Patents by Inventor Yoshihiro Sanpei

Yoshihiro Sanpei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7864325
    Abstract: An interferometer of the invention includes: a first splitting element which includes a first transparent medium and a first splitting film formed on the first transparent medium, and which splits incident light into a first split beam and a second split beam, the first split beam being the incident light reflected by the first splitting element and the second split beam being the incident light transmitted through the first splitting element; and a second splitting element which includes a second transparent medium and a second splitting film formed on the second transparent medium, and which causes interference between the first split beam and the second split beam passed through different optical paths, the second splitting element being positioned such that a positional relationship between the second transparent medium and the second splitting film with respect to a direction of incidence on the second splitting element of the first split beam is opposite to a positional relationship between the first tr
    Type: Grant
    Filed: March 25, 2008
    Date of Patent: January 4, 2011
    Assignee: Yokogawa Electric Corporation
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Shinji Iio, Morio Wada, Mamoru Hihara, Koki Iemura
  • Patent number: 7848662
    Abstract: A delay interferometer and a demodulator including the delay interferometer and a balanced photodetector are provided. A half mirror splits an optical signal into first and second split beams of light which travel on first and second optical paths, respectively. A first reflector being disposed on the first optical path reflects the first split beam of light toward the half mirror. The second reflector being disposed on the second optical path reflects the second split beam of light toward the half mirror. At least one phase compensator being disposed between the half mirror and at least one of the first and second reflectors includes a medium that exhibits thermooptic effect and has temperature dependency of refractive index. The half mirror couples the first and second split beams of light to generate at least first and second coupled beams of light.
    Type: Grant
    Filed: May 3, 2007
    Date of Patent: December 7, 2010
    Assignee: Yokogawa Electric Corporation
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Morio Wada, Hiroyuki Matsuura, Akira Miura
  • Patent number: 7847952
    Abstract: An interferometer of the present invention includes: a splitting element which splits an incident light beam into a first split beam and a second split beam; and a first phase compensator which is positioned in an optical path of the first split beam, and which compensates a phase difference occurring between the first split beam and the second split beam upon splitting of the incident light beam by said splitting element.
    Type: Grant
    Filed: March 7, 2008
    Date of Patent: December 7, 2010
    Assignee: Yokogawa Electric Corporation
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Shinji Iio, Morio Wada
  • Publication number: 20090027683
    Abstract: An interferometer of the invention includes: a first splitting element which includes a first transparent medium and a first splitting film formed on the first transparent medium, and which splits incident light into a first split beam and a second split beam, the first split beam being the incident light reflected by the first splitting element and the second split beam being the incident light transmitted through the first splitting element; and a second splitting element which includes a second transparent medium and a second splitting film formed on the second transparent medium, and which causes interference between the first split beam and the second split beam passed through different optical paths, the second splitting element being positioned such that a positional relationship between the second transparent medium and the second splitting film with respect to a direction of incidence on the second splitting element of the first split beam is opposite to a positional relationship between the first tr
    Type: Application
    Filed: March 25, 2008
    Publication date: January 29, 2009
    Applicant: Yokogawa Electric Corporation
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Shinji Iio, Morio Wada, Mamoru Hihara, Koki Iemura
  • Publication number: 20080218836
    Abstract: An interferometer of the present invention includes: a splitting element which splits an incident light beam into a first split beam and a second split beam; and a first phase compensator which is positioned in an optical path of the first split beam, and which compensates a phase difference occurring between the first split beam and the second split beam upon splitting of the incident light beam by said splitting element.
    Type: Application
    Filed: March 7, 2008
    Publication date: September 11, 2008
    Applicant: Yokogawa Electric Corporation
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Shinji Iio, Morio Wada
  • Patent number: 7411725
    Abstract: A demodulator includes: a Michelson interferometer having: a half-mirror which splits an optical signal, emits a first split light to a first optical path, and emits a second split light to a second optical path; a first reflector which reflects the first split light to the half-mirror; and a second reflector which reflects the second split light to the half-mirror, wherein the half-mirror recombines the first split light and the second split light, and emits a recombined optical signal while splitting the recombined optical signal; and an balanced optical detector which receives the recombined optical signals from the Michelson interferometer, and generates a demodulated signal based on the two recombined optical signals. The length difference between the first optical path and the second optical path is set so that the second split light has a delay time equal to a one-bit period, with respect to the first split light.
