Patents by Inventor Yorck Huenke
Yorck Huenke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10261883Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.Type: GrantFiled: August 21, 2017Date of Patent: April 16, 2019Assignee: Semmle LimitedInventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen
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Publication number: 20180032422Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.Type: ApplicationFiled: August 21, 2017Publication date: February 1, 2018Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen
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Patent number: 9740591Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.Type: GrantFiled: November 8, 2016Date of Patent: August 22, 2017Assignee: Semmle LimitedInventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen
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Patent number: 9639352Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for generating widened types for computing measures of rework normalized churn. One of the methods includes determining a plurality of commit chains for a software developer. Respective measures of rework churn occurring in each commit chain are calculated. An overall rework factor is computed for the developer using the respective measures of rework churn for each commit chain in the plurality of commit chains for the developer. A measure of rework normalized churn is computed for the developer including adjusting the initial measure of churn by the overall rework factor. Productivity of the developer is quantified relative to one or more other developers using the measure of rework normalized churn for the developer.Type: GrantFiled: October 12, 2016Date of Patent: May 2, 2017Assignee: Semmle LimitedInventors: Sebastiaan Johannes van Schaik, Stephen Philip Buckley, Yorck Huenke
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Patent number: 9619224Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.Type: GrantFiled: July 8, 2015Date of Patent: April 11, 2017Assignee: Semmle LimitedInventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars
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Publication number: 20170052872Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.Type: ApplicationFiled: November 8, 2016Publication date: February 23, 2017Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen
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Publication number: 20150347126Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.Type: ApplicationFiled: July 8, 2015Publication date: December 3, 2015Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars
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Patent number: 9098377Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.Type: GrantFiled: May 30, 2014Date of Patent: August 4, 2015Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen