Patents by Inventor Yoong Li

Yoong Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11947462
    Abstract: Techniques are disclosed relating to cache footprint management. In some embodiments, execution circuitry is configured to perform operations for instructions from multiple threads in parallel. Cache circuitry may store information operated on by threads executed by the execution circuitry. Scheduling circuitry may arbitrate among threads to schedule threads for execution by the execution circuitry. Tracking circuitry may determine one or more performance metrics for the cache circuitry. Control circuitry may, based on the one or more performance metrics meeting a threshold, reduce a limit on a number of threads considered for arbitration by the scheduling circuitry, to control a footprint of information stored by the cache circuitry. Disclosed techniques may advantageously reduce or avoid cache thrashing for certain processor workloads.
    Type: Grant
    Filed: March 3, 2022
    Date of Patent: April 2, 2024
    Assignee: Apple Inc.
    Inventors: Yoong Chert Foo, Terence M. Potter, Donald R. DeSota, Benjiman L. Goodman, Aroun Demeure, Cheng Li, Winnie W. Yeung
  • Publication number: 20170238131
    Abstract: A positioning method and a corresponding terminal and system. A terminal acquires positioning information of the terminal, and sends the acquired positioning information to a first transmission node, the positioning information comprising at least one type of the following information: signal strength information, a subframe or subframe set index, channel characteristic information, access point information and environment characteristic information. The first transmission node transmits the positioning information to a positioning service system, and the positioning service system acquires the positioning information reported by the terminal and determines a geographic position of the terminal according to the positioning information. The present invention can satisfy related enhanced positioning demands.
    Type: Application
    Filed: April 1, 2015
    Publication date: August 17, 2017
    Applicant: ZTE Corporation
    Inventors: Bo Dai, Zhaohua Lu, Liujun Hu, Yoong Li, Shijun Chen
  • Patent number: 7154257
    Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: December 26, 2006
    Assignee: Intel Corporation
    Inventors: Chanh Le, Say Cheong Gan, Thomas A. Repko, Frank W. Joyce, Teik Sean Toh, Douglas P. Kreager, Yoong Li Liew
  • Patent number: 7110905
    Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.
    Type: Grant
    Filed: April 9, 2004
    Date of Patent: September 19, 2006
    Assignee: Intel Corporation
    Inventors: Chanh Le, Say Cheong Gan, Thomas A. Repko, Frank W. Joyce, Teik Sean Toh, Douglas P. Kreager, Yoong Li Liew
  • Publication number: 20040189281
    Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.
    Type: Application
    Filed: April 9, 2004
    Publication date: September 30, 2004
    Inventors: Chanh Le, Say Cheong Gan, Thomas A. Repko, Frank W. Joyce, Teik Sean Toh, Douglas P. Kreager, Yoong Li Liew
  • Publication number: 20040064288
    Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.
    Type: Application
    Filed: September 30, 2002
    Publication date: April 1, 2004
    Inventors: Chanh Le, Say Cheong Gan, Thomas A. Repko, Frank W. Joyce, Teik Sean Toh, Douglas P. Kreager, Yoong Li Liew