Patents by Inventor Yoshihiro Osawa
Yoshihiro Osawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11921386Abstract: According to one embodiment, a display device includes a display panel, a first wiring board mounted on the display panel, and a backlight unit located on a back surface side of the display panel to illuminate the display panel. The backlight unit includes a casing which includes a bottom plate including a first slit and a side plate standing at the bottom plate, and a light guide arranged in the casing. The first wiring board passes between the side plate and the light guide and through the first slit and is bent toward a back surface side of the casing.Type: GrantFiled: March 5, 2021Date of Patent: March 5, 2024Assignee: Japan Display Inc.Inventors: Yoshihiro Watanabe, Yoshikatsu Imazeki, Yoichi Kamijo, Koichi Miyasaka, Shuichi Osawa
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Publication number: 20230192061Abstract: A brake device applies a braking force to a vehicle by pressing a friction material against a rotor rotating integrally with a wheel. A temperature estimation method applied to the brake device includes: calculating an amount of absorbed energy absorbed by the rotor based on an amount of kinetic energy that the vehicle loses and an amount of potential energy that the vehicle loses during braking of the vehicle; and estimating a temperature of the rotor based on the amount of absorbed energy.Type: ApplicationFiled: October 17, 2022Publication date: June 22, 2023Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Yoshiyuki FURUTA, Toru MATSUSHIMA, Yoshihiro OSAWA
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Patent number: 10422695Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: GrantFiled: February 8, 2019Date of Patent: September 24, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
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Patent number: 10422694Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: GrantFiled: February 8, 2019Date of Patent: September 24, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
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Publication number: 20190170577Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: ApplicationFiled: February 8, 2019Publication date: June 6, 2019Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
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Publication number: 20190170578Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: ApplicationFiled: February 8, 2019Publication date: June 6, 2019Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
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Patent number: 10222261Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: GrantFiled: July 1, 2016Date of Patent: March 5, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
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Publication number: 20170010214Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: ApplicationFiled: July 1, 2016Publication date: January 12, 2017Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
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Publication number: 20130146402Abstract: A first member including a plurality of contacting portions and an absorbing portion capable of absorbing displacement of the contacting portions, a second member provided capable of relatively displacing with respect to the first member by contacting with the plurality of contacting portions, and a pressing mechanism configured to press the first member against the second member are provided. Therefore, for example, since the absorbing portion is capable of absorbing the displacement of the contacting portion, it is possible to make friction performance appropriate by stabilizing an area of a friction place.Type: ApplicationFiled: June 4, 2010Publication date: June 13, 2013Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Ryutaro Misumi, Hiroshi Isono, Yoshihiro Osawa, Kazutoshi Nishii, Yosuke Akita
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Patent number: 8422018Abstract: An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.Type: GrantFiled: February 16, 2011Date of Patent: April 16, 2013Assignee: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro Osawa, Kazuaki Ohkubo
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Patent number: 8415639Abstract: A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.Type: GrantFiled: February 24, 2011Date of Patent: April 9, 2013Assignee: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro Osawa, Kazuaki Ohkubo
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Patent number: 8205724Abstract: A disk brake apparatus that can suppress vibration and a brake noise phenomenon in a low deceleration range and increase braking force in a high deceleration range. In the low deceleration range a push surface at a tip of a small-diameter push portion of an inner piston pushes a back plate of a brake pad at a center of the push surface corresponding to a radial inside where deflection and inclination of a disk rotor is insignificant, thereby suppressing the vibration and brake noise phenomenon in the low deceleration range. In the high deceleration range the back plate of the brake pad is pushed at a radially outside push location of the disk rotor in an aperture-side end face of an outer piston, thereby making the braking force in the high deceleration range larger than the braking force in the low deceleration range.Type: GrantFiled: January 25, 2008Date of Patent: June 26, 2012Assignee: Toyota Jidosha Kabushiki KaishaInventors: Yoshihiro Osawa, Hiroshi Isono
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Publication number: 20110226961Abstract: A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.Type: ApplicationFiled: February 24, 2011Publication date: September 22, 2011Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro OSAWA, Kazuaki Ohkubo
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Publication number: 20110205541Abstract: An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.Type: ApplicationFiled: February 16, 2011Publication date: August 25, 2011Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro OSAWA, Kazuaki Ohkubo
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Patent number: 7847935Abstract: An FTIR measurement is conducted on a background gas to obtain a single beam spectrum SB(BG) [C] and a synthetic single beam spectrum SSB(BG)[D], and an FTIR measurement is conducted on a sample gas to obtain a single beam spectrum SB(Samp)[E] and a synthetic single beam spectrum SSB(Samp)[F].Type: GrantFiled: March 18, 2008Date of Patent: December 7, 2010Assignee: Otsuka Electronics Co., Ltd.Inventors: Satoshi Nitta, Yoshihiro Osawa
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Publication number: 20100000827Abstract: A disk brake apparatus that can suppress vibration and a brake noise phenomenon in a low deceleration range and increase braking force in a high deceleration range. In the low deceleration range a push surface at a tip of a small-diameter push portion of an inner piston pushes a back plate of a brake pad at a center of the push surface corresponding to a radial inside where deflection and inclination of a disk rotor is insignificant, thereby suppressing the vibration and brake noise phenomenon in the low deceleration range. In the high deceleration range the back plate of the brake pad is pushed at a radially outside push location of the disk rotor in an aperture-side end face of an outer piston, thereby making the braking force in the high deceleration range larger than the braking force in the low deceleration range.Type: ApplicationFiled: January 25, 2008Publication date: January 7, 2010Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Yoshihiro Osawa, Hiroshi Isono
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Publication number: 20080231841Abstract: An FTIR measurement is conducted on a background gas to obtain a single beam spectrum SB(BG) [C] and a synthetic single beam spectrum SSB(BG)[D], and an FTIR measurement is conducted on a sample gas to obtain a single beam spectrum SB(Samp)[E] and a synthetic single beam spectrum SSB(Samp)[F].Type: ApplicationFiled: March 18, 2008Publication date: September 25, 2008Inventors: Satoshi NITTA, Yoshihiro Osawa
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Publication number: 20080223109Abstract: In a wave number region of measurement of a gas to be measured, an absorbance of the gas is found to calculate a concentration thereof, and the concentration is compared with a threshold value (FIG. 3; S8). When the concentration exceeds the threshold value, an absorbance of an interference-component gas is found to calculate a concentration thereof in a wave number region of measurement of the interference-component gas (S9). The concentration of the interference-component gas is compared with a threshold value of the concentration of the interference-component gas (S10) to generate information indicating that the concentration of the gas to be measured is high when the concentration of the interference-component gas is within the threshold value (S11).Type: ApplicationFiled: March 14, 2008Publication date: September 18, 2008Inventors: Satoshi NITTA, Yoshihiro Osawa