Patents by Inventor Yoshikatsu Umemura

Yoshikatsu Umemura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11201047
    Abstract: To acquire a mass spectrum for a wide mass range, a normal analysis execution controlling unit controls components to repeatedly perform measurement while changing setting m/z by a predetermined m/z at a time, and a mass spectrum summarizing processing unit summarizes data pieces each obtained by each time of measurement to generate the mass spectrum. Radio-frequency voltage applied to an ion guide and the like is changed based on the setting m/z. The radio-frequency voltage for the setting m/z is determined using a table in which a relationship between a position on an axis between upper and lower limits of the mass range and the radio-frequency voltage is substantially the same regardless of the mass range.
    Type: Grant
    Filed: May 14, 2018
    Date of Patent: December 14, 2021
    Assignee: SHIMADZU CORPORATION
    Inventors: Tomoyuki Oshiro, Yoshikatsu Umemura, Kazuma Maeda
  • Publication number: 20210242008
    Abstract: To acquire a mass spectrum for a wide mass range, a normal analysis execution controlling unit controls components to repeatedly perform measurement while changing setting m/z by a predetermined m/z at a time, and a mass spectrum summarizing processing unit summarizes data pieces each obtained by each time of measurement to generate the mass spectrum. Radio-frequency voltage applied to an ion guide and the like is changed based on the setting m/z. The radio-frequency voltage for the setting m/z is determined using a table in which a relationship between a position on an axis between upper and lower limits of the mass range and the radio-frequency voltage is substantially the same regardless of the mass range.
    Type: Application
    Filed: May 14, 2018
    Publication date: August 5, 2021
    Applicant: SHIMADZU CORPORATION
    Inventors: Tomoyuki OSHIRO, Yoshikatsu UMEMURA, Kazuma MAEDA
  • Patent number: 10763094
    Abstract: For every acquisition of a set of mass spectrum data, a mass calibrator (determines the amount of mass discrepancy using the appearance position of a peak originating from an internal standard substance having a known m/z value, and performs a process for correcting the mass discrepancy. A mass calibration information collector (collects the amount of mass discrepancy or mass correction quantity for each set of mass spectrum data. After the completion of the measurement, a three-dimensional display information creator creates a three-dimensional graph showing the large number of collected mass correction quantities plotted in a three-dimensional space in which the retention time in a primary column and the retention time in a secondary column in a comprehensive two-dimensional LC unit are represented by two mutually orthogonal axes while the mass correction quantity is represented by the axis orthogonal to those two axes.
    Type: Grant
    Filed: December 25, 2014
    Date of Patent: September 1, 2020
    Assignee: SHIMADZU CORPORATION
    Inventors: Shinichi Yamaguchi, Yoshikatsu Umemura, Masahiro Ikegami, Koji Tanaka
  • Patent number: 10739320
    Abstract: For a sample containing a target component, a product-ion scan measurement in which the m/z value of a known ion originating from the compound is designated as a precursor ion is performed in a measurement unit (1) to acquire profile spectrum data. A peak detector (22) in a data processing unit (2A) detects peaks on the profile spectrum. For each detected peak, a product-ion m/z-value acquirer (23) acquires an m/z value corresponding to the maximum intensity as the m/z value of a product ion. A pseudo MRM measurement data extractor (24) adopts the m/z value of the precursor ion and that of the product ion as an MRM transition, extracts the maximum intensity of the peak originating from the product ion as the signal intensity value on that MRM transition, and stores these data as pseudo MRM measurement data in a memory section (25).
    Type: Grant
    Filed: December 15, 2016
    Date of Patent: August 11, 2020
    Assignee: SHIMADZU CORPORATION
    Inventors: Hideki Yamamoto, Yoshikatsu Umemura
  • Patent number: 10557837
    Abstract: Nonuse-indication information can be set for each peak on a mass spectrum collected in a compound database, as attribute information, the nonuse-indication information allowing the selection of whether to be used in a database search. For example, nonuse-indication information is set in advance to a noise peak mixed in actual measurement, an impurity-originated peak, and the like. In identifying a compound, when nonuse-indication information is read from the database for a database search together with a mass spectrum, an unnecessary information deleting section transmits a mass spectrum from which a peak set with the nonuse-indication information is deleted, to a compound candidate extracting section and a scoring section. Therefore, a peak set with the nonuse-indication information is ignored in, for example, calculating the score of a compound candidate, which allows a score with a high accuracy to be calculated, resulting in an improved identification accuracy.
