Patents by Inventor Yoshitada Oshida

Yoshitada Oshida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8361784
    Abstract: A DNA inspecting apparatus including driving means for relatively changing positions of the multi-spot lights and a position of the DNA chip so as to detect the fluorescent lights in such a manner that a desired area on the DNA chip is irradiated with the multi-spot lights, and a control system for determining and inspecting DNA information about the to-be-inspected DNA chip from fluorescent light intensities and fluorescent light positions of the desired area on the DNA chip, the fluorescent light intensities and the fluorescent light positions being detected by the driving means and the fluorescent light detecting means.
    Type: Grant
    Filed: February 22, 2007
    Date of Patent: January 29, 2013
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitada Oshida, Toshihiko Nakata, Tomoaki Sakata, Kenji Yasuda, Satoshi Takahashi
  • Patent number: 8089614
    Abstract: A parallel glass which is a prism having a parallelogram-shaped cross section in an x-y direction, and parallel glasses which are prisms having a parallelogram-shaped cross section in the x-y direction and each include grooves formed in one surface in a z direction perpendicular to the x-y direction, are stacked in direct contact with each other such that the grooves are located on the inside, and light trying to enter the grooves is subjected is total reflection, thereby changing incident parallel beams with a pitch of 13 mm into emergent parallel beams with a pitch of 1 mm.
    Type: Grant
    Filed: May 30, 2007
    Date of Patent: January 3, 2012
    Assignee: Hitachi Via Mechanics, Ltd.
    Inventors: Yoshitada Oshida, Yoshitatsu Naito, Mituhiro Suzuki, Tsuyoshi Yamaguchi, Shigenobu Maruyama
  • Patent number: 7969636
    Abstract: A laser direct imaging apparatus which can expose photosensitive materials having various sensitivities and which can correct an imaging position in accordance with deformation of a workpiece. In the laser direct imaging apparatus, the workpiece is moved in a sub-scanning direction while a cylindrical lens is used to converge a laser beam, which has been modulated based on raster data, in the sub-scanning direction and deflect the laser beam toward a main scanning direction so as to image a desired pattern on the workpiece. The cylindrical axis of the cylindrical lens is designed to be able to rotate horizontally and to be able to change an angle with respect to the main scanning direction.
    Type: Grant
    Filed: August 14, 2008
    Date of Patent: June 28, 2011
    Assignee: Hitachi Via Mechanics, Ltd.
    Inventors: Yoshitatsu Naito, Yoshitada Oshida, Mitsuhiro Suzuki
  • Patent number: 7755741
    Abstract: An illumination apparatus and an exposure apparatus that achieves higher quality exposure to light and higher operating speed even where the ratio Hx/Hy between the transverse dimension Hx and the longitudinal dimension Hy of the plane of optical modulation of a two-dimensional optical space modulator is 1.5 or above, for instance, are to be provided. The focal distance fx in an x-direction and the focal distance fy in a y-direction of a second optical system that guides light emitted from an integrator to a two-dimensional optical space modulator are made different, in a ratio of fx/fy=1.6, for instance. In this way, the number of rod lenses in the integrator can be made equal between transverse and longitudinal directions and the value of Hx/Hy can be made 2.5 by bringing the aspect ratio dx:dy of rod lenses to 1.6:1, close to 1.
    Type: Grant
    Filed: August 16, 2007
    Date of Patent: July 13, 2010
    Assignee: Hitachi Via Mechanics, Ltd.
    Inventors: Yoshitada Oshida, Kazuo Kobayashi
  • Patent number: 7604925
    Abstract: A production method of a semiconductor device which includes the steps of exposing a resist coated on a substrate of a semiconductor device by projecting a light pattern on the substrate of the semiconductor device, developing the resist exposed by the light pattern to form a wafer pattern with the resist, and etching the substrate on which the wafer pattern with the resist is formed. In the step of exposing the light pattern is formed by illuminating a mask with excimer laser light having an annular shape.
