Patents by Inventor Yoshihiro Kobayashi

Yoshihiro Kobayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12270825
    Abstract: An inertial measurement unit includes: a sensor unit including an inertial sensor, a case accommodating the inertial sensor, and a first fixing part having the case fixed thereto; an elastic member having a first elastic member mainly damping a vibration at a predetermined frequency in a first direction and a second elastic member mainly damping a vibration at a predetermined frequency in a second direction that is different from the first direction; a second fixing part where the sensor unit and the elastic member are arranged; and a fixing member fixing the sensor unit and the elastic member to the second fixing part.
    Type: Grant
    Filed: January 6, 2022
    Date of Patent: April 8, 2025
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Kazuyoshi Takeda, Yoshihiro Kobayashi
  • Publication number: 20250081329
    Abstract: A wiring board includes a first wiring structure and a second wiring structure. The first wiring structure includes: a mounting surface for a semiconductor element; and a back surface on an opposite side of the mounting surface. The second wiring structure is formed on the back surface of the first wiring structure. The first wiring structure further includes thin film layers, a cavity, an electronic component, and a filling resin layer. The thin film layers include laminated wiring layers and laminated insulating layers. The cavity is formed by cutting out at least one of the insulating layers of the thin film layers in a direction toward the mounting surface. The electronic component is located in the cavity. The filling resin layer fills the cavity, and further covers the electronic component.
    Type: Application
    Filed: August 29, 2024
    Publication date: March 6, 2025
    Inventor: Yoshihiro Kobayashi
  • Publication number: 20250081353
    Abstract: A wiring board includes a first wiring structure and a second wiring structure. The first wiring structure includes a mounting surface for a semiconductor element and a back surface on an opposite side of the mounting surface. The second wiring structure is formed on the back surface of the first wiring structure. The second wiring structure includes a reinforcing insulating layer, a cavity, an electronic component, and a filled resin layer. The reinforcing insulating layer is formed on the back surface of the first wiring structure. The cavity is formed by cutting off the reinforcing insulating layer in a direction toward the back surface of the first wiring structure. The electronic component is arranged in the cavity. The filled resin layer is filled in the cavity and covers the electronic component.
    Type: Application
    Filed: August 29, 2024
    Publication date: March 6, 2025
    Inventor: Yoshihiro Kobayashi
  • Patent number: 12233923
    Abstract: A measurement method includes: generating second measurement data by performing filter processing on first measurement data; calculating a first deflection amount based on an approximate equation of deflection of a structure; calculating a second deflection amount by performing filter processing on the first deflection amount; calculating a third deflection amount based on the second deflection amount and a first-order coefficient and a zero-order coefficient which are calculated based on the second measurement data and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; calculating a static response by adding the offset and a product of the first-order coefficient and the first deflection amount; calculating a first dynamic response by subtracting the static response from the first measurement data; calculating a second dynamic response by attenuating an unnecessary signal from the first dynamic response; and
    Type: Grant
    Filed: June 29, 2022
    Date of Patent: February 25, 2025
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Yoshihiro Kobayashi
  • Patent number: 12216028
    Abstract: A derivation method includes: an acquisition step of acquiring time-series data including a physical quantity generated at a predetermined observation point in a structure as a response caused by a movement of a formation moving object formed with one or more moving objects on the structure; an environment information acquisition step of acquiring, as environment information, information on a structure length that is a length of the structure, a moving object length that is a length of the moving object, and an installation position of a contact portion of the moving object with the structure; a fundamental frequency derivation step of deriving a fundamental frequency of the time-series data based on the time-series data; a passing period derivation step of deriving a passing period during which the formation moving object passes through the structure based on the time-series data; and a number derivation step of deriving the number of the moving objects included in the formation moving object based on the en
    Type: Grant
    Filed: June 29, 2022
    Date of Patent: February 4, 2025
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Yoshihiro Kobayashi
  • Publication number: 20240368361
    Abstract: A resin film has improved rigidity and flex resistance, and reduced optical distortion. A polyimide film has a polyimide containing an aromatic ring, and inorganic particles having a smaller refractive index in a major axis direction than an average refractive index in a direction perpendicular to the major axis direction, wherein, when the polyimide film is monotonically heated from 25° C. at 10° C./min, a size shrinkage ratio represented by the following formula in at least one direction is 0.1% or more at at least one temperature in a range of from 250° C. to 400° C.: size shrinkage ratio (%)=[{(size at 25° C.)?(size after heating)}/(size at 25° C.)]×100; wherein a birefringence index in a thickness direction is 0.020 or less at a wavelength of 590 nm; and wherein a total light transmittance measured in accordance with JIS K7361-1 is 80% or more at a thickness of 10 ?m.
    Type: Application
    Filed: July 2, 2024
    Publication date: November 7, 2024
    Applicant: DAI NIPPON PRINTING CO., LTD.
