Patents by Inventor Yoshimasa Ogawa

Yoshimasa Ogawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7648237
    Abstract: An automatic suction device for an eyeglass lens and a method for determining suction jig installation position, capable of recognizing that a frame exchange lens holder is being installed on a placement table, making transition to installation work of a frame exchange mode, and avoiding an erroneous contact between the frame exchange frame and a lens holding frame. The kind of holding means placed on the placement table is determined from an image of the inside of an opening (141), which image is taken by a CCD camera (105), and the installation position of a suction jig (121) at an eyeglass lens (L) placed on a frame exchange lens holder (300) is obtained.
    Type: Grant
    Filed: March 24, 2005
    Date of Patent: January 19, 2010
    Assignee: Topcon Corporation
    Inventors: Tsutomu Kigawa, Kazuo Kitamura, Nobuo Kochi, Takahiro Watanabe, Yoshimasa Ogawa
  • Patent number: 7639038
    Abstract: A terminal resistance adjusting method adjusts a terminating resistance within a semiconductor integrated circuit.
    Type: Grant
    Filed: July 13, 2006
    Date of Patent: December 29, 2009
    Assignee: Fujitsu Microelectronics Limited
    Inventors: Yutaka Nemoto, Yoshimasa Ogawa, Miki Yanagawa, Makoto Koga
  • Patent number: 7636162
    Abstract: Microchip testing device having a chip holder that can be exactly positioned and from which adhered sample liquid can be removed easily. The microchip testing device has a chip holder, with a cover and a box area, mounted on a measurement stage, a microchip that has an optical measurement chamber is housed in the chip holder, a light source that radiates light on the optical measurement chamber of the microchip, a detector that receives light that has passed through the optical measurement chamber, and a controller that controls the device. The chip holder has reference planes to position the microchip in two directions perpendicular to the optical axis of the optical measurement chamber and pushers that push the microchip against the reference planes, so that the microchip is positioned within the chip holder by closing the cover of the chip holder.
    Type: Grant
    Filed: September 6, 2007
    Date of Patent: December 22, 2009
    Assignee: Ushiodenki Kabushiki Kaisha
    Inventors: Yoshimasa Ogawa, Kazuyuki Kaneda, Katsutoshi Kabeta
  • Publication number: 20090244539
    Abstract: A testing device equipped with: a microchip having a receiver for a test fluid, a discharge lamp which emits light into the microchip test fluid receiver, a light source housing in which the discharge lamp is located, and an arithmetic calculation mechanism, which calculates the concentration of the component to be detected, based on the intensity of the light emitted from the test fluid container unit. To reduce the size of the device and to shield the arithmetic calculation mechanism from electromagnetic waves generated around the light source, the light source housing is equipped with shielding connected to the ground on the outside of the light source housing made of insulating material. The light source housing is positioned within an enclosure of the testing device holding the microchip and containing the arithmetic calculation mechanism, analysis output device(s), etc.
    Type: Application
    Filed: March 11, 2009
    Publication date: October 1, 2009
    Applicant: Ushiodenki Kabushiki Kaisha
    Inventors: Yoshimasa Ogawa, Katsuoki Miyasu, Yoshihiko Okumura
  • Publication number: 20090075074
    Abstract: It is an object of the present invention to provide an optical layered body which is produced at low cost and is superior in all an antistatic property, hardness and optical properties such as haze and a total light transmittance. An optical layered body comprising a light-transmitting substrate and a hard coat layer formed on the light-transmitting substrate, wherein the hard coat layer is a resin layer formed from a hard coat layer-forming composition containing a quaternary ammonium salt having a weight average molecular weight of 1000 to 50000, a tri- or morefunctional (meth)acrylate compound having a weight average molecular weight of 700 or less, and a permeable solvent; and a content of the quaternary ammonium salt in the hard coat layer is 0.5 to 18% by weight.
    Type: Application
    Filed: September 12, 2008
    Publication date: March 19, 2009
    Applicant: Dai Nippon Printing Co., Ltd.