    Type: Grant
    Filed: April 29, 2005
    Date of Patent: October 20, 2009
    Assignee: Renesas Technology Corporation
    Inventors: Minori Noguchi, Yukio Kenbo, Yoshitada Oshida, Masataka Shiba, Yasuhiro Yoshitaka, Makoto Murayama
  • Patent number: 7598020
    Abstract: A production method of a semiconductor device which includes the steps of exposing a resist coated on a substrate of a semiconductor device by projecting a light pattern on the substrate of the semiconductor device through an object lens, developing the resist exposed by the light pattern to form a wafer pattern with the resist, and etching the substrate on which the wafer pattern with the resist is formed. In the step of exposing, the light pattern projected on the substrate is formed by excimer laser light which is emitted from an annular shaped light source and which is passed through a mask having a phase shifter.
    Type: Grant
    Filed: April 29, 2005
    Date of Patent: October 6, 2009
    Assignee: Renesas Technology Corporation
    Inventors: Minori Noguchi, Yukio Kenbo, Yoshitada Oshida, Masataka Shiba, Yasuhiro Yoshitaka, Makoto Murayama
  • Publication number: 20090080047
    Abstract: A laser direct imaging apparatus which can expose photosensitive materials having various sensitivities and which can correct an imaging position in accordance with deformation of a workpiece. In the laser direct imaging apparatus, the workpiece is moved in a sub-scanning direction while a cylindrical lens is used to converge a laser beam, which has been modulated based on raster data, in the sub-scanning direction and deflect the laser beam toward a main scanning direction so as to image a desired pattern on the workpiece. The cylindrical axis of the cylindrical lens is designed to be able to rotate horizontally and to be able to change an angle with respect to the main scanning direction.
    Type: Application
    Filed: August 14, 2008
    Publication date: March 26, 2009
    Applicant: Hitachi Via Mechanics, Ltd.
    Inventors: Yoshitatsu NAITO, Yoshitada OSHIDA, Mitsuhiro SUZUKI
  • Publication number: 20080213705
    Abstract: A pattern exposure method and a pattern exposure apparatus in which the throughput is improved with an inexpensive apparatus and without a low running cost. Output faces of a plurality of laser beams emitted from a plurality of semiconductor lasers respectively are arranged in two directions. One of the directions is the same direction as the scanning direction of a polygon mirror while the other is a direction crossing the scanning direction of the polygon mirror. In this event, the array pitch of the output faces arranged in the direction crossing the scanning direction of the polygon mirror is made equal to resolution of an exposure pattern. In this event, the wavelength of each laser may be made not longer than 410 nm.
    Type: Application
    Filed: April 4, 2008
    Publication date: September 4, 2008
    Applicant: Hitachi Via Mechanics Ltd.
    Inventors: Yoshitada OSHIDA, Yoshitatsu Naito, Mituhiro Suzuki, Bunji Uchiyama, Tsuyoshi Yamaguchi
  • Patent number: 7400753
    Abstract: A fluorescent or luminescence image of at least part of a biological sample is imaged, then a transmission light image of at least part of the biological sample is imaged, and thereafter the fluorescent or luminescence image and the transmission light image are overlaid such that the identical area of the sample is coincided to display. The present invention allows detecting the accurate location of fluorescence or luminescence in a given part of the biological sample.
    Type: Grant
    Filed: July 3, 2001
    Date of Patent: July 15, 2008
    Assignee: Hitachi, Ltd.
    Inventors: Taisaku Seino, Satoshi Takahashi, Kenji Yasuda, Yoshitada Oshida
  • Patent number: 7372478
    Abstract: A pattern exposure method and a pattern exposure apparatus in which the throughput is improved with an inexpensive apparatus and without a low running cost. Output faces of a plurality of laser beams emitted from a plurality of semiconductor lasers respectively are arranged in two directions. One of the directions is the same direction as the scanning direction of a polygon mirror while the other is a direction crossing the scanning direction of the polygon mirror. In this event, the array pitch of the output faces arranged in the direction crossing the scanning direction of the polygon mirror is made equal to resolution of an exposure pattern. In this event, the wavelength of each laser may be made not longer than 410 nm.
    Type: Grant
    Filed: March 9, 2005
    Date of Patent: May 13, 2008
    Assignee: Hitachi Via Mechanics, Ltd.