    Type: Grant
    Filed: January 13, 2015
    Date of Patent: February 11, 2020
    Assignee: SHIMADZU CORPORATION
    Inventors: Tetsuya Kageyama, Yoshikatsu Umemura
  • Publication number: 20200003739
    Abstract: For a sample containing a target component, a product-ion scan measurement in which the m/z value of a known ion originating from the compound is designated as a precursor ion is performed in a measurement unit (1) to acquire profile spectrum data. A peak detector (22) in a data processing unit (2A) detects peaks on the profile spectrum. For each detected peak, a product-ion m/z-value acquirer (23) acquires an m/z value corresponding to the maximum intensity as the m/z value of a product ion. A pseudo MRM measurement data extractor (24) adopts the m/z value of the precursor ion and that of the product ion as an MRM transition, extracts the maximum intensity of the peak originating from the product ion as the signal intensity value on that MRM transition, and stores these data as pseudo MRM measurement data in a memory section (25).
    Type: Application
    Filed: December 15, 2016
    Publication date: January 2, 2020
    Applicant: SHIMADZU CORPORATION
    Inventors: Hideki YAMAMOTO, Yoshikatsu UMEMURA
  • Patent number: 10453227
    Abstract: A mass spectrometry data processing apparatus having a function of displaying a plurality of MSn spectra in an arranged manner is allowed to display these MSn spectra in a state where a user can easily grasp presence or absence of a common neutral loss. A mass spectrometry data processing apparatus 20 that displays, on a display screen, an MSn spectrum resulting from mass spectrometric analysis of n?1 stage dissociation, where n is integer of two or more, of an ion, includes: a precursor ion identifying section 32 configured to identify, for each of a plurality of MSn spectra, a mass-to-charge ratios m/z of a precursor ion from which the MSn spectra are obtained; and a spectrum aligning section 33 configure to display the MSn spectra on the display screen in a vertically arranged manner such that positions of the mass-to-charge ratios m/z of the respective precursor ions are located at a same horizontal position of the display screen.
    Type: Grant
    Filed: September 8, 2015
    Date of Patent: October 22, 2019
    Assignee: SHIMADZU CORPORATION
    Inventors: Hiroyuki Yasuda, Yoshikatsu Umemura, Tetsuya Kageyama
  • Patent number: 10192724
    Abstract: When, in performing MS/MS analysis on a multivalent ion originated from a target component, an analyzing operator inputs at least two values of a mass value mLoss of an eliminated fragment, a valence zLoss of the eliminated fragment, a valence zPrec of a precursor ion and a valence zProd of a product ion by an inputting unit, a valence calculating unit calculates an uninput valence zPrec or zProd based on the relation, zPrec=zProd+zLoss. Upon the start of the MS/MS analysis, a precursor ion m/z setting unit sets m/z=MPrec of an ion that passes through a front-stage quadrupole mass filter , and a passed product ion m/z calculating unit calculates m/z=MProd of the product ion that passes through a rear-stage quadrupole mass filter by applying MPrec, mLoss, zPrec and zProd above to the relational expression, MProd=(MPrec√ózPrec?mLoss)/zProd.
    Type: Grant
    Filed: June 16, 2014
    Date of Patent: January 29, 2019
    Assignee: SHIMADZU CORPORATION
    Inventor: Yoshikatsu Umemura
  • Publication number: 20180218892
    Abstract: For every acquisition of a set of mass spectrum data, a mass calibrator (determines the amount of mass discrepancy using the appearance position of a peak originating from an internal standard substance having a known m/z value, and performs a process for correcting the mass discrepancy. A mass calibration information collector (collects the amount of mass discrepancy or mass correction quantity for each set of mass spectrum data. After the completion of the measurement, a three-dimensional display information creator creates a three-dimensional graph showing the large number of collected mass correction quantities plotted in a three-dimensional space in which the retention time in a primary column and the retention time in a secondary column in a comprehensive two-dimensional LC unit are represented by two mutually orthogonal axes while the mass correction quantity is represented by the axis orthogonal to those two axes.
    Type: Application
    Filed: December 25, 2014
    Publication date: August 2, 2018
    Applicant: SHIMADZU CORPORATION
    Inventors: Shinichi YAMAGUCHI, Yoshikatsu UMEMURA, Masahiro IKEGAMI, Koji TANAKA
  • Publication number: 20170140909
    Abstract: When, in performing MS/MS analysis on a multivalent ion originated from a target component, an analyzing operator inputs at least two values of a mass value mLoss of an eliminated fragment, a valence zLoss of the eliminated fragment, a valence zPrec of a precursor ion and a valence zProd of a product ion by an inputting unit, a valence calculating unit calculates an uninput valence zPrec or zProd based on the relation, zPrec=zProd+zLoss. Upon the start of the MS/MS analysis, a precursor ion m/z setting unit sets m/z=MPrec of an ion that passes through a front-stage quadrupole mass filter , and a passed product ion m/z calculating unit calculates m/z=MProd of the product ion that passes through a rear-stage quadrupole mass filter by applying MPrec, mLoss, zPrec and zProd above to the relational expression, MProd=(MPrec√ózPrec?mLoss)/zProd.