    Inventors: Katsuya SAKAYORI, Yoshihiro KOBAYASHI, Keisuke WAKITA, Ayako FURUSE, Koudai OKADA
  • Publication number: 20240302191
    Abstract: A sensor device includes a mounting member having fixation surfaces inside, and at least one electronic component directly or indirectly fixed to the fixation surfaces of the mounting member, and the mounting member constitutes a part of a casing for housing the electronic component. Further, the fixation surfaces are perpendicular to each other.
    Type: Application
    Filed: May 16, 2024
    Publication date: September 12, 2024
    Inventors: Masayasu SAKUMA, Yoshihiro KOBAYASHI, Shojiro KITAMURA, Taketo CHINO
  • Patent number: 12031847
    Abstract: A sensor device includes a mounting member having fixation surfaces inside, and at least one electronic component directly or indirectly fixed to the fixation surfaces of the mounting member, and the mounting member constitutes a part of a casing for housing the electronic component. Further, the fixation surfaces are perpendicular to each other.
    Type: Grant
    Filed: April 26, 2023
    Date of Patent: July 9, 2024
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Masayasu Sakuma, Yoshihiro Kobayashi, Shojiro Kitamura, Taketo Chino
  • Patent number: 11988579
    Abstract: A dynamic response at a designated position is derived based on a deflection amount normalized by a vibration component of the dynamic response, an amplitude ratio, which is a ratio of a first deflection amount that is the normalized deflection amount indicating a distribution of a vibration amplitude of the observation point to a second deflection amount that is the normalized deflection amount indicating a distribution of a vibration amplitude of a designated position, the vibration component of the designated position derived based on the vibration component and the amplitude ratio, and the static response of the designated position derived based on the time-series data and the estimated value.
    Type: Grant
    Filed: June 29, 2022
    Date of Patent: May 21, 2024
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Yoshihiro Kobayashi
  • Patent number: 11982595
    Abstract: A measurement method includes: performing low-pass filter processing and high-pass filter processing on target data; estimating correction data; generating vibration component data, and the estimating the correction data includes: specifying a first interval, a second interval, and a third interval; generating first interval correction data, generating second interval correction data in the second interval by setting data in an interval before a first intersection point of first line data and second line data as the first line data, setting data in an interval from the first intersection point to a second intersection point of second line data and third line data as the second line data, and setting data in an interval after the second intersection point as the third line data; and generating third interval correction data.
    Type: Grant
    Filed: February 25, 2022
    Date of Patent: May 14, 2024
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Yoshihiro Kobayashi
  • Patent number: 11921012
    Abstract: A measurement method includes: a high-pass filter processing step of performing high-pass filter processing on target data including a drift noise to generate drift noise reduction data in which the drift noise is reduced, a correction data estimation step of estimating, based on the drift noise reduction data, correction data corresponding to a difference between the drift noise reduction data and data obtained by removing the drift noise from the target data, and a measurement data generation step of generating measurement data by adding the drift noise reduction data and the correction data.
    Type: Grant
    Filed: February 25, 2022
    Date of Patent: March 5, 2024
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Yoshihiro Kobayashi
  • Patent number: 11892377
    Abstract: A time point is acquired by steps including a data acquisition step of acquiring time-series data indicating a time change of a displacement of a structure based on a physical quantity generated at a predetermined observation point in the structure as a response caused by a movement of a formation moving object formed with one or more moving objects on the structure; a removing step of removing a vibration component included in the time-series data; and a time point acquisition step of acquiring an entry time point at which the formation moving object enters the structure and an exit time point at which the formation moving object exits from the structure, based on the time-series data after the vibration component is removed.
    Type: Grant
    Filed: June 29, 2022
    Date of Patent: February 6, 2024
    Inventor: Yoshihiro Kobayashi
  • Patent number: 11881102
    Abstract: A measurement method includes: a step of acquiring first observation point information; a step of acquiring second observation point information; a step of calculating a path deflection waveform at a third observation point; a step of calculating a path deflection waveform at a central position between the first observation point and the second observation point; a step of calculating a measurement waveform as a physical quantity at the third observation point; a step of calculating an amplitude coefficient at which a difference is minimized between the measurement waveform and a waveform obtained by multiplying the path deflection waveform at the third observation point by the amplitude coefficient; and a step of calculating, based on the path deflection waveform at the central position and the amplitude coefficient, an estimation waveform as a physical quantity at the central position.
    Type: Grant
    Filed: March 17, 2021
    Date of Patent: January 23, 2024
    Inventor: Yoshihiro Kobayashi
  • Publication number: 20230341289
    Abstract: A measurement method includes generating first displacement data based on data of observation points of a structural object, generating observation information, calculating deflection amounts of the structural object by vehicles of a moving object, calculating approach times and exit times of the vehicles with respect to the structural object, calculating time intervals divided by a plurality of times obtained by sorting the approach times and the exit times by time, calculating an amplitude amount of the first displacement data in each of the time intervals, calculating an amplitude amount of the deflection amount in each of the time intervals, and calculating weighting coefficients assuming that a sum of products of the amplitude amounts of the deflection amounts in the time intervals and the weighting coefficients to the vehicles is equal to the amplitude amount of the first displacement data in the time intervals.
