Abstract: A semiconductor integrated circuit includes a memory that operates in synchronization with a first clock and a built-in self-test (BIST) circuit for testing the memory. The BIST circuit includes a test data output circuit for outputting test data as input test data to the memory in synchronization with a second clock, an input circuit for receiving output data from the memory in synchronization with a third clock, and a phase shifter for shifting a phase of the first clock and generating the second clock and the third clock.