    Type: Grant
    Filed: November 29, 2006
    Date of Patent: August 12, 2008
    Assignee: Yokogawa Electric Corporation
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Morio Wada
  • Publication number: 20070264029
    Abstract: A delay interferometer and a demodulator including the delay interferometer and a balanced photodetector are provided. A half mirror splits an optical signal into first and second split beams of light which travel on first and second optical paths, respectively. A first reflector being disposed on the first optical path reflects the first split beam of light toward the half mirror. The second reflector being disposed on the second optical path reflects the second split beam of light toward the half mirror. At least one phase compensator being disposed between the half mirror and at least one of the first and second reflectors includes a medium that exhibits thermooptic effect and has temperature dependency of refractive index. The half mirror couples the first and second split beams of light to generate at least first and second coupled beams of light.
    Type: Application
    Filed: May 3, 2007
    Publication date: November 15, 2007
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Morio Wada, Hiroyuki Matsuura, Akira Miura
  • Publication number: 20070140695
    Abstract: A demodulator includes: a Michelson interferometer having: a half-mirror which splits an optical signal, emits a first split light to a first optical path, and emits a second split light to a second optical path; a first reflector which reflects the first split light to the half-mirror; and a second reflector which reflects the second split light to the half-mirror, wherein the half-mirror recombines the first split light and the second split light, and emits a recombined optical signal while splitting the recombined optical signal; and an balanced optical detector which receives the recombined optical signals from the Michelson interferometer, and generates a demodulated signal based on the two recombined optical signals. The length difference between the first optical path and the second optical path is set so that the second split light has a delay time equal to a one-bit period, with respect to the first split light.
    Type: Application
    Filed: November 29, 2006
    Publication date: June 21, 2007
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Morio Wada
  • Patent number: 6999169
    Abstract: The present invention is intended to realize a spectrometer which improves the wavelength resolution without being affected by the pitch of the photodiode array. The present invention is characterized by a spectrometer which comprises a wavelength dispersion device spectrally dividing the measured light beam and a photodiode array composed of a plurality of photodiodes that detect the spectrally divided light beams by the wavelength dispersion device and output photocurrents, and performs measurement using the outputs of the photodiode array; providing a deflecting means that deflects the measured light beams and changes the position where the measured light beams are detected by the above photodiode array, and measuring the characteristics of the measured light beam from the measured results for different deflection amounts.
    Type: Grant
    Filed: December 26, 2002
    Date of Patent: February 14, 2006
    Assignee: Yokogawa Electric Corporation
    Inventors: Yoshihiro Sanpei, Makoto Komiyama, Kenji Ogino, Yasuyuki Suzuki, Raiju Okada, Shuuhei Okada
  • Patent number: 6885447
    Abstract: The present invention relates to a spectrometer whereby the accuracy of wavelength measurement can be improved without being affected by the environment of use. The present invention is characterized by improvements made to a spectrometer for spectrally dividing the light under measurement by transmitting the components thereof at different, wavelength-by-wavelength angles, and receiving and detecting the light under measurement thus spectrally divided by the chromatic dispersion device using an optical detector. The apparatus according to the present invention comprises a refractive index compensation means for compensating changes in the angle at which the chromatic dispersion device transmits the light under measurement, according to changes in the refractive index of the medium in which the chromatic dispersion device is placed.
    Type: Grant
    Filed: September 3, 2003
    Date of Patent: April 26, 2005
    Assignee: Yokogawa Electric Corporation
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Makoto Komiyama, Kenji Ogino, Raiju Okada, Shuuhei Okada, Shin Kamei
  • Publication number: 20040075831
    Abstract: The present invention relates to a spectrometer whereby the accuracy of wavelength measurement can be improved without being affected by the environment of use.
    Type: Application
    Filed: September 3, 2003
    Publication date: April 22, 2004
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Makoto Komiyama, Kenji Ogino, Raiju Okada, Shuuhei Okada, Shin Kamei
  • Publication number: 20030128359
    Abstract: The present invention is intended to realize a spectrometer which improves the wavelength resolution without being affected by the pitch of the photodiode array. The present invention is characterized by a spectrometer which comprises a wavelength dispersion device spectrally dividing the measured light beam and a photodiode array composed of a plurality of photodiodes that detect the spectrally divided light beams by the wavelength dispersion device and output photocurrents, and performs measurement using the outputs of the photodiode array; providing a deflecting means that deflects the measured light beams and changes the position where the measured light beams are detected by the above photodiode array, and measuring the characteristics of the measured light beam from the measured results for different deflection amounts.
    Type: Application
    Filed: December 26, 2002
    Publication date: July 10, 2003
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yoshihiro Sanpei, Makoto Komiyama, Kenji Ogino, Yasuyuki Suzuki, Raiju Okada, Shuuhei Okada