    Type: Application
    Filed: June 16, 2014
    Publication date: May 18, 2017
    Applicant: SHIMADZU CORPORATION
    Inventor: Yoshikatsu UMEMURA
  • Publication number: 20170131248
    Abstract: Nonuse-indication information can be set for each peak on a mass spectrum collected in a compound database, as attribute information, the nonuse-indication information allowing the selection of whether to be used in a database search. For example, nonuse-indication information is set in advance to a noise peak mixed in actual measurement, an impurity-originated peak, and the like. In identifying a compound, when nonuse-indication information is read from the database for a database search together with a mass spectrum, an unnecessary information deleting section transmits a mass spectrum from which a peak set with the nonuse-indication information is deleted, to a compound candidate extracting section and a scoring section. Therefore, a peak set with the nonuse-indication information is ignored in, for example, calculating the score of a compound candidate, which allows a score with a high accuracy to be calculated, resulting in an improved identification accuracy.
    Type: Application
    Filed: January 13, 2015
    Publication date: May 11, 2017
    Applicant: SHIMADZU CORPORATION
    Inventors: Tetsuya KAGEYAMA, Yoshikatsu UMEMURA
  • Publication number: 20160092151
    Abstract: A mass spectrometry data processing apparatus having a function of displaying a plurality of MSn spectra in an arranged manner is allowed to display these MSn spectra in a state where a user can easily grasp presence or absence of a common neutral loss. A mass spectrometry data processing apparatus 20 that displays, on a display screen, an MSn spectrum resulting from mass spectrometric analysis of n?1 stage dissociation, where n is integer of two or more, of an ion, includes: a precursor ion identifying section 32 configured to identify, for each of a plurality of MSn spectra, a mass-to-charge ratios m/z of a precursor ion from which the MSn spectra are obtained; and a spectrum aligning section 33 configure to display the MSn spectra on the display screen in a vertically arranged manner such that positions of the mass-to-charge ratios m/z of the respective precursor ions are located at a same horizontal position of the display screen.
    Type: Application
    Filed: September 8, 2015
    Publication date: March 31, 2016
    Applicant: SHIMADZU CORPORATION
    Inventors: Hiroyuki Yasuda, Yoshikatsu Umemura, Tetsuya Kageyama
  • Patent number: 8666681
    Abstract: The present invention aims at providing a method and apparatus for analyzing a mass spectrum on which multivalent ion peaks originating from a target compound appear, and calculating the mass of the target compound. First, each peak on the mass spectrum is analyzed to detect isotopic clusters, and the valence and the representative point (m/z value) of each isotopic cluster are obtained (S1 through S3). Since the range of the m/z value of the component which is added to or desorbed from the compound is limited, by using this factor, the isotopic clusters originating from the same compound are deduced. By combining the deduced isotopic clusters, the candidates for the m/z value of the added/desorbed component are deduced (S5).
    Type: Grant
    Filed: June 4, 2008
    Date of Patent: March 4, 2014
    Assignee: Shimadzu Corporation
    Inventors: Akira Noda, Yoshikatsu Umemura
  • Patent number: 8067729
    Abstract: In a mass analysis data analyzing apparatus, centroid data is used as mass spectrum data to be analyzed. First, peaks on the centroid data are specified in order of intensity as a standard peak for identifying an isotopic cluster. The isotopic cluster is detected by comparing an emerging pattern of peaks near the standard peak and an emerging pattern of peaks of an expected isotopic cluster in the case where each valence is assumed. The valence of the determined isotopic cluster is set as the valence of the peaks belonging to the isotopic cluster, and the peak at the forefront of cluster is selected as a monoisotopic peak. With such a mass analysis data analyzing apparatus, it is possible to determine the valence of each peak and identify the monoisotopic peak in a mass spectrum.
    Type: Grant
    Filed: April 26, 2010
    Date of Patent: November 29, 2011
    Assignee: Shimadzu Corporation
    Inventors: Kazuo Yamauchi, Yoshitake Yamamoto, Yoshikatsu Umemura
  • Patent number: 8044347
    Abstract: Intensity data of the signals produced by an ion detector are sequentially stored in a data processor, with each piece of intensity data being associated with time t required for each of the various ions ejected from an ion trap to fly through a time-of-flight space and reach the ion detector. The data obtained within a time range T2 corresponding to a measurement mass range are extracted as profile data. The data obtained within either a time range T1 before the arrival of an ion having the smallest m/z value or a time range T3 after the arrival of an ion having the largest m/z value are extracted as noise component data. Various kinds of noise information such as the noise level or standard deviation are calculated from the noise component data. Based on this noise information, a noise component is removed from the profile data. For every mass scan cycle, the noise component data and profile data are almost simultaneously obtained.
