Patents by Inventor Yonpyo Hon

Yonpyo Hon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9729039
    Abstract: A linear drive unit and a machine tool having the linear drive unit, capable of being applied to various applications, while taking into consideration the balance between the thrust force and the cogging of a linear motor. The linear drive unit has a magnetic gap changing mechanism which is configured to change a magnitude of a magnetic gap between a coil and a magnet, by displacing at least one of the coil and the magnet so that the coil and the magnet approach or are separated from each other.
    Type: Grant
    Filed: December 12, 2014
    Date of Patent: August 8, 2017
    Assignee: Fanuc Corporation
    Inventors: Yonpyo Hon, Kenzo Ebihara
  • Patent number: 9409270
    Abstract: A machine tool having an onboard measuring device automatically carries out various works which include ultra precision machining, washing and onboard measuring, by a numerical controller, without any interposition of a worker. For achieving this, an operation region of drive axes of the machine tool is previously divided into a machining region, a washing region and a measuring region. Positions of the drive axes are always monitored by the numerical controller, and when the drive axes enter each of the regions, a work allocated to each of the regions is automatically started and the work is continuously carried out until drives axes exit the region.
    Type: Grant
    Filed: October 24, 2012
    Date of Patent: August 9, 2016
    Assignee: FANUC CORPORATION
    Inventor: Yonpyo Hon
  • Patent number: 9278419
    Abstract: A shape measurement data is acquired by measuring along a spiral measurement path a lens shape which is machined along a spiral machining path. An interpolated shape measurement data at intersecting points of a radial line passing through a center of the lens shape and the spiral measurement path is acquired by interpolating the shape measurement data, and a compensated machining amount for removing a machining error at each of the intersecting points (the machining points) is calculated from the interpolated shape measurement data by interpolation. Further, a machining point compensated machining amount at each of the machining points on the spiral machining path is calculated from the calculated compensated machining amount, and a compensated machining path is created on the basis of the machining point compensated machining amount.
    Type: Grant
    Filed: January 18, 2013
    Date of Patent: March 8, 2016
    Assignee: FANUC CORPORATION
    Inventor: Yonpyo Hon
  • Publication number: 20150171722
    Abstract: A linear drive unit and a machine tool having the linear drive unit, capable of being applied to various applications, while taking into consideration the balance between the thrust force and the cogging of a linear motor. The linear drive unit has a magnetic gap changing mechanism which is configured to change a magnitude of a magnetic gap between a coil and a magnet, by displacing at least one of the coil and the magnet so that the coil and the magnet approach or are separated from each other.
    Type: Application
    Filed: December 12, 2014
    Publication date: June 18, 2015
    Applicant: FANUC CORPORATION
    Inventors: Yonpyo Hon, Kenzo Ebihara
  • Patent number: 8554502
    Abstract: A measurement program is created for measurement performed by moving X- and Z-axes so that a central axis of a probe is perpendicular to the surface of a reference sphere, and errors are obtained between original probe position data and probe position data obtained by measurement performed at two different angles ?1 and ?2 of a rotary axis according to the created measurement program. Position coordinates of a tip end of the probe at the two different angles ?1 and ?2 of the rotary axis are corrected so that the errors are zero. Then, the X- and Z-axis coordinates are corrected based on a positive or negative phased shift amount, and measurement errors are obtained by calculation. A real probe tip position is defined by the X- and Z-axis coordinates corrected by a correction amount with which the obtained measurement errors become minimum.
    Type: Grant
    Filed: February 12, 2011
    Date of Patent: October 8, 2013
    Assignee: Fanuc Corporation
    Inventors: Yonpyo Hon, Kenzo Ebihara, Masayuki Hamura
  • Publication number: 20130236262
    Abstract: A shape measurement data is acquired by measuring along a spiral measurement path a lens shape which is machined along a spiral machining path. An interpolated shape measurement data at intersecting points of a radial line passing through a center of the lens shape and the spiral measurement path is acquired by interpolating the shape measurement data, and a compensated machining amount for removing a machining error at each of the intersecting points (the machining points) is calculated from the interpolated shape measurement data by interpolation. Further, a machining point compensated machining amount at each of the machining points on the spiral machining path is calculated from the calculated compensated machining amount, and a compensated machining path is created on the basis of the machining point compensated machining amount.
    Type: Application
    Filed: January 18, 2013
    Publication date: September 12, 2013
    Applicant: FANUC CORPORATION
    Inventor: Yonpyo HON
  • Patent number: 8225519
    Abstract: A contact type measurement device performs measurement with displacement of a probe, while a contact member attached to the probe is in contact with an object to be measured. Data on the relationship of a contact force of the probe to the object to be measured with an angle between the central axis of the probe and the direction of gravity, the amount of displacement of the probe, and a fluid pressure for applying a pushing-out or pulling-in force to the probe is stored in advance and, on the basis of this data, the fluid pressure or the amount of displacement of the probe is controlled to automatically and precisely adjust a fine contact force of the probe to the object to be measured.