    Type: Application
    Filed: April 24, 2023
    Publication date: October 26, 2023
    Inventor: Yoshihiro KOBAYASHI
  • Publication number: 20230341255
    Abstract: A measurement method includes generating first displacement data based on data of observation points of a structural object, generating observation information, calculating a time interval in which each of vehicles of a moving object moves alone on the structural object, calculating a first deflection amount of the structural object, calculating a displacement response when each of the vehicles moves alone on the structural object based on the first displacement data and the time interval, calculating a deflection response when each of the vehicles moves alone on the structural object based on the first deflection amount and the time interval, calculating weighting coefficients to the respective vehicles based on the displacement response and the deflection response, and calculating a second deflection amount obtained by correcting the first deflection amount based on the weighting coefficients.
    Type: Application
    Filed: April 24, 2023
    Publication date: October 26, 2023
    Inventor: Yoshihiro KOBAYASHI
  • Patent number: 11761812
    Abstract: A measurement method includes: a step of acquiring first observation point information including a time point when each part of a moving object passes a first observation point and a physical quantity which is a response to an action; a step of acquiring second observation point information including a time point when the each part passes a second observation point and a physical quantity which is a response to an action; a step of calculating a deflection waveform of a structure generated by the each part; a step of adding the deflection waveforms to calculate a moving object deflection waveform, and calculating a path deflection waveform based on the moving object deflection waveform; a step of calculating a displacement waveform by twice integrating an acceleration of a third observation point; and a step of calculating, based on the path deflection waveform, a value of each coefficient of a polynomial approximating an integration error, and correcting the displacement waveform based on the value of each c
    Type: Grant
    Filed: March 17, 2021
    Date of Patent: September 19, 2023
    Inventor: Yoshihiro Kobayashi
  • Patent number: 11761811
    Abstract: A measurement method includes: a step of acquiring, based on observation information obtained by an observation device, first observation point information including a time point when each of a plurality of parts of a moving object passes a first observation point of a structure and a physical quantity which is a response to an action of each of the plurality of parts on the first observation point; a step of acquiring, based on the observation information, second observation point information including a time point when each of the plurality of parts passes a second observation point and a physical quantity which is a response to an action of each of the plurality of parts on the second observation point; a step of calculating, based on the first observation point information, the second observation point information, a predetermined coefficient, and an approximate expression of deflection of the structure, a deflection waveform of the structure generated by each of the plurality of parts; and a step of calc
    Type: Grant
    Filed: March 17, 2021
    Date of Patent: September 19, 2023
    Inventor: Yoshihiro Kobayashi
  • Publication number: 20230258481
    Abstract: A sensor device includes a mounting member having fixation surfaces inside, and at least one electronic component directly or indirectly fixed to the fixation surfaces of the mounting member, and the mounting member constitutes a part of a casing for housing the electronic component. Further, the fixation surfaces are perpendicular to each other.
    Type: Application
    Filed: April 26, 2023
    Publication date: August 17, 2023
    Inventors: Masayasu SAKUMA, Yoshihiro KOBAYASHI, Shojiro KITAMURA, Taketo CHINO
  • Patent number: 11713993
    Abstract: A measurement method include a step to obtain observation point information, including physical quantities in association of a plurality of times, via observation devices at observation points of a structure on which a moving object moves, a step to calculate a correction coefficient that corrects the physical quantities based on a plurality of time periods and a reference time periods, a step to calculate a plurality of deflection waveforms of the structure generated by a plurality of parts of the moving object, a step to calculate a second deflection waveform of the structure generated by the moving object by adding the plurality of deflection waveforms, and a step to calculate a displacement of the structure based on the second deflection waveform. The structure is a superstructure of a road bridge or a railway bridge.
    Type: Grant
    Filed: March 17, 2021
    Date of Patent: August 1, 2023
    Inventor: Yoshihiro Kobayashi
  • Patent number: 11714021
    Abstract: A measurement method includes: a step of acquiring first observation point information including a time point when each part of an m-th moving object passes a first observation point and a physical quantity which is a response to an action; a step of acquiring second observation point information including a time point when the each part passes a second observation point and a physical quantity which is a response to an action; a step of calculating a deflection waveform of a structure generated by the each part; a step of adding the deflection waveforms to calculate an m-th moving object deflection waveform; a step of calculating a displacement waveform at the third observation point; and a step of calculating first to M-th amplitude coefficients by assuming that a waveform obtained by multiplying an m-th amplitude coefficient by the m-th moving object deflection waveform is an m-th amplitude adjusted deflection waveform, and that a sum of first to M-th amplitude adjusted deflection waveforms is approximated
    Type: Grant
    Filed: March 17, 2021
    Date of Patent: August 1, 2023
    Inventor: Yoshihiro Kobayashi