Abstract: To provide a three-dimensional monitoring apparatus capable of detecting with high accuracy an incoming of an object into a predetermined three-dimensional space by using pattern light as a detecting carrier. A three-dimensional monitoring apparatus comprising (1) an irradiating device for irradiating predetermined pattern light to three-dimensional space S to be monitored, (2) an imaging device for imaging a projection pattern projected by irradiating of the pattern light on an incoming object M and on a screen 5 in the space S to capture image data and (3) a measuring device to measure a position of the object M based on the comparison between a monitoring image captured by the imaging device when there is the object M in the space S and a reference image captured by the imaging device when there is no object M in the space S.

Abstract: To provide a three-dimensional monitoring apparatus capable of detecting with high accuracy an incoming of an object into a predetermined three-dimensional space by using pattern light as a detecting carrier. A three-dimensional monitoring apparatus comprising (1) an irradiating device for irradiating predetermined pattern light to three-dimensional space S to be monitored, (2) an imaging device for imaging a projection pattern projected by irradiating of the pattern light on an incoming object M and on a screen 5 in the space S to capture image data and (3) a measuring device to measure a position of the object M based on the comparison between a monitoring image captured by the imaging device when there is the object M in the space S and a reference image captured by the imaging device when there is no object M in the space S.