Abstract: Disclosed herein are heat treatment apparatuses and methods for liquid crystal display (LCD) cells, which are capable of rapidly transferring heat to liquid crystals injected into an LCD cell, not only to reduce the time taken for the liquid crystals to be changed into a liquid phase, but also to physically promote diffusion of the liquid crystals, thereby achieving a more uniform distribution of the liquid crystals. The apparatus includes a liquid bath, in which a liquid is contained as a medium to transfer heat to the liquid crystals in the LCD cells, a loading device to load or unload the LCD cells into/from the liquid bath, a heater installed in the liquid bath, the heater heating the liquid contained in the liquid bath and transfer heat to the liquid crystals, and a sound wave transmitter installed in the liquid bath and transmitting sound waves to the liquid crystals.

Abstract: Atomic force microscopes and methods of measuring specimens using the same. An atomic force microscope may precisely measure a 3D shape of a specimen using both a short-stroke scanner and a long-stroke scanner. The atomic force microscope may include a stage to transfer a specimen, at least one cantilever which includes a probe such that a driving displacement and a driving frequency are changed by attractive force and repulsive force in relation to atoms of the specimen, at least one short-stroke scanner which includes the cantilever so as to perform short-stroke scanning of the specimen, at least one long-stroke scanner which includes the short-stroke scanner so as to perform long-stroke scanning of the specimen, and at least one coarse approach system for transferring the short-stroke scanner and the long-stroke scanner to the specimen.

Abstract: Disclosed herein are heat treatment apparatuses and methods for liquid crystal display (LCD) cells, which are capable of rapidly transferring heat to liquid crystals injected into an LCD cell, not only to reduce the time taken for the liquid crystals to be changed into a liquid phase, but also to physically promote diffusion of the liquid crystals, thereby achieving a more uniform distribution of the liquid crystals. The apparatus includes a liquid bath, in which a liquid is contained as a medium to transfer heat to the liquid crystals in the LCD cells, a loading device to load or unload the LCD cells into/from the liquid bath, a heater installed in the liquid bath, the heater heating the liquid contained in the liquid bath and transfer heat to the liquid crystals, and a sound wave transmitter installed in the liquid bath and transmitting sound waves to the liquid crystals.

Abstract: In one embodiment, a substrate frame suction apparatus includes a body having at least one top-side opened chamber, a suction plate to cover a top of the at least one chamber, and a pressure adjustment device connected to the at least one chamber and configured to adjust a pressure in the at least one chamber.

Abstract: According to example embodiments, an atomic force microscope includes a probe tip, a cantilever including the probe tip, a displacement measurement device, and a movement device. A vibrating displacement of the cantilever changes according to a force between atoms of the probe tip and atoms of a surface of a sample. The displacement measurement device is configured to irradiate a beam emitted from a light source on the cantilever and to measure a displacement of the cantilever based on the beam reflected from the cantilever. The movement device is configured to move the cantilever and the displacement measurement device simultaneously when the sample is scanned.

Abstract: Sample inspection apparatuses and sample inspection methods which may include scanning a sample at high speed while inducing electrostatic force due to an electric field generated between a probe tip and the sample and generating and displaying a surface topography of the sample from a vibration displacement variation of a cantilever due to the electrostatic force.

Abstract: Atomic force microscopes and methods of measuring specimens using the same. An atomic force microscope may precisely measure a 3D shape of a specimen using both a short-stroke scanner and a long-stroke scanner. The atomic force microscope may include a stage to transfer a specimen, at least one cantilever which includes a probe such that a driving displacement and a driving frequency are changed by attractive force and repulsive force in relation to atoms of the specimen, at least one short-stroke scanner which includes the cantilever so as to perform short-stroke scanning of the specimen, at least one long-stroke scanner which includes the short-stroke scanner so as to perform long-stroke scanning of the specimen, and at least one coarse approach system for transferring the short-stroke scanner and the long-stroke scanner to the specimen.