Abstract: A vehicle A.C. generator has a rotor. The rotor has a pair of pole cores and magnet holders. Each pole core has a plurality of claw-like magnet poles. Each magnet holder contains a permanent magnet and placed between the adjacent claw-like magnet poles in order to prevent leakage flux. The rotor has a pair of supporting members in order to stop each magnet holder shifting in the direction of a rotary shaft of the rotor. Each supporting member has projecting parts which correspond to the magnet holders. The supporting members are fixed to one end surface of the pole cores, respectively. Each projecting part fixes the position of the corresponding permanent magnet in the rotor.

Abstract: Keyboard apparatus includes: a key supported for pivoting movement about a pivot point; a mass member for imparting a reaction force to performance operation of the key in interlocked relation to the key; a transmission member provided in abutment with both of the key and mass member to transmit a load from one of the key and mass member to the other; and an electromagnetic actuator for driving, via a fixed coil, the transmission member toward at least one of the key and mass member. Good key touch feeling can be achieved not only by a load applied from the mass member to the key but also through load control by the actuator. Thus, it is possible to faithfully reproduce a key touch feeling approximate to that in a natural keyboard instrument, such as an acoustic piano, with a simple construction and facilitated control.

Abstract: In a keyboard apparatus including a key supported for pivoting movement about a pivot point, a mass member that imparts a reaction force to performance operation of the key in interlocked relation to the key, and an electromagnetic actuator provided between the key and the mass member for imparting a driving force to the key and mass member, a transmission member is provided in detachable abutment with the key and mass member. The transmission member can be disengaged from the key or the mass member depending on operating conditions of the key and the mass member. Thus, it is possible to not only prevent unnecessary binding forces from acting in areas where the transmission member and the key and the mass member abut against each other, but also achieve smooth movement of the key and the mass member and prevent increase of inertial mass of the transmission member. The smooth movement of the key and mass member can achieve force sense control with good responsiveness.

Abstract: A feature analysis apparatus which enables visual confirmation of features of an inspected object and which enables limitations on the degree of freedom of classification based on the features to made relatively smaller is provided. It acquires inspected object information of an inspected object (S1), analyzes the inspection information to determine values of feature parameters of each of the plurality of layers (S2 to S5), uses values of the plurality of feature parameters and their corresponding directions for each of the plurality of layers to generate a single parameter vector (S2 to S5), converts the parameter vector to a layer vector which is a 3D vector in a predetermined (S2 to S5), and couples the plurality of layer vectors obtained for the plurality of layers in the order of the layers and generates a set of coordinate values of the plurality of nodes obtained in the 3D space as feature information of the inspected object (S6).

Abstract: A substrate surface inspection apparatus and method enabling judgment and analysis of the state of even portions of a substrate supported by supports using a captured image are provided. A support mechanism 20 is used where positions of arrangement of substrate support positions along the direction perpendicular to a scan direction by a plurality of first supports 23a to 23d are set outside the image capturing ranges of the substrate 10 by the imaging units 30a, 30b at the first relative position and inside the common image capturing range and where positions of arrangement of substrate support positions along the direction perpendicular to the scan direction by the plurality of second supports 24a to 24d are set outside the image capturing ranges of the substrate by the imaging units at the second relative position and inside the common image capturing range.

Abstract: A multi-beam scanning device is disclosed that is able to realize a stable and small beam spot and realize stable scanning line intervals between plural light beams. The multi-beam optical scanning device includes a first optical system which has a first lens for coupling the light beams from the light sources, and a second lens which is an anamorphic element having power at least in a sub scanning direction and for guiding the light beams from the first lens to the deflection unit; and a second optical system. At least the second lens includes a diffracting surface having power.

Abstract: An optical scanning device includes a light source, a deflector that deflects a light beam from the light source, a first optical system that guides the light beam to the deflector, a second optical system that guides the light beam from the deflector to a surface to be scanned, and a housing that holds the light source and the deflector. At least one optical element included in the first optical system or the second optical system is attached to the housing via an intermediate member. The optical element is adjustable with respect to the intermediate member. The number of directions in which the optical element can be adjusted is two or more.

Abstract: An inspection apparatus of a disk-shaped substrate able to precisely quantitatively inspect positions of formation of film layers formed on the surface of a disk-shaped substrate is provided, that is, an inspection apparatus of a disk-shaped substrate on which film layers are formed designed to generate captured image data expressing a captured image corresponding to a field of view based on image signals successively output from an image capturing unit capturing an image of a predetermined surface at an outer circumference part of the disk-shaped substrate and to generate film layer edge position information Y4E24 (?) expressing longitudinal direction positions at corresponding positions (?) along the circumferential direction of an edge line E24 of a film layer image part ISa (24) corresponding to the film layer 24 on the surface image ISa with reference to, from the captured image data, longitudinal direction positions YE15aL (?) at the different positions (?) along the circumferential direction of a bound

Abstract: A method of inspection and inspection apparatus able to use a captured image to more precisely inspect the state of film, defect parts, etc. at a surface of an object under inspection are provided. A method of inspection and inspection apparatus illuminating a surface of an object under inspection 10 by white light from an illumination unit LO while scanning the surface of the object under inspection 10 by an image capturing unit 100 to acquire a captured image and using the captured image to inspect a state of the surface of the object under inspection 10, which changes a state of polarization of light LR striking the image capturing unit 100 from an illuminated location of the object under inspection 10 and obtains a plurality of captured images based on light of different polarization states LR striking the image capturing unit 100.