    Type: Grant
    Filed: February 24, 2011
    Date of Patent: July 24, 2012
    Assignee: Fanuc Corporation
    Inventors: Yonpyo Hon, Kenzo Ebihara, Masayuki Hamura
  • Patent number: 8160737
    Abstract: A machine tool is fitted with a position detector for detecting a position of a moving axis of the machine tool and an on-machine measuring device for measurement on the machine tool. An axial position detection signal output from the position detector and a measurement signal output from the on-machine measuring device are received through interfaces by a numerical controller that controls the machine tool. These interfaces are designed so that the numerical controller receives the axial position detection signal and the measurement signal with the same timing.
    Type: Grant
    Filed: March 26, 2009
    Date of Patent: April 17, 2012
    Assignee: Fanuc Ltd
    Inventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
  • Patent number: 8140178
    Abstract: In a simultaneous multi-axis measuring machine tool system including linear drive axes and rotation axes to measure a surface shape of an object to be measured by using an on-board measuring device having a probe mounted, at one end thereof, with a spherical contactor, a numerical controller controls driving of the linear drive axes and the rotation axes so that a central axis of the probe is always oriented in a direction perpendicular to the surface of the object to be measured and that the spherical contactor of the probe comes in contact with and follows a surface of the object to be measured.
    Type: Grant
    Filed: June 4, 2009
    Date of Patent: March 20, 2012
    Assignee: Fanuc Ltd
    Inventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
  • Publication number: 20110246115
    Abstract: A measurement program is created for measurement performed by moving X- and Z-axes so that a central axis of a probe is perpendicular to the surface of a reference sphere, and errors are obtained between original probe position data and probe position data obtained by measurement performed at two different angles ?1 and ?2 of a rotary axis according to the created measurement program. Position coordinates of a tip end of the probe at the two different angles ?1 and ?2 of the rotary axis are corrected so that the errors are zero. Then, the X- and Z-axis coordinates are corrected based on a positive or negative phased shift amount, and measurement errors are obtained by calculation. A real probe tip position is defined by the X- and Z-axis coordinates corrected by a correction amount with which the obtained measurement errors become minimum.
    Type: Application
    Filed: February 12, 2011
    Publication date: October 6, 2011
    Applicant: FANUC CORPORATION
    Inventors: Yonpyo HON, Kenzo EBIHARA, Masayuki HAMURA
  • Publication number: 20110232118
    Abstract: A contact type measurement device performs measurement with displacement of a probe, while a contact member attached to the probe is in contact with an object to be measured. Data on the relationship of a contact force of the probe to the object to be measured with an angle between the central axis of the probe and the direction of gravity, the amount of displacement of the probe, and a fluid pressure for applying a pushing-out or pulling-in force to the probe is stored in advance and, on the basis of this data, the fluid pressure or the amount of displacement of the probe is controlled to automatically and precisely adjust a fine contact force of the probe to the object to be measured.
    Type: Application
    Filed: February 24, 2011
    Publication date: September 29, 2011
    Applicant: FANUC CORPORATION
    Inventors: Yonpyo HON, Kenzo EBIHARA, Masayuki HAMURA
  • Patent number: 7905691
    Abstract: An ultra-precision machine tool capable of accurately detecting a machining start position, in which movable axes are supported by fluid bearings. A workpiece is mounted on a rotary table of a B axis, and the rotary table is mounted on an X axis that is a linear motion axis. A tool is mounted on a Y axis. The Y axis is mounted on a Z axis. The X axis is moved reciprocally each time the Z axis is moved a predetermined amount, a machining surface of the workpiece is scanned, and it is determined whether or not position deviation of the X, Y and B axes reaches or exceeds a reference value. The Y axis is driven and the tool is moved toward the workpiece a predetermined amount, and the above-described scan is performed.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: March 15, 2011
    Assignee: Fanu Ltd
    Inventors: Yonpyo Hon, Kenzo Ebihara, Tomohiko Kawai
  • Patent number: 7850406
    Abstract: A method for setting a working origin for a rotary tool in contact with a work piece to be machined, having: applying to a main spindle which holds the rotary tool, with a tip of a cutting edge of the rotary tool in contact with an outer surface of the work piece fixed to a work table, a load torque to such an extent that the rotary tool is not caused to be rotated; applying the load torque to the main spindle, and moving either the work table or the main spindle in a jog feed in a direction of any one of feed shafts such that the tip of the cutting edge is moved away from the outer surface along an axial direction of the rotary tool or in the direction orthogonal to the axial direction; and setting a coordinate at the moment when the main spindle starts rotation as a working origin of the jog feed in the direction of the any one of the feed shafts.
    Type: Grant
    Filed: September 7, 2007
    Date of Patent: December 14, 2010
    Assignee: Fanuc Ltd
    Inventors: Tomohiko Kawai, Kenzo Ebihara, Yonpyo Hon
  • Patent number: 7852031
    Abstract: A machine tool capable of automatically correcting an orientation of a workpiece or machining attachment based on detection results from position detectors that the machine tool inherently has. The machine tool comprises: position detectors; position deviation determining means; contact detection means that detects a contact between a probe and a surface of the workpiece or the machining attachment based on a position deviation; movable axis stopping means; coordinate value detection means; inclination determining means; and correction means. The inclination determining means moves linear axes to perform detection of contacts between the probe and the surface of the workpiece or the machining attachment at least two different points, and determines an inclination of the workpiece or the machining attachment using the obtained coordinate values. The correction means corrects a mounting error of the workpiece or the machining attachment, or corrects the machining program based on the determined inclination.
