Patents by Inventor Yoshikatu Hatagaki

Yoshikatu Hatagaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuit, semiconductor device and method for enhancing test efficiency of function modules
    Patent number: 6530046
    Abstract: There are provided a semiconductor device and a function module test method, capable of reducing the test time of function modules and reducing the number of test pins. This semiconductor device is formed so as to make test inputs and test outputs of a plurality of function modules having the same function respectively common, conduct tests on arbitrarily selected function modules simultaneously in parallel, and give a pass/fail decision on the semiconductor device including the function modules on the basis of results of comparison between a test result of arbitrary one function module and test results of other function modules.
    Type: Grant
    Filed: February 23, 2000
    Date of Patent: March 4, 2003
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Eiji Hasegawa, Yoshikatu Hatagaki, Ayumi Ishii, Hidekazu Saito, Masaki Kume