Abstract: In an optical scanning apparatus, when it is assumed that a scanning direction of light beams defected from a deflector is a main scanning direction, and a direction orthogonal to the main scanning direction and to optical axes of both a first and a second optical systems is a sub scanning direction, a distance between the outermost light emitting elements of a light source in the main scanning direction is longer than that in the sub scanning direction.

Abstract: A light source unit is provided, which includes a light source with a plurality of light emission portions two-dimensionally arranged; a substrate on which the light source is mounted; a first support portion supporting the substrate; a bias member biasing the substrate towards the first support portion; a coupling element coupling a light beam emitted from the light source; a second support portion supporting the coupling element; a holding member holding a position of the substrate relative to the first support portion, a fitting portion provided in each of the first and second support portions to rotatably fit the first and second support portions into each other around an optical axis of the light source; and a fastening member integrally fastening the first and second support portions.

Abstract: Three valve assemblies are linked with finger buttons and inserted into a pipe structure of a trumpet for changing the length of air column, and a supporting system assists a player in fingering on the finger buttons; sensors are adhered to the finger buttons so as to supply a detecting signal representative of force exerted on the finger buttons by the player to a controlling unit; when the force exceeds over a threshold, the controlling unit energizes actuators connected to the valve assemblies so as to make the player feel the valve assemblies lightly changed.

Abstract: A surface-emitting laser array includes a plurality of light emitting parts arranged in a two-dimensional formation having two orthogonal directions. When the plurality of light emitting parts are orthogonally projected on a virtual line parallel to one of the two orthogonal directions, a spacing between two of the plurality of light emitting parts along the virtual line is equal to an integral multiple of a predetermined value. The plurality of light emitting parts include a first light emitting part, a second light emitting part adjacent to the first light emitting part, and a third light emitting part adjacent to the second light emitting part, and a spacing between the first and second light emitting parts differs from a spacing between the second and third light emitting parts.

Abstract: In an optical scanning device including a vertical cavity surface emitting laser (VCSEL), an optical scanning device controls so as to satisfy P1<P100 and Wm>Ws, where P1 is light intensity obtained when a period of time corresponding to a minimum pixel unit (referred to as “T1”) has elapsed after start of illumination; P100 is light intensity obtained when a period of time 100 T1 has elapsed after the start of illumination; Wm is the static beam spot diameter in the main-scanning direction; and Ws is the static beam spot diameter in the sub-scanning direction.

Abstract: An optical scanning device includes a deflecting unit, a first sensor, and a modulating system. The deflecting unit deflects a plurality of beams in a main scanning direction to a writing area of a surface to be scanned for scanning the writing area. The first sensor detects a beam to be incident on a point on a first side of the writing area, and outputs a signal in response to detected beam. The modulating system modulates the beams in synchronization with the signal output from the first sensor.

Abstract: An optical scan apparatus which deflects a plurality of light beams to scan a write region on a scan surface in a main scan direction is configured to include a light source which has a plurality of emission portions emitting the plurality of light beams arranged two-dimensionally on a plane in parallel to the main scan direction and a sub scan direction perpendicular to the main scan direction; a deflector which deflects the plurality of light beams from the plurality of emission portions; a light receiving element which receives the light beams and outputs a synchronous detection signal in accordance with the received light beams; and a control unit which selectively controls any one of the emission portions to emit a light beam upon each scanning and allows the light beam from the selected emission portion to be incident on the light receiving element via the deflector.

Abstract: [Problem] An inspecting device and an inspecting method enabling better precision inspection for a processing region formed on a surface of a semiconductor wafer or other disc wafer are provided.

Abstract: There is provided an image analysis system which captures image data of an arbitrary pair of a first image RI and a second image LI among images obtained by color-photographing a single object from different positions into an analysis computer, wherein the computer includes corresponding point extraction means for assigning a weighing factor to a pixel information value based on the contrast size of the pixel information value in each of a first local area ROI1 set around an arbitrary reference point in RI and second local areas ROI2s at which scanning is performed on LI, calculating the similarity between ROI1 and ROI2s, and extracting a corresponding point which corresponds to the reference point from a ROI2 having the highest similarity, and depth information calculating means for calculating depth information of the object based on coordinates of the reference point and the corresponding point.

Abstract: A line-imaging lens condenses a light beam from a light-source unit in one direction to form a line image. An optical deflecting unit deflects the light beam passing through the line-imaging lens. An imaging optical unit images the light beam deflected by the optical deflecting unit in a spot shape on a scanning surface to be scanned. An adjusting unit adjusts a position of irradiation of the light beam from the light-source unit on the optical deflecting unit.

Abstract: A rotor for an electric rotary machine and a method of manufacturing the same are disclosed wherein none of permanent magnets is fixed to a magnetic supporting segment of a magnet support ring in advance and each permanent magnet is assembled separately of the magnet support ring. Prior to the assembling of the permanent magnets, the magnet support ring is preliminarily located on claw-shaped magnetic poles at inner peripheral sides thereof under a state combined with a pair of field iron cores, after which the permanent magnets are inserted to magnet insertion spaces in longitudinal directions. The rotor includes positioning and restricting means for precluding the occurrence of positional displacement of each permanent magnet with respect to each magnet supporting segment of the magnet support ring.