Patents by Inventor Yoshimitsu Hiro
Yoshimitsu Hiro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10628619Abstract: The present invention enables easy generation of analysis mesh data from larger CAD data including complicated partial shapes without performing shape division of CAD data. An analysis mesh data generating device comprises: a storage device configured to store CAD data, model CAD data, and model mesh data associated with the model CAD data; and a control device. The control device searches for model CAD data similar to a partial shape in the CAD data from the model CAD data stored in the storage device, obtains model mesh data associated with the retrieved model CAD data from the storage device, calculates an application position of the model mesh data at analysis mesh data generated from the CAD data, deletes mesh data relate with the partial shape in the analysis mesh data, and combines the model mesh data at the calculated application position.Type: GrantFiled: December 16, 2013Date of Patent: April 21, 2020Assignee: HITACHI, LTD.Inventors: Masaki Shintani, Makoto Onodera, Chikara Kongou, Yoshimitsu Hiro
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Publication number: 20160364908Abstract: An analysis model creation assistance device comprises a mesh data registration unit for registering a mesh data which has been already divided into meshes for a simulation in a mesh database, a CAD data registration unit for registering a CAD data corresponding to the mesh data in a CAD database, and a usable mode extractor for registering a mesh data corresponding to a data on mesh members excluding a mesh member of a largest size in a usable model database as a usable mesh.Type: ApplicationFiled: June 10, 2016Publication date: December 15, 2016Inventors: Makoto ONODERA, Masayuki HARIYA, Yoshimitsu HIRO, Chikara KONGO, Masaki SHINTANI, Tomoaki UTSUNOMIYA, Hisayuki EGUCHI, Mamoru TSUKAMOTO
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Publication number: 20160358377Abstract: An analytical mesh generation device includes a shape model input unit for inputting a shape model of an analytical subject, a mesh size input unit for inputting a size of a hexahedral mesh to be generated, a mesh generation region. extraction unit for extracting a mesh. generation region for generating the hexahedral mesh. from the shape model using the mesh size, and a hexahedral mesh generation unit for generating the hexahedral mesh for the extracted mesh generation region.Type: ApplicationFiled: June 7, 2016Publication date: December 8, 2016Inventors: Masayuki HARIYA, Makoto ONODERA, Yoshimitsu HIRO, Chikara KONGOU, Masaki SHINTANI, Tomoaki UTSUNOMIYA, Mamoru TSUKAMOTO, Hisayuki EGUCHI
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Publication number: 20160283616Abstract: The present invention enables easy generation of analysis mesh data from larger CAD data including complicated partial shapes without performing shape division of CAD data. An analysis mesh data generating device comprises: a storage device configured to store CAD data, model CAD data, and model mesh data associated with the model CAD data; and a control device. The control device searches for model CAD data similar to a partial shape in the CAD data from the model CAD data stored in the storage device, obtains model mesh data associated with the retrieved model CAD data from the storage device, calculates an application position of the model mesh data at analysis mesh data generated from the CAD data, deletes mesh data relate with the partial shape in the analysis mesh data, and combines the model mesh data at the calculated application position.Type: ApplicationFiled: December 16, 2013Publication date: September 29, 2016Applicant: HITACHI, LTD.Inventors: Masaki SHINTANI, Makoto ONODERA, Chikara KONGOU, Yoshimitsu HIRO
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Patent number: 8612183Abstract: An analysis model generation system, for generating an analysis model of an analysis target, by correcting a distortion configuration owned by a configuration mesh data, which is generated by changing configuration of the analysis target, being made up with hexahedrons, into meshes, comprises a mesh data read-in portion 110 for reading the configuration mesh data therein, a mesh quality estimate portion 111 for estimating quality of a mesh of the configuration mesh data, a first database 101 for classifying distortion configuration of the mesh into a pattern, so as to register it therein as a distorted mesh pattern, in advance, a mesh pattern determination portion 112 for determining, on which one of the distorted mesh patterns a distortion corresponds, when the mesh has the distortion as a result of the quality estimation within the mesh quality estimation portion, a second database 115 for registering therein correction methods for correcting the distortion, corresponding to the distorted mesh pattern regisType: GrantFiled: October 29, 2008Date of Patent: December 17, 2013Assignee: Hitachi, Ltd.Inventors: Ichiro Kataoka, Ichiro Nishigaki, Yoshimitsu Hiro
