Patents by Inventor Yoshimasa A. Ono
Yoshimasa A. Ono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250091623Abstract: An obstacle monitoring system includes: a sensing means; a first obstacle detection means; and a control means for selectively executing a plurality of control modes including a first control mode in which a moving speed of a moving body is a first moving speed and a sensing field of view of the sensing means is a first field of view, and a second control mode in which a moving speed of the moving body is a second moving speed and a sensing field of view of the sensing means is a second field of view. When the first obstacle detection means detects the obstacle while the control means is executing the first control mode, the control means executes the second control mode in such a way as to capture the obstacle within the second field of view.Type: ApplicationFiled: August 30, 2024Publication date: March 20, 2025Applicant: NEC CorporationInventors: Shingo YAMANOUCHI, Toshiyuki NOMURA, Junichi ABE, Hidemi NOGUCHI, Yoshimasa ONO, Tatsuya FUJIMOTO
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Publication number: 20250054208Abstract: Provided is a processing apparatus capable of obtaining a 2D image from 3D tomographic images, extracting an image for accurate authentication, and extracting an image at a high speed. A processing apparatus includes: means for calculating, from three-dimensional luminance data indicating an authentication target, depth dependence of striped pattern sharpness in a plurality of regions on a plane perpendicular to a depth direction of the target; means for calculating a depth at which the striped pattern sharpness is the greatest in the depth dependence of striped pattern sharpness; rough adjustment means for correcting the calculated depth on the basis of depths of other regions positioned respectively around the plurality of regions; fine adjustment means for selecting a depth closest to the corrected depth and at which the striped pattern sharpness is at an extreme; and means for extracting an image with a luminance on the basis of the selected depth.Type: ApplicationFiled: October 25, 2024Publication date: February 13, 2025Applicant: NEC CorporationInventors: Yoshimasa ONO, Shigeru NAKAMURA, Atsufumi SHIBAYAMA, Junichi ABE
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Publication number: 20250045985Abstract: Provided is a processing apparatus capable of obtaining a 2D image from 3D tomographic images, extracting an image for accurate authentication, and extracting an image at a high speed. A processing apparatus includes: means for calculating, from three-dimensional luminance data indicating an authentication target, depth dependence of striped pattern sharpness in a plurality of regions on a plane perpendicular to a depth direction of the target; means for calculating a depth at which the striped pattern sharpness is the greatest in the depth dependence of striped pattern sharpness; rough adjustment means for correcting the calculated depth on the basis of depths of other regions positioned respectively around the plurality of regions; fine adjustment means for selecting a depth closest to the corrected depth and at which the striped pattern sharpness is at an extreme; and means for extracting an image with a luminance on the basis of the selected depth.Type: ApplicationFiled: October 25, 2024Publication date: February 6, 2025Applicant: NEC CorporationInventors: Yoshimasa ONO, Shigeru NAKAMURA, Atsufumi SHIBAYAMA, Junichi ABE
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Patent number: 12217482Abstract: A processing apparatus (10) includes classification means (12) for classifying three-dimensional point group data acquired based on a reflected light from a structure to be inspected illuminated by light into clusters, which are units of a shape that corresponds to the structure to be inspected, based on positional information at each point of the data; and cluster association means (13) for determining whether a first cluster and a second cluster included in the classified clusters correspond to one structure to be inspected based on a positional relation between the classified clusters.Type: GrantFiled: August 28, 2019Date of Patent: February 4, 2025Assignee: NEC CORPORATIONInventors: Yoshimasa Ono, Akira Tsuji, Junichi Abe
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Patent number: 12175593Abstract: A display device (10) according to the present disclosure includes: a detection unit (11) that detects, in a three-dimensional space including measurement point group data measured by a three-dimensional optical sensor, intermediate point group data of an intermediate region from a viewpoint for two-dimensionally displaying the measurement point group data to target point group data within the measurement point group data; a setting unit (12) that sets, based on the detected intermediate point group data, a display aspect of the measurement point group data or the target point group data in such a way that the target point group data become visually recognizable from the viewpoint; and a display unit (13) that two-dimensionally displays the measurement point group data and the target point group data according to the set display aspect.Type: GrantFiled: March 10, 2020Date of Patent: December 24, 2024Assignee: NEC CORPORATIONInventors: Yoshimasa Ono, Akira Tsuji, Shigeo Suzuki, Junichi Abe, Jiro Abe
