Patents by Inventor Yoshikazu HASHINO

Yoshikazu HASHINO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8710469
    Abstract: In an ion implantation method, ion implantation into a substrate is performed while changing a relative positional relation between an ion beam and the substrate. A first ion implantation process in which a uniform dose amount distribution is formed within the substrate and a second ion implantation process in which a non-uniform dose amount distribution is formed within the substrate are performed in a predetermined order. Moreover, a cross-sectional size of an ion beam irradiated on the substrate during the second ion implantation process is set smaller than a cross-sectional size of an ion beam irradiated on the substrate during the first ion implantation process.
    Type: Grant
    Filed: September 6, 2013
    Date of Patent: April 29, 2014
    Assignee: Nissin Ion Equipment Co., Ltd
    Inventors: Hirofumi Asai, Yoshikazu Hashino
  • Publication number: 20140004688
    Abstract: In an ion implantation method, ion implantation into a substrate is performed while changing a relative positional relation between an ion beam and the substrate. A first ion implantation process in which a uniform dose amount distribution is formed within the substrate and a second ion implantation process in which a non-uniform dose amount distribution is formed within the substrate are performed in a predetermined order. Moreover, a cross-sectional size of an ion beam irradiated on the substrate during the second ion implantation process is set smaller than a cross-sectional size of an ion beam irradiated on the substrate during the first ion implantation process.
    Type: Application
    Filed: September 6, 2013
    Publication date: January 2, 2014
    Applicant: NISSIN ION EQUIPMENT CO., LTD
    Inventors: Hirofumi ASAI, Yoshikazu HASHINO
  • Patent number: 8552404
    Abstract: In an ion implantation method, ion implantation into a substrate is performed while changing a relative positional relation between an ion beam and the substrate. A first ion implantation process in which a uniform dose amount distribution is formed within the substrate and a second ion implantation process in which a non-uniform dose amount distribution is formed within the substrate are performed in a predetermined order. Moreover, a cross-sectional size of an ion beam irradiated on the substrate during the second ion implantation process is set smaller than a cross-sectional size of an ion beam irradiated on the substrate during the first ion implantation process.
    Type: Grant
    Filed: March 22, 2011
    Date of Patent: October 8, 2013
    Assignee: Nissin Ion Equipment Co., Ltd
    Inventors: Hirofumi Asai, Yoshikazu Hashino
  • Publication number: 20120196428
    Abstract: In an ion implantation method, ion implantation into a substrate is performed while changing a relative positional relation between an ion beam and the substrate. A first ion implantation process in which a uniform dose amount distribution is formed within the substrate and a second ion implantation process in which a non-uniform dose amount distribution is formed within the substrate are performed in a predetermined order. Moreover, a cross-sectional size of an ion beam irradiated on the substrate during the second ion implantation process is set smaller than a cross-sectional size of an ion beam irradiated on the substrate during the first ion implantation process.
    Type: Application
    Filed: March 22, 2011
    Publication date: August 2, 2012
    Applicant: NISSIN ION EQUIPMENT CO., LTD.
    Inventors: Hirofumi ASAI, Yoshikazu HASHINO