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Patent number: 8405655Abstract: A system is provided for creating a modified analytical model from an existing analytical model and CAD data (geometric model data) of the modified model to reduce the workload in creating geometric and analytical models. The system includes means for reading a geometric model and an analytical model which are to be modified; means for storing correlation data showing relations between geometric elements of the object geometric model and nodes of the object analytical model; means for modifying the object analytical model to create a modified analytical model; and means for extracting geometric elements of the object geometric model which do not include the nodes in the modified object analytical model related to the object geometric model's geometric elements extracted from the correlation data and performing geometric fitting so as to fit the extracted geometric elements to the nodes to create a modified object geometric model from the modified analytical model.Type: GrantFiled: February 20, 2009Date of Patent: March 26, 2013Assignee: Hitachi, Ltd.Inventors: Makoto Onodera, Yoshimitsu Hiro, Ichiro Nishigaki
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Patent number: 8330757Abstract: It is possible to automatically correct a six-plane body mesh pattern so as to satisfy the required quality. A device for generating a mesh pattern for analysis comprises: surface mesh generating device for generating a surface mesh pattern of an analysis object by acquiring shape model data on the analysis object and mesh control data including required quality of an analysis mesh model; internal mesh generating device for generating an internal mesh pattern of the analysis object according to the generated surface mesh pattern; device for calculating the element quality of surface meshes; quality evaluating device for evaluating calculated element quality according to the required quality; and mesh correction device for shifting a surface mesh node point not satisfying the required quality in the direction to improve the quality.Type: GrantFiled: October 23, 2007Date of Patent: December 11, 2012Assignee: Hitachi, Ltd.Inventors: Ichiro Kataoka, Ichiro Nishigaki, Yoshimitsu Hiro, Masayuki Hariya
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Patent number: 8117015Abstract: An analytical model creation system can create a desired analytical model by adding a given shape change to an existing analytical model. The system includes an adjacent partial analytical model interlocking section for performing an interlocking change process. The interlocking change process is performed on the existing analytical model as a combined analytical model comprising a plurality of partial analytical models. The process assumes any one of the partial analytical models in the combined analytical model to be a change-targeted partial analytical model. The process allows a partial analytical model adjacent to the change-targeted partial analytical model to reflect a shape change given to the change-targeted partial analytical model. The process thereby makes a shape change to the adjacent partial analytical model in interlock with the shape change.Type: GrantFiled: August 22, 2007Date of Patent: February 14, 2012Assignee: Hitachi, Ltd.Inventors: Makoto Onodera, Yoshimitsu Hiro
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Publication number: 20100138195Abstract: The conventional technologies are impractical for the following reason. CAD has been the only solution for changing an analysis model with adding or deleting a fillet. In this case, it is necessary to repeat the mesh generation and condition configuration, which makes the work time longer especially for large-scale or complicated shape data. The present invention, accomplished to solve the above-mentioned problem, provides an analysis mesh generation apparatus including a computer for generating a mesh model. The apparatus is configured to create a screen for selecting an edge of a mesh model and entering a radius of a fillet to be applied to the selected edge; and to create a screen for generating a mesh for the applied fillet, generating a new mesh model by deleting or adding an area enclosed by a contour of the mesh model and the fillet, and displaying the new mesh model.Type: ApplicationFiled: November 18, 2009Publication date: June 3, 2010Inventors: Makoto Onodera, Yoshimitsu Hiro, Ichiro Nishigaki