    Type: Grant
    Filed: July 18, 2008
    Date of Patent: December 14, 2010
    Assignee: Fanuc Ltd
    Inventors: Yonpyo Hon, Kenzo Ebihara, Tomohiko Kawai
  • Patent number: 7797850
    Abstract: There is provided a contact type measuring instrument in which the contact force of a probe is adjusted by a force created by compressed air and an attraction force between a permanent magnet and a magnetic body. This measuring instrument gives a pulling-in force or a pushing-out force to the probe by controlling a fluid pressure in a probe body. Also, between the permanent magnet attached to the tip end of a movable part of a micrometer attached to the probe body and a plate-shaped member attached to the end part on the side opposite to a contact of the probe, an attraction force according to a distance between the permanent magnet and the plate-shaped member is created.
    Type: Grant
    Filed: December 16, 2008
    Date of Patent: September 21, 2010
    Assignee: Fanuc Ltd
    Inventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
  • Patent number: 7788819
    Abstract: In a machine tool having an on-board measuring machine and controlled by a numerical controller, a method of measuring a shape of a workpiece presets a reference point for temperature drift correction on the workpiece, moves a probe to the reference point, resets a coordinate system of the probe to correct a temperature drift of the probe, and carries out shape measurement of the workpiece along a first measuring path. Next, the method moves the probe to the reference point again, resets the coordinate system of the probe to correct a temperature drift of the probe again, and carries out shape measurement of the workpiece along a second measuring path. Thereafter, similar temperature drift correction is carried out for each measuring path until the shape measurement of the workpiece is carried out along the last measuring path.
    Type: Grant
    Filed: July 20, 2009
    Date of Patent: September 7, 2010
    Assignee: Fanuc Ltd
    Inventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
  • Publication number: 20100101105
    Abstract: In a machine tool having an on-board measuring machine and controlled by a numerical controller, a method of measuring a shape of a workpiece presets a reference point for temperature drift correction on the workpiece, moves a probe to the reference point, resets a coordinate system of the probe to correct a temperature drift of the probe, and carries out shape measurement of the workpiece along a first measuring path. Next, the method moves the probe to the reference point again, resets the coordinate system of the probe to correct a temperature drift of the probe again, and carries out shape measurement of the workpiece along a second measuring path. Thereafter, similar temperature drift correction is carried out for each measuring path until the shape measurement of the workpiece is carried out along the last measuring path.
    Type: Application
    Filed: July 20, 2009
    Publication date: April 29, 2010
    Applicant: FANUC LTD
    Inventors: Yonpyo HON, Kenzo EBIHARA, Akira YAMAMOTO, Masayuki HAMURA
  • Publication number: 20100030368
    Abstract: In a simultaneous multi-axis measuring machine tool system including linear drive axes and rotation axes to measure a surface shape of an object to be measured by using an on-board measuring device having a probe mounted, at one end thereof, with a spherical contactor, a numerical controller controls driving of the linear drive axes and the rotation axes so that a central axis of the probe is always oriented in a direction perpendicular to the surface of the object to be measured and that the spherical contactor of the probe comes in contact with and follows a surface of the object to be measured.
    Type: Application
    Filed: June 4, 2009
    Publication date: February 4, 2010
    Applicant: FANUC LTD
    Inventors: Yonpyo HON, Kenzo EBIHARA, Akira YAMAMOTO, Masayuki HAMURA
  • Publication number: 20090292503
    Abstract: A machine tool is fitted with a position detector for detecting a position of a moving axis of the machine tool and an on-machine measuring device for measurement on the machine tool. An axial position detection signal output from the position detector and a measurement signal output from the on-machine measuring device are received through interfaces by a numerical controller that controls the machine tool. These interfaces are designed so that the numerical controller receives the axial position detection signal and the measurement signal with the same timing.
    Type: Application
    Filed: March 26, 2009
    Publication date: November 26, 2009
    Applicant: FANUC LTD
    Inventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
  • Publication number: 20090235397
    Abstract: There is provided a contact type measuring instrument in which the contact force of a probe is adjusted by a force created by compressed air and an attraction force between a permanent magnet and a magnetic body. This measuring instrument gives a pulling-in force or a pushing-out force to the probe by controlling a fluid pressure in a probe body. Also, between the permanent magnet attached to the tip end of a movable part of a micrometer attached to the probe body and a plate-shaped member attached to the end part on the side opposite to a contact of the probe, an attraction force according to a distance between the permanent magnet and the plate-shaped member is created.
    Type: Application
    Filed: December 16, 2008
    Publication date: September 17, 2009
    Applicant: FANUC LTD
    Inventors: Yonpyo HON, Kenzo EBIHARA, Akira YAMAMOTO, Masayuki HAMURA