Patents by Inventor Yoshikatsu Sekiai

Yoshikatsu Sekiai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6729177
    Abstract: An airtightness failure inspection method according to the present invention comprises an initial step of generating an independent constant flow of gas in the interior of a cover 11 formed in such a manner as to surround an inspecting area of an inspection object and a detector 17, a pre-inspection step of sealing a tracer gas in the interior of the inspection object under pressure and placing the cover over the inspecting area, a measuring step of introducing a gas containing the tracer gas that has leaked from the inspecting area and which is drawn out of the cover into the detector for measuring the amount of the leak and a cleaning step of cleaning up flow paths constituting the flow path systems and instruments including the detector after the measurement is completed.
    Type: Grant
    Filed: February 5, 2003
    Date of Patent: May 4, 2004
    Assignee: Denso Corporation
    Inventors: Hiroshi Shioya, Atsushi Otani, Hiroaki Sasaki, Yoshikatsu Sekiai
  • Publication number: 20030154768
    Abstract: An airtightness failure inspection method according to the present invention comprises an initial step of generating an independent constant flow of gas in the interior of a cover 11 formed in such a manner as to surround an inspecting area of an inspection object and a detector 17, a pre-inspection step of sealing a tracer gas in the interior of the inspection object under pressure and placing the cover over the inspecting area, a measuring step of introducing a gas containing the tracer gas that has leaked from the inspecting area and which is drawn out of the cover into the detector for measuring the amount of the leak and a cleaning step of cleaning up flow paths constituting the flow path systems and instruments including the detector after the measurement is completed.
    Type: Application
    Filed: February 5, 2003
    Publication date: August 21, 2003
    Inventors: Hiroshi Shioya, Atsushi Otani, Hiroaki Sasaki, Yoshikatsu Sekiai