Patents by Inventor Yoong Li Liew

Yoong Li Liew has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Universal automated circuit board tester
    Patent number: 7154257
    Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: December 26, 2006
    Assignee: Intel Corporation
    Inventors: Chanh Le, Say Cheong Gan, Thomas A. Repko, Frank W. Joyce, Teik Sean Toh, Douglas P. Kreager, Yoong Li Liew
  • Universal automated circuit board tester
    Patent number: 7110905
    Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.
    Type: Grant
    Filed: April 9, 2004
    Date of Patent: September 19, 2006
    Assignee: Intel Corporation
    Inventors: Chanh Le, Say Cheong Gan, Thomas A. Repko, Frank W. Joyce, Teik Sean Toh, Douglas P. Kreager, Yoong Li Liew
  • Universal automated circuit board tester
    Publication number: 20040189281
    Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.
    Type: Application
    Filed: April 9, 2004
    Publication date: September 30, 2004
    Inventors: Chanh Le, Say Cheong Gan, Thomas A. Repko, Frank W. Joyce, Teik Sean Toh, Douglas P. Kreager, Yoong Li Liew
  • Universal automated circuit board tester
    Publication number: 20040064288
    Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.
    Type: Application
    Filed: September 30, 2002
    Publication date: April 1, 2004
    Inventors: Chanh Le, Say Cheong Gan, Thomas A. Repko, Frank W. Joyce, Teik Sean Toh, Douglas P. Kreager, Yoong Li Liew