Patents by Inventor Yoshinori Ikebe

Yoshinori Ikebe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5278407
    Abstract: A secondary-ion mass spectrometry apparatus using a field limiting method includes an optical system for primary ions, a sample chamber, and an optical system for secondary ions, and a total ion monitor (TIM) interposed between an electric sector and a magnetic sector of the optical system for secondary ions. A field-limited image (or TIM image) from the TIM can be observed or monitored continually by a CRT, thereby making it possible to grasp quantitatively the charging state of a sample surface. The apparatus may further include an adjuster for adjusting quantatively the charging state of the sample surface.
    Type: Grant
    Filed: April 24, 1992
    Date of Patent: January 11, 1994
    Assignees: Hitachi, Ltd., Hitachi Instrument Engineering Co., Ltd.
    Inventors: Yoshinori Ikebe, Hifumi Tamura, Hiroyuki Sumiya, Akemi Furuki
  • Patent number: 4992661
    Abstract: A method of neutralizing an accumulated charge on a surface of a specimen which is examined in a scanning electron microscope (SEM) or a scanning ion microprobe mass analyzer (IMA), utilizes an electrically conductive thin film deposited on a part of the specimen surface. The charge is due to irradiation by a primary charged particle beam from the SEM or IMA. The thin film is made conductivity with a specimen mount mounting the specimen, and the irradiating range of the primary beam covers at least a part of the thin film. Thus, the accumulated charge can be neutralized, thereby a resolution of the SEM being improved due to applying higher accelerating voltage for the primary beam, and measured data of higher reliability being obtained in the IMA.
    Type: Grant
    Filed: August 17, 1988
    Date of Patent: February 12, 1991
    Assignees: Hitachi, Ltd., Hitachi Instrument Engineering Co., Ltd.
    Inventors: Hifumi Tamura, Yoshinori Ikebe, Katsuhiko Muroyama, Hiroyuki Sumiya
  • Patent number: 4833331
    Abstract: This invention relates to a method of holding an electrically insulating sample to be bombarded with a corpuscular beam. It is desired that the electrically insulating sample is not charged up when it is placed under the bombardment of the corpuscular beam. To achieve this problem to be solved, an electrically conductive metallic material is placed in a liquefied form on a support member, and the electrically insulating sample is buried in the metallic material except at least the portion that is to be bombarded with the corpuscular beam.
    Type: Grant
    Filed: October 23, 1987
    Date of Patent: May 23, 1989
    Assignee: Hitachi, Ltd.
    Inventors: Yoshinori Ikebe, Hifumi Tamura, Eiichi Izumi
  • Patent number: 4774433
    Abstract: A mixture of an alkali metal compound and its reducing agent is heated by a heating means, whereby alkali metal vapors are generated and stored in a vapor reserver. The thus stored vapors permeate through a porous member heated by another heating means and are ionized. The thus formed ions are withdrawn by an ion withdrawal means.
    Type: Grant
    Filed: April 9, 1987
    Date of Patent: September 27, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Yoshinori Ikebe, Hifumi Tamura, Hiroyasu Shichi, Eiichi Izumi