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Publication number: 20090262110Abstract: A system is provided for creating a modified analytical model from an existing analytical model and CAD data (geometric model data) of the modified model to reduce the workload in creating geometric and analytical models. The system includes means for reading a geometric model and an analytical model which are to be modified; means for storing correlation data showing relations between geometric elements of the object geometric model and nodes of the object analytical model; means for modifying the object analytical model to create a modified analytical model; and means for extracting geometric elements of the object geometric model which do not include the nodes in the modified object analytical model related to the object geometric model's geometric elements extracted from the correlation data and performing geometric fitting so as to fit the extracted geometric elements to the nodes to create a modified object geometric model from the modified analytical model.Type: ApplicationFiled: February 20, 2009Publication date: October 22, 2009Inventors: Makoto Onodera, Yoshimitsu Hiro, Ichiro Nishigaki
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Publication number: 20090112529Abstract: An analysis model generation system, for generating an analysis model of an analysis target, by correcting a distortion configuration owned by a configuration mesh data, which is generated by changing configuration of the analysis target, being made up with hexahedrons, into meshes, comprises a mesh data read-in portion 110 for reading the configuration mesh data therein, a mesh quality estimate portion 111 for estimating quality of a mesh of the configuration mesh data, a first database 101 for classifying distortion configuration of the mesh into a pattern, so as to register it therein as a distorted mesh pattern, in advance, a mesh pattern determination portion 112 for determining, on which one of the distorted mesh patterns a distortion corresponds, when the mesh has the distortion as a result of the quality estimation within the mesh quality estimation portion, a second database 115 for registering therein correction methods for correcting the distortion, corresponding to the distorted mesh pattern regisType: ApplicationFiled: October 29, 2008Publication date: April 30, 2009Inventors: Ichiro KATAOKA, Ichiro Nishigaki, Yoshimitsu Hiro
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Publication number: 20080303817Abstract: An analyzing mesh generating apparatus has a model read unit for reading data, a required quality and shape data of an input hexahedral mesh model, a display unit for displaying said hexahedral mesh model, and a mesh element number reduction unit for reducing the number of mesh elements in the data. The analyzing mesh generating apparatus has also a mesh quality evaluation unit for evaluating a mesh quality regarding whether mesh element reduction is performed while maintaining the required quality data, and a mesh fine division unit for performing mesh fine division to change meshes to coarse/dense meshes, relative to the hexahedral mesh model with the reduced number of mesh elements in the data.Type: ApplicationFiled: June 10, 2008Publication date: December 11, 2008Inventors: Ichiro Kataoka, Ichiro Nishigaki, Yoshimitsu Hiro
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Patent number: 7395190Abstract: The present invention provides an analytical model preparing apparatus which reduces the user's labor of template selecting operation by selecting and presenting an appropriate template from among a plurality of already prepared templates.Type: GrantFiled: February 12, 2002Date of Patent: July 1, 2008Assignee: Hitachi, Ltd.Inventors: Masayuki Hariya, Yoshimitsu Hiro, Yoshiyuki Yamamoto, Hiromitsu Tokisue
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Patent number: 7376540Abstract: An analytical shell-model producing apparatus for converting a three-dimensional model into internal surfaces, wherein an internal surface is used to represent each three-dimensional element of the three-dimensional model. Each internal surface comprises a bounded plane and an associated width attribute, wherein the bounded plane is located internal to the three-dimensional element which it represents, and wherein the associated width attribute represents the width of the three-dimensional element in a direction normal to the bounded plane.Type: GrantFiled: July 28, 2003Date of Patent: May 20, 2008Assignee: Hitachi, Ltd.Inventors: Makoto Onodera, Yoshimitsu Hiro
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Publication number: 20080106547Abstract: It is possible to automatically correct a six-plane body mesh pattern so as to satisfy the required quality. A device for generating a mesh pattern for analysis comprises: surface mesh generating device for generating a surface mesh pattern of an analysis object by acquiring shape model data on the analysis object and mesh control data including required quality of an analysis mesh model; internal mesh generating device for generating an internal mesh pattern of the analysis object according to the generated surface mash pattern; device for calculating the element quality of surface meshes; quality evaluating device for evaluating calculated element quality according to the required quality; and mesh correction device for shifting a surface mesh node point not satisfying the required quality in the direction to improve the quality.Type: ApplicationFiled: October 23, 2007Publication date: May 8, 2008Inventors: Ichiro Kataoka, Ichiro Nishigaki, Yoshimitsu Hiro, Masayuki Hariya
