Patents by Inventor Yoshihito Yuhara

Yoshihito Yuhara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6993444
    Abstract: A measuring method of determining component concentration in a solution by calculating component concentrations in the solution at various temperatures in a small number of steps. The component concentration is measured at an arbitrary temperature T by using a solution absorbance spectrum and solvent absorbance spectrum at a plurality of wavelength(s)r, and preliminarily determining a calibration coefficient Mij (TO). Concentration of Ci of component i in solution at reference temperature TO, is obtained at differential spectrum of solution spectrum S (?j, T) at temperature T in j-th wavelength ?j and solvent spectrum B (?j, T) at temperature T in j-th wavelength ?j, calculating calibration coefficient Mij (TO) the specific component concentrations.
    Type: Grant
    Filed: September 2, 2004
    Date of Patent: January 31, 2006
    Assignee: Horiba, Ltd.
    Inventors: Issei Yokoyama, Yoshihito Yuhara, Junji Kojima, Takaaki Yada
  • Publication number: 20050065750
    Abstract: A measuring method of determining component concentration in a solution by calculating component concentrations in the solution at various temperatures in a small number of steps. The component concentration is measured at an arbitrary temperature T by using a solution absorbance spectrum and solvent absorbance spectrum at a plurality of wavelength(s)r, and preliminarily determining a calibration coefficient Mij (TO). Concentration of Ci of component i in solution at reference temperature TO, is obtained at differential spectrum of solution spectrum S (?j, T) at temperature T in j-th wavelength ?j and solvent spectrum B (?j, T) at temperature T in j-th wavelength ?j, calculating calibration coefficient Mij (TO) the specific component concentrations.
    Type: Application
    Filed: September 2, 2004
    Publication date: March 24, 2005
    Inventors: Issei Yokoyama, Yoshihito Yuhara, Junji Kojima, Takaaki Yada
  • Patent number: 6310356
    Abstract: A fine particle measuring system for semiconductor cleaning fluid includes a sample tank for holding a sample of the cleaning fluid and a pump that can circulate the sample of cleaning fluid. A return conduit is connected to a filter and a bubble discharge opening member to return a major portion of the sample of cleaning fluid to the sample tank. A minor portion of the cleaning fluid is directed respectively to a cooling unit, and then to a deaerator for eliminating any effects of bubbles on the measurement of fine particles in the cleaning fluid. A first conduit is connected to a measuring cell to return the sample cleaning fluid to the sample tank while a second conduit is connected to the deaerator to draw gas from the bubbles that have been separated from the deaerator.
    Type: Grant
    Filed: February 17, 1999
    Date of Patent: October 30, 2001
    Assignee: Horiba, Ltd.
    Inventors: Yoshihito Yuhara, Riichiro Suzuki