Patents by Inventor Yoshiro ENOKIDA

Yoshiro ENOKIDA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SEMICONDUCTOR STRUCTURE FOR INSPECTION
    Publication number: 20240014081
    Abstract: A semiconductor structure for inspection includes a semiconductor plate having a first main surface on one side and a second main surface on the other side, an inspection region provided in the first main surface, a main surface electrode having a first hardness and covering the first main surface in the inspection region, and a protective electrode having a second hardness which exceeds the first hardness, covering the main surface electrode in the inspection region, and forming a current path between the second main surface and the protective electrode via the semiconductor plate.
    Type: Application
    Filed: September 26, 2023
    Publication date: January 11, 2024
    Applicant: ROHM CO., LTD.
    Inventors: Toshiro TAKAO, Katsuhisa NAGAO, Yoshiro ENOKIDA