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Patent number: 12154258Abstract: There is provided a surface abnormality detection device, and a system, capable of detecting an abnormal portion having a displacement below the distance measurement accuracy when detecting the abnormal portion on the surface of a structure. A surface abnormality detection device includes a classification means for classifying an object under measurement into one or more clusters having the same structure, based on position information at a plurality of points on a surface of the object under measurement; a determination means for determining a reflection brightness normal value of the cluster based on a distribution of reflection brightness values at a plurality of points on a surface of the cluster; and an identification means for identifying an abnormal portion on the surface of the cluster based on a difference between the reflection brightness normal value and the reflection brightness value at each of the plurality of points.Type: GrantFiled: March 17, 2020Date of Patent: November 26, 2024Assignee: NEC CORPORATIONInventors: Yoshimasa Ono, Akira Tsuji, Hidemi Noguchi, Junichi Abe
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Publication number: 20240255628Abstract: Abnormality detection apparatus acquires reference point cloud data and inspection point cloud data for each of a plurality of parts in a space including a target object. The reference point cloud data includes point data representing a three-dimensional position and luminance at reference time for each of a plurality of parts. The inspection point cloud data includes point data representing a three-dimensional position and luminance at time of inspection for each of the plurality of parts. The abnormality detection apparatus generates difference point cloud data representing a difference in luminance between the reference time and the time of inspection for each of the parts, detects an excluded part to be excluded from a detection target of an abnormal part, and detects an abnormal part of the target object from the parts other than the excluded parts by using the difference point cloud data.Type: ApplicationFiled: May 21, 2021Publication date: August 1, 2024Applicant: NEC CorporationInventor: Yoshimasa ONO
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Publication number: 20240249486Abstract: A measurement condition optimization system according to an aspect of the present disclosure includes: a three-dimensional data input unit that inputs three-dimensional data of a measurement target installation in a predetermined facility measured using a measurement device; an overlapping portion determination unit that performs alignment processing on each piece of the input three-dimensional data, and determines an overlapping portion included in the three-dimensional data after the alignment processing; a measurement policy acquisition unit that acquires a measurement policy at the time of acquiring the three-dimensional data of the measurement target installation in the facility using the measurement device; and a measurement condition adjustment unit that adjusts a measurement condition to satisfy the measurement policy acquired by the measurement policy acquisition unit and make the overlapping portion included in the three-dimensional data determined by the overlapping portion determination unit withiType: ApplicationFiled: May 20, 2021Publication date: July 25, 2024Applicant: NEC CorporationInventors: Akira Tsuji, Yoshimasa Ono, Jiro Abe
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Publication number: 20240249433Abstract: An imaging condition determination system according to the present disclosure includes: a reference data holding unit (101) configured to hold reference data representing a position of an object; an indication object holding unit (102) configured to hold an indication object representing a position of a target object on the reference data; an imaging condition determination unit (103) configured to determine an imaging condition of LiDAR for imaging the target object based on the reference data and the indication object; and an imaging condition output unit (104) configured to output the imaging condition.Type: ApplicationFiled: May 17, 2021Publication date: July 25, 2024Applicant: NEC CorporationInventors: Jiro ABE, Yoshimasa Ono