    Inventors: Yoshitada Oshida, Yoshitatsu Naito, Mituhiro Suzuki, Bunji Uchiyama, Tsuyoshi Yamaguchi
  • Publication number: 20080079921
    Abstract: An illumination apparatus and an exposure apparatus that achieves higher quality exposure to light and higher operating speed even where the ratio Hx/Hy between the transverse dimension Hx and the longitudinal dimension Hy of the plane of optical modulation of a two-dimensional optical space modulator is 1.5 or above, for instance, are to be provided. The focal distance fx in an x-direction and the focal distance fy in a y-direction of a second optical system that guides light emitted from an integrator to a two-dimensional optical space modulator are made different, in a ratio of fx/fy=1.6, for instance. In this way, the number of rod lenses in the integrator can be made equal between transverse and longitudinal directions and the value of Hx/Hy can be made 2.5 by bringing the aspect ratio dx:dy of rod lenses to 1.6:1, close to 1.
    Type: Application
    Filed: August 16, 2007
    Publication date: April 3, 2008
    Applicant: Hitachi Via Mechanics, ltd.
    Inventors: Yoshitada Oshida, Kazuo Kobayashi
  • Patent number: 7309568
    Abstract: A method and apparatus of stably obtaining fluorescent images of two or more fluorescent samples includes disposing the samples onto compartments defined on a substrate. The compartments are sequentially irradiated with an exciting light where the intensity varies. A value of fluorescence as generated from each of the samples is determined, and a fluorescent image is obtained based on the value of fluorescence.
    Type: Grant
    Filed: August 26, 2002
    Date of Patent: December 18, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitada Oshida, Satoshi Takahashi, Kenji Yasuda, Taisaku Seino
  • Publication number: 20070279609
    Abstract: A parallel glass which is a prism having a parallelogram-shaped cross section in an x-y direction, and parallel glasses which are prisms having a parallelogram-shaped cross section in the x-y direction and each include grooves formed in one surface in a z direction perpendicular to the x-y direction, are stacked in direct contact with each other such that the grooves are located on the inside, and light trying to enter the grooves is subjected is total reflection, thereby changing incident parallel beams with a pitch of 13 mm into emergent parallel beams with a pitch of 1 mm.
    Type: Application
    Filed: May 30, 2007
    Publication date: December 6, 2007
    Applicant: Hitachi Via Mechanics, Ltd.
    Inventors: Yoshitada OSHIDA, Yoshitatsu Naito, Mituhiro Suzuki, Tsuyoshi Yamaguchi, Shigenobu Maruyama
  • Patent number: 7277155
    Abstract: A production method of a semiconductor device which includes the steps of exposing a resist coated on a substrate of a semiconductor device by projecting a first light pattern on the substrate of the semiconductor device the first light pattern being formed by passing light through a first mask, and exposing the resist by projecting a second light pattern on the substrate, the second light pattern being formed by passing light through a second mask. In the step of exposing the resist by projecting the second light pattern, the second light pattern is formed by excimer laser light having an annular shape and passed through the second mask.
    Type: Grant
    Filed: April 29, 2005
    Date of Patent: October 2, 2007
    Assignee: Renesas Technology Corp.
    Inventors: Minori Noguchi, Yukio Kenbo, Yoshitada Oshida, Masataka Shiba, Yasuhiro Yoshitaka, Makoto Murayama
  • Publication number: 20070154938
    Abstract: A DNA inspecting apparatus including driving means for relatively changing positions of the multi-spot lights and a position of the DNA chip so as to detect the fluorescent lights in such a manner that a desired area on the DNA chip is irradiated with the multi-spot lights, and a control system for determining and inspecting DNA information about the to-be-inspected DNA chip from fluorescent light intensities and fluorescent light positions of the desired area on the DNA chip, the fluorescent light intensities and the fluorescent light positions being detected by the driving means and the fluorescent light detecting means.
    Type: Application
    Filed: February 22, 2007
    Publication date: July 5, 2007
    Inventors: Yoshitada Oshida, Toshihiko Nakata, Tomoaki Sakata, Kenji Yasuda, Satoshi Takahashi
  • Patent number: 7217573
    Abstract: A method of inspecting a DNA chip and an apparatus therefor that allow a picture to be reconstructed in the following steps: A plurality of irradiation spots are formed on a DNA probe array mounted on a stage. Then, the stage is displaced in X, Y directions so as to execute a scanning, thereby irradiating substantially all the entire surface of the DNA probe array. Next, a plurality of emitted fluorescent lights, which are generated from the plurality of irradiation spot portions on the DNA probe array, are converged and are then detected simultaneously by multi detectors. Finally, a data processing apparatus processes the detected signals, thereby reconstructing the picture.