    Inventors: Tomoyuki Horio, Yukimitsu Iwata, Takashi Kodama, Mariko Hayashi, Kenji Ueno, Atsuhiro Kobayashi, Yoshimasa Ogawa, Yuichi Takaura, Junya Eguchi, Kiyotaka Matsui
  • Publication number: 20080231794
    Abstract: A jig mounting apparatus has a detection optical system that detects reference marker of an eyeglass lens, is configured so as to determine an mounting point based on the reference marker detected by the detection optical system and position the mounting center of jig, which is used in processing the eyeglass lens, on the mounting point to mount the jig on the surface of the eyeglass lens, in which the detection optical system includes: a focusing optical system that focuses a light-emitting optical flux from a light source on the surface of the eyeglass lens, where hidden marks are formed, via an aperture stop; a reflection plate that reflects an optical flux focused by the focusing optical system and passed through the eyeglass lens; and an imaging device that is provided on a position optically approximately conjugate with the aperture stop and configured to focus on a space portion along an optical axis direction from the surface of the eyeglass lens.
    Type: Application
    Filed: March 31, 2005
    Publication date: September 25, 2008
    Applicant: KABUSHIKI KAISHA TOPCON
    Inventors: Eiichi Yanagi, Takahiro Watanabe, Yoshimasa Ogawa, Tsutomu Kikawa, Kazuo Kitamura, Yasuo Suzuki, Kenichi Watanabe
  • Publication number: 20080204654
    Abstract: An automatic suction device for an eyeglass lens and a method for determining suction jig installation position, capable of recognizing that a frame exchange lens holder is being installed on a placement table, making transition to installation work of a frame exchange mode, and avoiding an erroneous contact between the frame exchange frame and a lens holding frame. The kind of holding means placed on the placement table is determined from an image of the inside of an opening (141), which image is taken by a CCD camera (105), and the installation position of a suction jig (121) at an eyeglass lens (L) placed on a frame exchange lens holder (300) is obtained.
    Type: Application
    Filed: March 24, 2005
    Publication date: August 28, 2008
    Inventors: Tsutomu Kigawa, Kazuo Kitamura, Nobuo Kochi, Takahiro Watanabe, Yoshimasa Ogawa
  • Patent number: 7382462
    Abstract: A device for measuring the reflection factor by irradiating a measurement area of a microchip with light, and in which a light receiving part is made to receive light reflected from the measurement area for determination of the reflection factor of the measurement area. The light receiving part is located in an angular region ?, satisfying the relationship (½)????sin?1(1/n) and being located between angles ?min and ?max, ?min and ?max (in°) being angles which the reflection light forms with respect to a normal on the edge of the irradiated surface of the area to be measured in a virtual plane which contains the emission center of the light emitting part and which is perpendicular to the microchip, wherein ?min is ½ ? and ?max corresponds to sin?1(1/n), where ? (°) is the scattering angle of the light radiated by the light emitting part which is located directly above the area to be measured, and wherein n is the index of refraction of the transparent component.
    Type: Grant
    Filed: February 16, 2006
    Date of Patent: June 3, 2008
    Assignee: Ushiodenki Kabushiki Kaisha
    Inventors: Shigeki Matsumoto, Shigenori Nozawa, Yoshimasa Ogawa
  • Publication number: 20080062423
    Abstract: Microchip testing device having a chip holder that can be exactly positioned and from which adhered sample liquid can be removed easily. The microchip testing device has a chip holder, with a cover and a box area, mounted on a measurement stage, a microchip that has an optical measurement chamber is housed in the chip holder, a light source that radiates light on the optical measurement chamber of the microchip, a detector that receives light that has passed through the optical measurement chamber, and a controller that controls the device. The chip holder has reference planes to position the microchip in two directions perpendicular to the optical axis of the optical measurement chamber and pushers that push the microchip against the reference planes, so that the microchip is positioned within the chip holder by closing the cover of the chip holder.
