Abstract: An inspection apparatus including an image generation device which generates a second image corresponding to a first image, and a defect detection device which detects a defect in the second image. Each of the first and second image includes partial regions each including pixels. The defect detection device is configured to estimate a first value indicating a position difference between the first and second image for each of the partial regions, based on a luminance difference between the first and second image, estimate a second value indicating a reliability of the first value for each of the partial regions, and estimate a position difference between the first and second image for each of the pixels, based on the first and second value estimated for each of the partial regions.

Abstract: According to one embodiment, an inspection apparatus includes an image generation device which generates a second image corresponding to a first image and a defect detection device which detects a defect in the second image with respect to the first image. The defect detection device is configured to extract a first partial region in which an amount of change of a luminance of the first image and an amount of change of a luminance of the second image have a correlation, and correct, in the first partial region, the luminance of the first image with respect to the luminance of the second image.

Abstract: According to one embodiment, an inspection apparatus includes an image generation device which generates a second image corresponding to a first image and a defect detection device which detects a defect in the second image with respect to the first image. The defect detection device is configured to extract a first partial region in which an amount of change of a luminance of the first image and an amount of change of a luminance of the second image have a correlation, and correct, in the first partial region, the luminance of the first image with respect to the luminance of the second image.

Abstract: An inspection apparatus including an image generation device which generates a second image corresponding to a first image, and a defect detection device which detects a defect in the second image. Each of the first and second image includes partial regions each including pixels. The defect detection device is configured to estimate a first value indicating a position difference between the first and second image for each of the partial regions, based on a luminance difference between the first and second image, estimate a second value indicating a reliability of the first value for each of the partial regions, and estimate a position difference between the first and second image for each of the pixels, based on the first and second value estimated for each of the partial regions.

Abstract: According to one embodiment, an inspection device includes: an image generation device configured to generate a second image corresponding to a first image; and a defect detection device configured to estimate a nonlinear shift based on a plurality of partial region sets, each of the partial region sets including a first partial region in the first image and a second partial region in the second image corresponding to the first partial region, and detect a defect in the second image from the first image.

Abstract: According to one embodiment, an optical test apparatus includes a photodetector and a processing circuit. The photodetector outputs, as a light receiving signal, information concerning a light direction of received light. The processing circuit processes the light receiving signal to acquire information concerning a standard light direction as a standard and information concerning a passing light direction of passed light which has passed through an object; compares the information concerning the passing light direction with the information concerning the standard light direction, and on the basis of results of the comparison, acquires information concerning internal physical quantities of the object.

Abstract: According to one embodiment, an inspection device includes: an image generation device configured to generate a second image corresponding to a first image; and a defect detection device configured to estimate a nonlinear shift based on a plurality of partial region sets, each of the partial region sets including a first partial region in the first image and a second partial region in the second image corresponding to the first partial region, and detect a defect in the second image from the first image.

Abstract: According to one embodiment, an optical test apparatus includes a photodetector and a processing circuit. The photodetector outputs, as a light receiving signal, information concerning a light direction of received light. The processing circuit processes the light receiving signal to acquire information concerning a standard light direction as a standard and information concerning a passing light direction of passed light which has passed through an object; compares the information concerning the passing light direction with the information concerning the standard light direction, and on the basis of results of the comparison, acquires information concerning internal physical quantities of the object.

Abstract: An LED lighting device of embodiment comprising an LED light source which generates an ultraviolet light or a visible light, an axisymmetric transparent member which is provided over the light source and which is transparent to visible light, and an axisymmetric light scattering member disposed in the transparent member apart from the light source. A distance of closest approach L2 between the light source and the light scattering member, and an area C of a light emitting surface of the light source satisfy the settled relation. A length L1 of the light scattering member, and an absorption coefficient ? (1/mm) of the light scattering member satisfy the settled relation. A diameter d1 of the bottom surface of the light scattering member, the distance of closest approach L2, and a refractive index n of the transparent member satisfy the settled relation.

Abstract: According to one embodiment, an image sensor includes an image-sensing element region formed by arranging a plurality of image-sensing elements on a semiconductor substrate, and a logic circuit region formed in a region different from the image-sensing element region on the substrate and including a plurality of gate patterns. Further, dummy gate patterns are formed with a constant pitch on the image-sensing element region.

Abstract: According to one embodiment, a microwave annealing apparatus is provided, including a housing shielding electromagnetic waves, a first electromagnetic wave source configured to apply a first electromagnetic wave into the housing, a second electromagnetic wave source configured to apply, into the housing, a second electromagnetic wave having a higher frequency than the first electromagnetic wave, a susceptor configured to hold a semiconductor substrate, made of a material transparent to the first electromagnetic wave and provided in the housing, a temperature measuring device configured to measure the temperature of the semiconductor substrate, and a control unit configured to control the power of each of the first and second electromagnetic wave sources in accordance with the temperature measured by the temperature measuring device.

