Patents by Inventor Yoshiharu Sugano

Yoshiharu Sugano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7187166
    Abstract: An electrical property evaluation apparatus for measuring an electrical property of an object includes a magnetic field generating mechanism that generates a magnetic field in a target area on the object, and a magnetic sensor for measuring the magnetic field near the target area. A cantilever having a conducting probe is supported so that the probe can be brought into contact with the target area. A bending measurement mechanism measures an amount of bending of the cantilever when the probe is brought into contact with the object. A control section controls a moving mechanism to maintain the bending amount of the cantilever constant. A voltage source applies a voltage to the probe, and an electrical property measuring section measures a current or an electrical resistance between the probe and the object in contact with each other.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: March 6, 2007
    Assignee: SII NanoTechnology Inc.
    Inventor: Yoshiharu Sugano
  • Publication number: 20040201378
    Abstract: An electrical property evaluation apparatus for measuring an electrical property of an object to be measured, including: a magnetic field generating mechanism for generating a magnetic field in a target area on the object; a magnetic sensor for measuring the magnetic field near the target area; a contact having a conducting probe, the contact supported so that the probe can be brought into contact with the target area; a voltage source for applying a voltage to the probe; and an electrical property measuring section for measuring a current or an electrical resistance between the probe and the object in contact with each other.
    Type: Application
    Filed: March 25, 2004
    Publication date: October 14, 2004
    Inventor: Yoshiharu Sugano
  • Patent number: 5826983
    Abstract: A thermomechanical analyzer capable of performing, in addition to thermomechanical measurement, thermogravimetry of a sample of several grams or more only by switching parts of the analyzer. A thermomechanical analyzer has a heating furnace, a temperature detector for detecting temperature of the sample that is placed within the heating furnace, an attachable/detachable detecting rod and a sample holding member, wherein the sample is held between the detecting rod and the sample holding member. A load applying instrument applies an external force to the sample via the detecting rod. A displacement detector detects displacement of the detecting rod relative to the sample holding member. The thermomechanical analyzer is provided with a control computing apparatus for adjusting an output from the load applying instrument to bring an output from the displacement detector closer to a fixed value.
    Type: Grant
    Filed: July 10, 1996
    Date of Patent: October 27, 1998
    Assignee: Seiko Instruments Inc.
    Inventors: Nobutaka Nakamura, Yoshiharu Sugano
  • Patent number: 5306087
    Abstract: Apparatus for conducting thermogravimetric analysis continuously when sample weights are measured automatically in the case of measurement of a plurality of samples. A plurality of empty sample containers are transferred individually in succession from a tray to a thermobalance, where each container is weighed and a representation of the weight of each empty container is stored in a first memory. Then, a sample is loaded into each container in the tray and the loaded sample containers are transferred individually in succession from the tray to the thermobalance where each loaded container is weighed and a representation of the weight of each container is stored in a second memory. The weight of each sample is then determined based on the difference between the representations stored in the first and second memories.
    Type: Grant
    Filed: August 25, 1992
    Date of Patent: April 26, 1994
    Assignee: Seiko Instruments Inc.
    Inventors: Nobutaka Nakamura, Haruo Takeda, Yoshiharu Sugano
  • Patent number: 5215377
    Abstract: The efficiency and measuring accuracy of thermogravimetry are improved by performing sample conveyance and thermogravimetry alternately, interruptedly and automatically by the provision of apparatus composed of a thermobalance having a holder for holding a sample container and a heating oven, a sample container tray initially carrying the sample container, and an auto-sampler for automatically conveying the sample container from the sample container tray to the holder and vice versa, the devices being combined to effect conveyance of the sample container from the sample container tray to the holder automatically and continuously and thus to improve the measuring accuracy.
    Type: Grant
    Filed: November 27, 1991
    Date of Patent: June 1, 1993
    Assignee: Seiko Instruments Inc.
    Inventor: Yoshiharu Sugano