    Type: Grant
    Filed: October 4, 2000
    Date of Patent: May 15, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitada Oshida, Toshihiko Nakata, Tomoaki Sakata, Kenji Yasuda, Satoshi Takahashi
  • Publication number: 20070058149
    Abstract: A lighting system and an exposure apparatus in which even if the outgoing optical axes of outgoing beams emitted from a plurality of LDs disposed on a flat plane are shifted, the efficiency of use of the beams can be improved, and the directivity of lighting can be enhanced. Diffused beams output from a plurality of LDs arrayed two-dimensionally are converted into high-directivity beams with spread angles equalized circumferentially by two kinds of cylindrical lenses. In this event, the optical axis of the beam emitted from each LD may tilt due to misalignment of the center of the beam with the optical axes of the corresponding cylindrical lenses. This tilt is corrected by a wedged glass. Thus, the optical axis of the beam output from each LD meets the optical axis in the entrance plane of an integrator.
    Type: Application
    Filed: August 15, 2006
    Publication date: March 15, 2007
    Applicant: Hitachi Via Mechanics, Ltd.
    Inventors: Yoshitada Oshida, Kazuo Kobayashi
  • Publication number: 20060215139
    Abstract: A maskless exposure method and a maskless exposure apparatus in which maskless exposure can be performed efficiently with high-directivity illumination light, while the exposure efficiency of solder resist can be improved. Blue-violet semiconductor lasers 12A emitting laser beams 1a with a wavelength of 405 nm and ultraviolet semiconductor lasers 12B emitting laser beams 1b with a wavelength of 375 nm are provided to irradiate a substrate 8 with the laser beams 1a and 1b whose optical axes are made coaxial. In this event, one and the same place on the substrate 8 is irradiated with the laser beams 1a and 1b a plurality of times. Thus, the variation in intensity of the laser beams 1a and 1b is averaged.
    Type: Application
    Filed: February 14, 2006
    Publication date: September 28, 2006
    Applicant: Hitachi Via Mechanics Ltd.
    Inventors: Yoshitada Oshida, Yoshitatsu Naito, Mituhiro Suzuki, Tsuyoshi Yamaguchi, Shigenobu Maruyama
  • Patent number: 7092058
    Abstract: It is possible to enhance the utilization efficiency of a light source and impart an orientation control performance and a pretilt angle to an orientation film in a short treatment time. Substrates to which orientation films are applied are mounted on stages which are sequentially transported to a main irradiation region and a sub-irradiation region. Light flux irradiated from a light source device having a single light source receives polarization treatment at a polarization unit, thus generating main polarized light and sub-polarized light. The main polarized light is irradiated to the orientation film formed on the substrate which is transported to a main irradiation region, thus imparting orientation control performance to the orientation film. Subsequently, the substrate is transported to a sub-irradiation region, and sub-polarized light is irradiated to the orientation film to which orientation control performance is already imparted, thus imparting a pretilt angle to the orientation film.
    Type: Grant
    Filed: May 10, 2004
    Date of Patent: August 15, 2006
    Assignee: Hitachi Displays, Ltd.
    Inventors: Aki Sakai, Noboru Kunimatsu, Yoshitada Oshida
  • Patent number: 7064813
    Abstract: Disclosed is an apparatus for measuring a micro area in a specimen in which a reagent necessary for observation and examination of a cell smear specimen or a tissue specimen is dropped to cause a reaction for a measurement and an analysis by way of an image. The apparatus includes: a micro reaction unit that is able to select a specific micro area in the specimen and to subject the specific micro area to a reaction-operation; a unit that measures; records and displays an image of the micro area; and a control unit that controls the measuring, recording, and displaying unit. Reactions can be effected quickly on such specimens as smear cell specimens and tissue slice specimens. The application of the reagent solution can be saved. A comparison between local presence of a gene or anti-body and a cell image can be made quickly and easily.
    Type: Grant
    Filed: September 25, 2002
    Date of Patent: June 20, 2006
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Satoshi Takahashi, Kenji Yasuda, Yoshitada Oshida, Taisaku Seino