Abstract: In a method of testing an electrode structure in which a plurality of electrodes are arranged in a matrix, a test unit is positioned at a position of a target one of the plurality of electrodes apart from the target electrode by a preset distance. The test unit has a MISFET having a source, a gate and a drain. Then, a first voltage is applied to the target electrode such that a gate voltage is induced at the gate by electrostatic induction. Also, a second voltage is applied to at least one of the source and the drain such that current flows between the source and the drain based on the gate voltage. Then, a value of the current is examined to determine an electrical connection state of the target electrode.

Abstract: In a method of testing an electrode structure in which a plurality of electrodes are arranged in a matrix, a test unit is positioned at a position of a target one of the plurality of electrodes apart from the target electrode by a preset distance. The test unit has a MISFET having a source, a gate and a drain. Then, a first voltage is applied to the target electrode such that a gate voltage is induced at the gate by electrostatic induction. Also, a second voltage is applied to at least one of the source and the drain such that current flows between the source and the drain based on the gate voltage. Then, a value of the current is examined to determine an electrical connection state of the target electrode.

Abstract: A potential sensor, includes a field effect transistor, a power supply and a switching device. The power supply supplies a direct current voltage to a gate electrode of the field effect transistor. The switching device switches between connecting the gate electrode to the power supply and disconnecting the gate electrode from the power supply. When the gate electrode is connected to the power supply, the field effect transistor is in action. When the gate electrode is disconnected from the power supply, the field effect transistor is in action.

Abstract: A potential sensor, includes a field effect transistor, a power supply and a switching device. The power supply supplies a direct current voltage to a gate electrode of the field effect transistor. The switching device switches between connecting the gate electrode to the power supply and disconnecting the gate electrode from the power supply. When the gate electrode is connected to the power supply, the field effect transistor is in action. When the gate electrode is disconnected from the power supply, the field effect transistor is in action.

Abstract: In a method of testing an electrode structure in which a plurality of electrodes are arranged in a matrix, a test unit is positioned at a position of a target one of the plurality of electrodes apart from the target electrode by a preset distance. The test unit has a MISFET having a source, a gate and a drain. Then, a first voltage is applied to the target electrode such that a gate voltage is induced at the gate by electrostatic induction. Also, a second voltage is applied to at least one of the source and the drain such that current flows between the source and the drain based on the gate voltage. Then, a value of the current is examined to determine an electrical connection state of the target electrode.

Abstract: A glass cullet separation apparatus according to the present invention includes a hopper (1), a rotary feeder (6), an inclined guide plate (14), a conveying belt (17), and a foreign glass discrimination device (37). The discriminated device can radiate a laser beam onto a surface of a cullet passing over a slit of the conveying belt (17) for emission therefrom and for discriminating a "yes or no" foreign glass determination by analyzing a spectrum of the emission. Also, included is a color discrimination device (41), a foreign glass discrimination trigger sensor (33), a color discrimination trigger sensor (40), and air nozzles (44) for ejecting the cullet at each predetermined positions which correspond to the cullet of the foreign glass and the cullet of each color. A non-contact type photoelectric sensor (45) is provided for sensing the cullet passing the air nozzle (44).