Abstract: A lipid bimolecular membrane substrate 1A includes: a substrate 12 in which a microwell 20 opened on one surface is formed; a lipid bimolecular membrane 30 disposed on the substrate 12 so as to cover an opening of the microwell 20; and a sealing liquid 22 disposed between the substrate 12 and the lipid bimolecular membrane 30. The sealing liquid 22 contains an ionic liquid.

Abstract: Provided is a microelectrode having a layered structure, including a layer containing a polymer compound having an aromatic ring (polymer compound layer) and a layer containing a conductive material (conductive layer), wherein a thickness of the polymer compound layer is 10 to 900 nm, a thickness of the conductive layer is 0.3 to 10 nm, and the microelectrode has a three-dimensional curved shape.

Abstract: Provided is a microelectrode having a layered structure, including a layer containing a polymer compound having an aromatic ring (polymer compound layer) and a layer containing a conductive material (conductive layer), wherein a thickness of the polymer compound layer is 10 to 900 nm, a thickness of the conductive layer is 0.3 to 10 nm, and the microelectrode has a three-dimensional curved shape.

Abstract: An image signal processing method in which inspection of a specimen is performed based on the image data collected for the wafer or other specimen by scanning a pilot specimen in a scanning electron microscope, prior to the scanning of the specimen to be inspected. The number of scans of the specimen to be inspected can be reduced, the dose of the primary electrons irradiated can be reduced, and high-quality image data can be obtained in a short time. For a pilot specimen, the image data are collected by making multiple scans in a scanning electron microscope 1. From the obtained image data, the evaluated relative feature function ERFF of an electro-optical cylinder of a scanning electron microscope 1 is calculated (step S01). For the specimen as the inspection object, the image data are collected in a number of scans less than that for the aforementioned pilot specimen in a scanning electron microscope 1.