    Type: Grant
    Filed: April 16, 2009
    Date of Patent: October 25, 2011
    Assignee: Shimadzu Corporation
    Inventors: Yoshitake Yamamoto, Yoshikatsu Umemura
  • Publication number: 20110125416
    Abstract: The present invention aims at providing a method and apparatus for analyzing a mass spectrum on which multivalent ion peaks originating from a target compound appear, and calculating the mass of the target compound. First, each peak on the mass spectrum is analyzed to detect isotopic clusters, and the valence and the representative point (m/z value) of each isotopic cluster are obtained (S1 through S3). Since the range of the m/z value of the component which is added to or desorbed from the compound is limited, by using this factor, the isotopic clusters originating from the same compound are deduced. By combining the deduced isotopic clusters, the candidates for the m/z value of the added/desorbed component are deduced (S5).
    Type: Application
    Filed: June 4, 2008
    Publication date: May 26, 2011
    Applicant: SHIMADZU CORPORATION
    Inventors: Akira Noda, Yoshikatsu Umemura
  • Patent number: 7880135
    Abstract: The analyst previously enters the mass of a fragment that desorbs in the first dissociation with other analysis conditions, as the precursor ion selection reference for the second dissociation through the input unit 25. When the automatic analysis is started, the controller unit 21 sequentially performs the MS1 analysis, MS2 analysis and MS3 analysis. In the course of these analyses, the data processing unit 23 determines the valence of each ion species corresponding to the peaks appearing in the mass spectrum obtained by the MS1 analysis. In addition, after the MS2 analysis, the data processing unit 23 searches for the ion species in conformity with the selection reference in consideration of the determined valence, among the ion species corresponding to the peaks appearing in the mass spectrum by the MS2 analysis. The selected ion is determined as the precursor ion for the second dissociation in the MS3 analysis.
    Type: Grant
    Filed: June 27, 2006
    Date of Patent: February 1, 2011
    Assignee: Shimadzu Corporation
    Inventor: Yoshikatsu Umemura
  • Publication number: 20100228498
    Abstract: In a mass analysis data analyzing apparatus, centroid data is used as mass spectrum data to be analyzed. First, peaks on the centroid data are specified in order of intensity as a standard peak for identifying an isotopic cluster. The isotopic cluster is detected by comparing an emerging pattern of peaks near the standard peak and an emerging pattern of peaks of an expected isotopic cluster in the case where each valence is assumed. The valence of the determined isotopic cluster is set as the valence of the peaks belonging to the isotopic cluster, and the peak at the forefront of cluster is selected as a monoisotopic peak. With such a mass analysis data analyzing apparatus, it is possible to determine the valence of each peak and identify the monoisotopic peak in a mass spectrum.
    Type: Application
    Filed: April 26, 2010
    Publication date: September 9, 2010
    Applicant: SHIMADZU CORPORATION
    Inventors: Kazuo Yamauchi, Yoshitake Yamamoto, Yoshikatsu Umemura
  • Publication number: 20090266983
    Abstract: Intensity data of the signals produced by an ion detector are sequentially stored in a data processor, with each piece of intensity data being associated with time t required for each of the various ions ejected from an ion trap to fly through a time-of-flight space and reach the ion detector. The data obtained within a time range T2 corresponding to a measurement mass range are extracted as profile data. The data obtained within either a time range T1 before the arrival of an ion having the smallest m/z value or a time range T3 after the arrival of an ion having the largest m/z value are extracted as noise component data. Various kinds of noise information such as the noise level or standard deviation are calculated from the noise component data. Based on this noise information, a noise component is removed from the profile data. For every mass scan cycle, the noise component data and profile data are almost simultaneously obtained.
    Type: Application
    Filed: April 16, 2009
    Publication date: October 29, 2009
    Applicant: SHIMADZU CORPORATION
    Inventors: Yoshitake YAMAMOTO, Yoshikatsu Umemura
  • Publication number: 20090166522
    Abstract: The analyst previously enters the mass of a fragment that desorbs in the first dissociation with other analysis conditions, as the precursor ion selection reference for the second dissociation through the input unit 25. When the automatic analysis is started, the controller unit 21 sequentially performs the MS1 analysis, MS2 analysis and MS3 analysis. In the course of these analyses, the data processing unit 23 determines the valence of each ion species corresponding to the peaks appearing in the mass spectrum obtained by the MS1 analysis. In addition, after the MS2 analysis, the data processing unit 23 searches for the ion species in conformity with the selection reference in consideration of the determined valence, among the ion species corresponding to the peaks appearing in the mass spectrum by the MS2 analysis. The selected ion is determined as the precursor ion for the second dissociation in the MS3 analysis.
    Type: Application
    Filed: June 27, 2006
    Publication date: July 2, 2009
    Applicant: Shimadzu Corporation
    Inventor: Yoshikatsu Umemura