Abstract: The present invention relates to a process for classifying the panel MURA in the module inspection of a liquid crystal display panel. The invention includes a MURA area logical operation process (S5) of photographing the liquid crystal display panel from different angles of visibility, performing an image processing for detecting a MURA area for a group of images taken and then performing an image logical operation process, an upper-level classification process (S6) of classifying the shape of MURA, and a lower-level classification process of classifying the panel MURA by combining an upper-level classification with other parameters. With this invention, the panel MURA is correctly detected without setting up the complicate parameters. This invention contributes to labor saving at the final inspection step for manufacturing and leads to quality assurance and higher reliability of the liquid crystal display panel in the liquid crystal display panel manufacturing field.