Patents by Inventor Yorck Huenke

Yorck Huenke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10261883
    Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.
    Type: Grant
    Filed: August 21, 2017
    Date of Patent: April 16, 2019
    Assignee: Semmle Limited
    Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen
  • Publication number: 20180032422
    Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.
    Type: Application
    Filed: August 21, 2017
    Publication date: February 1, 2018
    Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen
  • Patent number: 9740591
    Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.
    Type: Grant
    Filed: November 8, 2016
    Date of Patent: August 22, 2017
    Assignee: Semmle Limited
    Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen
  • Patent number: 9639352
    Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for generating widened types for computing measures of rework normalized churn. One of the methods includes determining a plurality of commit chains for a software developer. Respective measures of rework churn occurring in each commit chain are calculated. An overall rework factor is computed for the developer using the respective measures of rework churn for each commit chain in the plurality of commit chains for the developer. A measure of rework normalized churn is computed for the developer including adjusting the initial measure of churn by the overall rework factor. Productivity of the developer is quantified relative to one or more other developers using the measure of rework normalized churn for the developer.
    Type: Grant
    Filed: October 12, 2016
    Date of Patent: May 2, 2017
    Assignee: Semmle Limited
    Inventors: Sebastiaan Johannes van Schaik, Stephen Philip Buckley, Yorck Huenke
  • Patent number: 9619224
    Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.
    Type: Grant
    Filed: July 8, 2015
    Date of Patent: April 11, 2017
    Assignee: Semmle Limited
    Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars
  • Publication number: 20170052872
    Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.
    Type: Application
    Filed: November 8, 2016
    Publication date: February 23, 2017
    Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen
  • Publication number: 20150347126
    Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.
    Type: Application
    Filed: July 8, 2015
    Publication date: December 3, 2015
    Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars
  • Patent number: 9098377
    Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.
    Type: Grant
    Filed: May 30, 2014
    Date of Patent: August 4, 2015
    Inventors: Julian Tibble, Pavel Avgustinov, Yorck Huenke, Arthur Baars, Anders Starcke Henriksen