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Publication number: 20240054626Abstract: Provided is a processing device capable of accurately identifying an abnormal part.Type: ApplicationFiled: August 28, 2020Publication date: February 15, 2024Applicant: NEC CorporationInventors: Yoshimasa ONO, Akira TSUJI
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Patent number: 11869179Abstract: An abnormal part display apparatus, an abnormal part display system, an abnormal part displaying method, and an abnormal part displaying program capable of improving visibility of an abnormal part in an object are provided. An abnormal part display apparatus 11 according to the present disclosure includes an acquisition unit 111 configured to acquire point group data of an object obtained by measuring the object by using a laser ranging apparatus 12, and a photograph image of the object obtained by photographing the object by using a photographing apparatus 13, a display unit 112 configured to display the point group data and the photograph image on a predetermined screen, and a control unit 113 configured to control the point group data and the photograph image to be displayed in the display unit 112.Type: GrantFiled: March 5, 2021Date of Patent: January 9, 2024Assignee: NEC CORPORATIONInventors: Shigeo Suzuki, Taisuke Tanabe, Hiroshi Matsumoto, Takanori Shigeta, Junichi Abe, Akira Tsuji, Yoshimasa Ono, Jiro Abe
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Publication number: 20230375709Abstract: A detection device (10) according to the present disclosure includes an acquisition unit (11) that acquires point cloud data indicating a distance from a measurement device to an object and luminance information obtained from reflected light of a beam emitted when the point cloud data is measured, an edge detection unit (12) that performs edge detection based on the luminance information, and a crack determination unit (13) that determines whether an area indicates a crack by using a shape of the area in which, of a plurality of points indicated by the point cloud data, points having luminance within a predetermined range of difference from luminance of a point detected as an edge are distributed.Type: ApplicationFiled: March 31, 2020Publication date: November 23, 2023Applicant: NEC CorporationInventors: Akira TSUJI, Yoshimasa ONO, Junichi ABE, Jiro ABE
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Publication number: 20230333250Abstract: A monitoring system according to the present disclosure includes: a straight line calculation unit configured to calculate a straight line connecting three-dimensional coordinates of a light source and three-dimensional coordinates of a three-dimensional measuring device configured to measure a target to be measured; an invalid region determination unit configured to define a three-dimension invalid region in which point cloud data acquired by the three-dimensional measuring device is invalid based on the straight line; and a point cloud data processing unit configured to monitor the target to be measured based on the acquired point cloud data and the three-dimension invalid region.Type: ApplicationFiled: September 16, 2020Publication date: October 19, 2023Applicant: NEC CorporationInventors: Yoshimasa ONO, Junichi ABE, Hidemi NOGUCHI, Akira TSUJI, Jiro ABE
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Publication number: 20230080973Abstract: There are provided a data processing apparatus, a data processing system, and a data processing method that can improve convenience of display of point group data. A data processing apparatus (1) includes a point group data processing unit (10) configured to display, when a viewpoint for display of point group data obtained by scanning a display object is input, the point group data viewed from the viewpoint, and an image data processing unit (20) configured to determine image data corresponding to the point group data to be displayed, from a plurality of pieces of image data obtained by imaging the display object from different positions, and to display the determined image data.Type: ApplicationFiled: March 10, 2020Publication date: March 16, 2023Applicant: NEC CorporationInventors: Jiro ABE, Akira TSUJI, Junichi ABE, Yoshimasa ONO, Shigeo SUZUKI, Hiroshi MATSUMOTO, Takanori SHIGETA, Taisuke TANABE
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Publication number: 20230080011Abstract: A display device (10) according to the present disclosure includes: a detection unit (11) that detects, in a three-dimensional space including measurement point group data measured by a three-dimensional optical sensor, intermediate point group data of an intermediate region from a viewpoint for two-dimensionally displaying the measurement point group data to target point group data within the measurement point group data; a setting unit (12) that sets, based on the detected intermediate point group data, a display aspect of the measurement point group data or the target point group data in such a way that the target point group data become visually recognizable from the viewpoint; and a display unit (13) that two-dimensionally displays the measurement point group data and the target point group data according to the set display aspect.Type: ApplicationFiled: March 10, 2020Publication date: March 16, 2023Applicant: NEC CorporationInventors: Yoshimasa ONO, Akira TSUJI, Shigeo SUZUKI, Junichi ABE, Jiro ABE