Abstract: According to one embodiment, an image sensor includes an image-sensing element region formed by arranging a plurality of image-sensing elements on a semiconductor substrate and element isolation portions formed to isolate the image-sensing elements, and a logic circuit region formed in a region different from the image-sensing element region on the substrate and including a plurality of gate patterns. Further, dummy element isolation portions are arranged with a constant pitch in the boundary region between the image-sensing element region and the logic circuit region.

Abstract: According to one embodiment, an image sensor includes an image-sensing element region formed by arranging a plurality of image-sensing elements on a semiconductor substrate, and a logic circuit region formed in a region different from the image-sensing element region on the substrate and including a plurality of gate patterns. Further, dummy gate patterns are formed with a constant pitch on the image-sensing element region.

Abstract: An LED lighting device of embodiment comprising an LED light source which generates an ultraviolet light or a visible light, an axisymmetric transparent member which is provided over the light source and which is transparent to visible light, and an axisymmetric light scattering member disposed in the transparent member apart from the light source. A distance of closest approach L2 between the light source and the light scattering member, and an area C of a light emitting surface of the light source satisfy the settled relation. A length L1 of the light scattering member, and an absorption coefficient ? (1/mm) of the light scattering member satisfy the settled relation. A diameter d1 of the bottom surface of the light scattering member, the distance of closest approach L2, and a refractive index n of the transparent member satisfy the settled relation.

Abstract: According to one embodiment, an image sensor includes an image-sensing element region formed by arranging a plurality of image-sensing elements on a semiconductor substrate, and a logic circuit region formed in a region different from the image-sensing element region on the substrate and including a plurality of gate patterns. Further, dummy gate patterns are formed with a constant pitch on the image-sensing element region.

Abstract: According to one embodiment, a surface light source device includes a light guide plate, and first and second light-emitting units. The light guide plate includes a flat portion and a curved portion. The curved portion guides, to the flat portion, light introduced from the end surface and transmits light introduced from the inner circumferential surface. The flat portion includes a light diffusing portion to diffuse the light guided by the curved portion, and a light-emitting surface to output the light diffused by the light diffusing portion. The first light-emitting unit emits light toward the end surface. The second light-emitting unit emits light toward the inner circumferential surface.

Abstract: According to one embodiment, a microwave annealing apparatus is provided, including a housing shielding electromagnetic waves, a first electromagnetic wave source configured to apply a first electromagnetic wave into the housing, a second electromagnetic wave source configured to apply, into the housing, a second electromagnetic wave having a higher frequency than the first electromagnetic wave, a susceptor configured to hold a semiconductor substrate, made of a material transparent to the first electromagnetic wave and provided in the housing, a temperature measuring device configured to measure the temperature of the semiconductor substrate, and a control unit configured to control the power of each of the first and second electromagnetic wave sources in accordance with the temperature measured by the temperature measuring device.

Abstract: According to one embodiment, a light guide body includes a light guide plate and a prism array unit. The light guide plate has a major surface, a first side surface, and a second side surface on an opposite side to the first side surface. The prism array unit is provided on the major surface to be in contact with the major surface. The prism array unit includes a plurality of prism bodies. Each of the prism bodies extends along a first direction from the first side surface to the second side surface. The prism bodies are disposed to align along a second direction parallel to the major surface and perpendicular to the first direction. A vertex angle of the prism bodies is a substantially right angle. A refractive index of the prism bodies is higher than a refractive index of the light guide plate.

Abstract: According to one embodiment, illumination apparatus including, first light source module which includes light-emitting module that emits light, light-emitting module having line shape, and first reflection member which includes first reflection surface that reflects light emitted from light-emitting module of first light source module for predetermined range, wherein first reflection surface has cross section that has zigzag line shape including plurality of line segments running along standard oval, which has major axis that forms predetermined angle with direction perpendicular to predetermined range, in direction perpendicular to longitudinal direction of light-emitting module of first light source module.

Abstract: According to one embodiment, a substrate with an interference filter layer includes a plate-like first substrate and a filter layer. The filter layer includes optically semi-transparent first and second reflective layers and a light-transmitting layer, the light-transmitting layer being formed of first, second, and third spacer layers, the first, second, and third spacer layers being optically transparent, the light-transmitting layer including first, second, and third areas which include the first spacer layer in common, the first, second, and third areas having different optical film thicknesses due to the second and the third spacer layers, the first, second, and the third areas transmitting light with different wavelengths.