    Type: Application
    Filed: September 6, 2007
    Publication date: March 13, 2008
    Applicant: USHIODENKI KABUSHIKI KAISHA
    Inventors: Yoshimasa OGAWA, Kazuyuki KANEDA, Katsutoshi KABETA
  • Publication number: 20080002178
    Abstract: An absorptiometry microchip testing device with which, after one-time startup, test results of blood analyses are automatically obtained without a special tester. The microchip testing device has a rotary drive source which can be stopped at a prescribed angle; a centrifugal rotor connected to the rotary drive source via the main shaft; a direction switching mechanism for controlling the main shaft gear; a planetary gear which engages the main shaft gear which is located on the centrifugal rotor; a chip holder which turns together with the planetary gear; a microchip which is held in the chip holder and has a part for measuring absorbance; a light source from which light is incident in the absorbance measuring part of the microchip; a detector which receives light transmitted by the absorbance measuring part; and a controller which controls movements of the rotary drive source and the direction switching mechanism.
    Type: Application
    Filed: June 28, 2007
    Publication date: January 3, 2008
    Applicant: USHIODENKI KABUSHIKI KAISHA
    Inventors: Yoshimasa OGAWA, Kazuyuki KANEDA
  • Patent number: 7301574
    Abstract: A solid-state imaging element comprising a plurality of light-receiving sensors that convert optical signals into electrical signals and a memory storing the electrical signals. The memory is formed of a plurality of line buffers corresponding to the pixel units processed in an image data encoder. The solid-state imaging element eliminates the need to rearrange image data for encoding.
    Type: Grant
    Filed: February 5, 2001
    Date of Patent: November 27, 2007
    Assignee: Fujitsu Limited
    Inventor: Yoshimasa Ogawa
  • Publication number: 20070216441
    Abstract: A terminal resistance adjusting method adjusts a terminating resistance within a semiconductor integrated circuit.
    Type: Application
    Filed: July 13, 2006
    Publication date: September 20, 2007
    Inventors: Yutaka Nemoto, Yoshimasa Ogawa, Miki Yanagawa, Makoto Koga
  • Publication number: 20060186407
    Abstract: A device for measuring the reflection factor by irradiating a measurement area of a microchip with light, and in which a light receiving part is made to receive light reflected from the measurement area for determination of the reflection factor of the measurement area. The light receiving part is located in an angular region ?, satisfying the relationship (1/2)???? sin-1(1/n) and being located between angles ?min and ?max, ?min and ?max (in°) being angles which the reflection light forms with respect to a normal on the edge of the irradiated surface of the area to be measured in a virtual plane which contains the emission center of the light emitting part and which is perpendicular to the microchip, wherein ?min is 1/2 ? and ?max corresponds to sin-1(1/n), where ? (°) is the scattering angle of the light radiated by the light emitting part which is located directly above the area to be measured, and wherein n is the index of refraction of the transparent component.
    Type: Application
    Filed: February 16, 2006
    Publication date: August 24, 2006
    Applicant: Ushiodenki Kabushiki Kaisha
    Inventors: Shigeki Matsumoto, Shigenori Nozawa, Yoshimasa Ogawa
  • Patent number: 6984161
    Abstract: A lens grinding processing apparatus of the present invention has lens rotating shafts 23 and 24 for holding an eyeglass lens ML, a lens retaining members (300, 320) fixed respectively to opposed end sections of the lens rotating shafts 23 and 24 capable of slanting adjustably, a drilling device (drilling processing device 200) for drilling a hole for a point frame into the slanted eyeglass lens ML, and a grinding stone (grinding stone 35, chamfering stones 224, 225) for grinding and processing a circumferential part of the eyeglass lens ML.
    Type: Grant
    Filed: September 19, 2003
    Date of Patent: January 10, 2006
    Assignee: Kabushiki Kaisha TOPCON
    Inventors: Yasuo Suzuki, Yoshimasa Ogawa, Yasuhito Eto
  • Patent number: 6964104
    Abstract: To provide a template holder in which parts such as screws for mounting a template to a template mounting member is not lost. A template holder, in which in a state in which an elastic strut 94 is inserted into a holding hole 81 of a template 80, the template 80 is pressed and is caused to abut upon an end surface 91b of a base member 91a by the elastic strut 94 by operating a pressing strut 95, whereby while the template 80 is mounted to a holding member 91, the holding member 91 is departed from the template 80 by operating the pressing strut 95 to thereby enable the template 80 to be removed from the elastic strut 94 and the holding member 91, wherein the pressing strut 95 and the elastic strut 94 are held by the holding member 91 when the template 80 is attached and detached.