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Patent number: 7363197Abstract: An analytical shell model forming apparatus includes a medial surface forming unit for approximating a solid model to a plurality of shell models. An extracting unit compares a plurality of formed medial surface models and extracts difference portions. A model candidate forming unit forms a plurality of medial surface model candidates suitable for analysis by combining the extracted difference portions. A select unit selects a medial surface model matching boundary conditions, constraint conditions and the like from the plurality of model candidates. The selected medial surface model is presented to an operator as an analysis medial surface model.Type: GrantFiled: July 29, 2004Date of Patent: April 22, 2008Assignee: Hitachi, Ltd.Inventors: Makoto Onodera, Yoshimitsu Hiro
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Patent number: 7304642Abstract: An analysis model producing/assisting apparatus produces a recognition model, approximating surfaces of configuration and ridgelines thereof by planes and lines, from a configuration model showing the configuration. Thereafter, it produces a mapping model through dividing the recognition model into cubic grids, and then produces an analysis model, through mapping grid points of the mapping model onto the configuration model. When producing the recognition model, know-how for producing the analysis model, which gives an influence upon quality of the meshes of the analysis model, is take out from a database, and that know-how for producing the analysis model is applied onto the configuration model.Type: GrantFiled: December 20, 2004Date of Patent: December 4, 2007Assignee: Hitachi, Ltd.Inventors: Ichiro Kataoka, Masayuki Hariya, Makoto Onodera, Yoshimitsu Hiro
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Publication number: 20050228804Abstract: An analysis model producing/assisting apparatus produces a recognition model, approximating surfaces of configuration and ridgelines thereof by planes and lines, from a configuration model showing the configuration. Thereafter, it produces a mapping model through dividing the recognition model into cubic grids, and then produces an analysis model, through mapping grid points of the mapping model onto the configuration model. When producing the recognition model, know-how for producing the analysis model, which gives an influence upon quality of the meshes of the analysis model, is take out from a database, and that know-how for producing the analysis model is applied onto the configuration model.Type: ApplicationFiled: December 20, 2004Publication date: October 13, 2005Inventors: Ichiro Kataoka, Masayuki Hariya, Makoto Onodera, Yoshimitsu Hiro
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Publication number: 20050197822Abstract: An analysis model producing apparatus uses CAD data and part-unit analyzing mesh data therein. The CAD data has parts CAD data for each of parts of an assembly and disposed position data for each part, and in addition thereto, a modeling kind on a connect-portion between the parts and connect-portion modeling data for presenting a modeling method. Mesh data for the assembly is obtained upon basis of the part-unit analyzing mesh data and the disposed position data. And, an analysis model data 111 for the assembly is obtained through modeling the connect-portion between the parts, by applying the connect-portion modeling data within the CAD data thereupon.Type: ApplicationFiled: November 30, 2004Publication date: September 8, 2005Inventors: Makoto Onodera, Masayuki Hariya, Yoshimitsu Hiro
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Publication number: 20050073519Abstract: An analytical shell model forming apparatus includes a medial surface forming unit for approximating a solid model to a plurality of shell models. An extracting unit compares a plurality of formed medial surface models and extracts difference portions. A model candidate forming unit forms a plurality of medial surface model candidates suitable for analysis by combining the extracted difference portions. A select unit selects a medial surface model matching boundary conditions, constraint conditions and the like from the plurality of model candidates. The selected medial surface model is presented to an operator as an analysis medial surface model.Type: ApplicationFiled: July 29, 2004Publication date: April 7, 2005Inventors: Makoto Onodera, Yoshimitsu Hiro