Patents by Inventor Yoshio Kiyonari

Yoshio Kiyonari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8760264
    Abstract: An object of the present invention is to provide a sample processing system, wherein writing to each RFID is equalized to eliminate unevenness in the use of sample containers. The configuration of the present invention can be realized by controlling the numbers of times (write counts) data is written to RFIDs, and by skipping data writing according to frequencies in the use of sample containers. Setting use information (count) of each IC tag, and comparing the use information with an average value of the use of the IC tags, make it possible to limit the write counts, which enables the equalization of writing to the IC tags, thereby making it possible to uniform the use of the sample containers in the system.
    Type: Grant
    Filed: July 20, 2010
    Date of Patent: June 24, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kuniaki Onizawa, Yoshio Kiyonari, Shigemi Oba, Tatsuya Fukugaki
  • Patent number: 8545757
    Abstract: A sample treatment apparatus is designed to directly monitor a pressure signal from a pressure sensor to examine pressure fluctuations resulting from a sample's sway before a discharge of the sample, so that the discharge is performed after the confirmation of the absence of pressure changes. The apparatus has a detection function that allows a discharge to be started even before a pressure fluctuation vanishes completely, by allowing the operator to set a desired number of pressure monitorings, monitoring time, or pressure amplitude. The detection function also allows an alarm to be raised when a pressure fluctuation has not fallen within a given range. The sample treatment apparatus therefore allows discharge of more accurate amounts of samples.
    Type: Grant
    Filed: January 18, 2010
    Date of Patent: October 1, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yasushi Utsugi, Kuniaki Onizawa, Ken Takakura, Yoshio Kiyonari, Isao Yamazaki
  • Publication number: 20120133492
    Abstract: An object of the present invention is to provide a sample processing system, wherein writing to each RFID is equalized to eliminate unevenness in the use of sample containers. The configuration of the present invention can be realized by controlling the numbers of times (write counts) data is written to RFIDs, and by skipping data writing according to frequencies in the use of sample containers. Setting use information (count) of each IC tag, and comparing the use information with an average value of the use of the IC tags, make it possible to limit the write counts, which enables the equalization of writing to the IC tags, thereby making it possible to uniform the use of the sample containers in the system.
    Type: Application
    Filed: July 20, 2010
    Publication date: May 31, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kuniaki Onizawa, Yoshio Kiyonari, Shigemi Oba, Tatsuya Fukugaki
  • Publication number: 20120039771
    Abstract: A sample treatment apparatus is designed to directly monitor a pressure signal from a pressure sensor to examine pressure fluctuations resulting from a sample's sway before a discharge of the sample, so that the discharge is performed after the confirmation of the absence of pressure changes. The apparatus has a detection function that allows a discharge to be started even before a pressure fluctuation vanishes completely, by allowing the operator to set a desired number of pressure monitorings, monitoring time, or pressure amplitude. The detection function also allows an alarm to be raised when a pressure fluctuation has not fallen within a given range. The sample treatment apparatus therefore allows discharge of more accurate amounts of samples.
    Type: Application
    Filed: January 18, 2010
    Publication date: February 16, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yasushi Utsugi, Kuniaki Onizawa, Ken Takakura, Yoshio Kiyonari, Isao Yamazaki