    Type: Grant
    Filed: April 23, 2003
    Date of Patent: November 15, 2005
    Assignee: Kabushiki Kaisha TOPCON
    Inventors: Yasuo Suzuki, Yoshimasa Ogawa
  • Patent number: 6871158
    Abstract: An apparatus for measuring a shape of lens frames capable of measuring precisely the shape of lens frames by changing a rotational speed or rotational direction of a measuring element (feeler) 216 in accordance with the shape of lens frames. The measuring element 216 contacts with V-shaped grooves (grooves for lens frames) 51 provided in lens frames LF and RF of an eyeglass frame MF. An arithmetic control circuit 270 controls variably the rotational speed or rotational direction of the measuring element 216.
    Type: Grant
    Filed: December 3, 2002
    Date of Patent: March 22, 2005
    Assignee: Kabushiki Kaisha Topcon
    Inventors: Yasuo Suzuki, Yoshimasa Ogawa
  • Publication number: 20040058624
    Abstract: A lens grinding processing apparatus of the present invention has lens rotating shafts 23 and 24 for holding an eyeglass lens ML, a lens retaining members (300, 320) fixed respectively to opposed end sections of the lens rotating shafts 23 and 24 capable of slanting adjustably, a drilling device (drilling processing device 200) for drilling a hole for a point frame into the slanted eyeglass lens ML, and a grinding stone (grinding stone 35, chamfering stones 224, 225) for grinding and processing a circumferential part of the eyeglass lens ML.
    Type: Application
    Filed: September 19, 2003
    Publication date: March 25, 2004
    Applicant: KABUSHIKI KAISHA TOPCON
    Inventors: Yasuo Suzuki, Yoshimasa Ogawa, Yasuhito Eto
  • Publication number: 20030182813
    Abstract: To provide a template holder in which parts such as screws for mounting a template to a template mounting member is not lost. A template holder, in which in a state in which an elastic strut 94 is inserted into a holding hole 81 of a template 80, the template 80 is pressed and is caused to abut upon an end surface 91b of a base member 91a by the elastic strut 94 by operating a pressing strut 95, whereby while the template 80 is mounted to a holding member 91, the holding member 91 is departed from the template 80 by operating the pressing strut 95 to thereby enable the template 80 to be removed from the elastic strut 94 and the holdig member 91, wherein the pressing strut 95 and the elastic strut 94 are held by the holding member 91 when the template 80 is attached and detached.
    Type: Application
    Filed: April 23, 2003
    Publication date: October 2, 2003
    Applicant: Kabushiki Kaisha TOPCON
    Inventors: Yasuo Suzuki, Yoshimasa Ogawa
  • Patent number: 6625893
    Abstract: To provide a template holder in which parts such as screws for mounting a template to a template mounting member is not lost. A template holder, in which in a state in which an elastic strut 94 is inserted into a holding hole 81 of a template 80, the template 80 is pressed and is caused to abut upon an end surface 91b of a base member 91a by the elastic strut 94 by operating a pressing strut 95, whereby while the template 80 is mounted to a holding member 91, the holding member 91 is departed from the template 80 by operating the pressing strut 95 to thereby enable the template 80 to be removed from the elastic strut 94 and the holding member 91, wherein the pressing strut 95 and the elastic strut 94 are held by the holding member 91 when the template 80 is attached and detached.
    Type: Grant
    Filed: September 14, 2001
    Date of Patent: September 30, 2003
    Assignee: Kabushiki Kaisha Topcon
    Inventors: Yasuo Suzuki, Yoshimasa Ogawa
  • Publication number: 20030105612
    Abstract: An apparatus for measuring a shape of lens frames capable of measuring precisely the shape of lens frames by changing a rotational speed or rotational direction of a measuring element (feeler) 216 in accordance with the shape of lens frames. The measuring element 216 contacts with V-shaped grooves (grooves for lens frames) 51 provided in lens frames LF and RF of an eyeglass frame MF. An arithmetic control circuit 270 controls variably the rotational speed or rotational direction of the measuring element 216.
    Type: Application
    Filed: December 3, 2002
    Publication date: June 5, 2003
    Applicant: Kabushiki Kaisha TOPCON
    Inventors: Yasuo Suzuki, Yoshimasa Ogawa