods of fabricating portions of integrated circuit devices to reduce agglomeration tendencies of high surface-energy metals used in interconnects and contacts. Early transition metals having relatively low surface energies are chosen to form stable crystalline compounds rich in the high surface-energy metal. Agglomeration control layers containing such alloy compounds facilitate adhesion between the high surface-energy metal and an underlying layer of the integrated circuit device, such as a diffusion barrier layer. These agglomeration control layers may be nitrided to improve robustness at higher temperatures.
    Type: Application
    Filed: June 28, 2001
    Publication date: January 2, 2003
    Applicant: Micron Technology, Inc.
    Inventor: Yonjun Jeff Hu