Patents by Inventor Yoshinori Numata

Yoshinori Numata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tactile presentation control apparatus, tactile presentation panel, tactile presentation touch panel, and tactile presentation touch display
    Patent number: 11972053
    Abstract: An object of the present disclosure is to provide a tactile presentation control apparatus that can provide an operation feeling of a dial knob that allows intuitive operation by a tactile sense of the user, and is user-friendly. A tactile presentation control apparatus according to the present disclosure that has a tactile presentation knob placed on an operation surface and presents a tactile sense to the user via the tactile presentation knob. The tactile presentation control apparatus includes a tactile control unit that performs control to present different tactile senses to each of a plurality of operation regions on the operation surface when the tactile presentation knob is rotationally operated. When the tactile presentation knob is present in one of the operation regions, the tactile control unit performs control to present, as the tactile sense, a frictional force generated in the tactile presentation knob to the operation region.
    Type: Grant
    Filed: December 26, 2019
    Date of Patent: April 30, 2024
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Tae Orita, Yoshinori Ueno, Mitsuru Sakai, Naoki Numata, Yuki Furumoto, Tsuyoshi Sempuku, Yuichi Sasaki
  • Defect inspecting apparatus
    Patent number: 7129727
    Abstract: A defect inspecting apparatus in which a plurality of probes to measure electric characteristics of a sample including a fine wiring pattern are combined with a charged-particle beam unit includes graphic user interfaces (GUI) to simply control the plural probes. The apparatus includes a probe image processing unit to display the plural probes on a display; a selecting unit to select, from the probes displayed on the display, a probe to be operated; and a display unit to simultaneously display the probe selecting unit and information indicating that the selected probe is an operable probe, or the probe is in a non-selected state.
    Type: Grant
    Filed: October 26, 2005
    Date of Patent: October 31, 2006
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tsutomu Saito, Osamu Yamada, Eiichi Hazaki, Yasuhiko Nara, Hirofumi Sato, Yoshikazu Inada, Yoshinori Numata
  • Defect inspecting apparatus
    Publication number: 20060087330
    Abstract: A defect inspecting apparatus in which a plurality of probes to measure electric characteristics of a sample including a fine wiring pattern are combined with a charged-particle beam unit includes graphic user interfaces (GUI) to simply control the plural probes. The apparatus includes a probe image processing unit to display the plural probes on a display; a selecting unit to select, from the probes displayed on the display, a probe to be operated; and a display unit to simultaneously display the probe selecting unit and information indicating that the selected probe is an operable probe, or the probe is in a non-selected state.
    Type: Application
    Filed: October 26, 2005
    Publication date: April 27, 2006
    Inventors: Tsutomu Saito, Osamu Yamada, Eiichi Hazaki, Yasuhiko Nara, Hirofumi Sato, Yoshikazu Inada, Yoshinori Numata