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Publication number: 20230036969Abstract: An object is to provide a measurement apparatus adapted to correctly integrate three-dimensional data acquired at a plurality of points.Type: ApplicationFiled: November 29, 2019Publication date: February 2, 2023Applicant: NEC CorporationInventors: Jiro ABE, Akira TSUJI, Junichi ABE, Yoshimasa ONO
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Publication number: 20220343629Abstract: A processing device (10) includes a classification means (12) for classifying three-dimensional point cloud data acquired based on reflected light from a plurality of reinforcing steel bars irradiated with light in a bar arrangement inspection into clusters, which are shape units corresponding to the plurality of reinforcing steel bars, based on position information at each point in the three-dimensional point cloud data, a smoothing means (13) for smoothing the contours of the classified clusters, and a cluster association means (14) for determining whether a first cluster and a second cluster contained in the smoothed clusters correspond to the same reinforcing steel bar based on positional relation between the smoothed clusters.Type: ApplicationFiled: September 20, 2019Publication date: October 27, 2022Applicant: NEC CorporationInventors: Yoshimasa ONO, Akira TSUJI, Junichi ABE
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Publication number: 20220343628Abstract: A processing apparatus (10) includes classification means (12) for classifying three-dimensional point group data acquired based on a reflected light from a structure to be inspected illuminated by light into clusters, which are units of a shape that corresponds to the structure to be inspected, based on positional information at each point of the data; and cluster association means (13) for determining whether a first cluster and a second cluster included in the classified clusters correspond to one structure to be inspected based on a positional relation between the classified clusters.Type: ApplicationFiled: August 28, 2019Publication date: October 27, 2022Applicant: NEC CorporationInventors: Yoshimasa ONO, Akira TSUJI, Junichi ABE
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Publication number: 20220276181Abstract: The present disclosure is directed to providing a surface anomaly detecting device, a system, a method, and a non-transitory computer-readable medium that can identify an anomalous portion on a surface of a complex structure. A surface anomaly detecting device according to the present disclosure includes: dividing means configured to divide a structure into a plurality of clusters based on position information of a plurality of points on a surface of the structure; coupling means configured to create a cluster group by coupling together two or more of the clusters; determining means configured to determine a reflection luminance normal value of the cluster group based on a distribution of reflection luminance values at a plurality of points on a surface of the cluster group; and identifying means configured to identify an anomalous portion on the surface of the cluster group.Type: ApplicationFiled: August 26, 2019Publication date: September 1, 2022Applicant: NEC CorporationInventors: Yoshimasa ONO, Akira TSUJI, Junichi ABE
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Publication number: 20220277498Abstract: Provided is a processing apparatus capable of obtaining a 2D image from 3D tomographic images, extracting an image for accurate authentication, and extracting an image at a high speed. A processing apparatus includes: means for calculating, from three-dimensional luminance data indicating an authentication target, depth dependence of striped pattern sharpness in a plurality of regions on a plane perpendicular to a depth direction of the target; means for calculating a depth at which the striped pattern sharpness is the greatest in the depth dependence of striped pattern sharpness; rough adjustment means for correcting the calculated depth on the basis of depths of other regions positioned respectively around the plurality of regions; fine adjustment means for selecting a depth closest to the corrected depth and at which the striped pattern sharpness is at an extreme; and means for extracting an image with a luminance on the basis of the selected depth.Type: ApplicationFiled: August 1, 2019Publication date: September 1, 2022Applicant: NEC CorporationInventors: Yoshimasa ONO, Shigeru NAKAMURA, Atsufumi SHIBAYAMA, Junichi ABE