Abstract: A dynamic semiconductor device is provided with a plurality of master step sections having hatch sections for temporarily storing input data and dynamic gate sections; a plurality of slave step sections, which are alternately connected with master step sections and provided with dynamic gate sections or with latch sections and dynamic gate sections; and a timing signal generating section for generating a signal for controlling operation of the master step sections and the slave step sections. The timing signal generating section supplies the latch sections with signals for storing data of the previous step before the data is erased.

Abstract: A substrate bias is controlled such that a leakage current is minimum. A semiconductor integrated circuit device comprises a leakage detecting circuit which detects a leakage current by using leakage detecting MOSFETs, a control circuit which generates a control signal depending on an output from the leakage detecting circuit, a substrate bias generating circuit which changes a substrate bias depending on the control signal, and a controlled circuit including a MOSFET having the same characteristics as that of each of the leakage detecting MOSFETs. The leakage detecting circuit detects a substrate leakage current which includes as the substrate bias becomes deep and a subthreshold leakage current which decreases as the substrate bias becomes deep.