Abstract: An inspection apparatus includes a limiting unit that is provided between a light source and a target region and limits light traveling from the light source toward the target region, and an imaging unit that captures an image using light passing through the limiting unit, reflected from the target region, and incident on the imaging unit. The limiting unit allows light, which travels in one direction and is incident on the imaging unit in a case where the light is specularly reflected from the target region, to pass and allows at least a part of light, which travels in other directions, not to pass, among light emitted from the light source.

Abstract: An information processing apparatus includes a processor configured to: acquire a position of principal illumination from a spherical image; acquire a direction of a principal normal of an object to be observed; acquire an observation condition of the object; and identify, on a basis of the position of principal illumination, the direction of the principal normal, and the observation condition, a positional relationship with which a light component reflected specularly by a plane corresponding to the principal normal.

Abstract: A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and receive a change in a range used to calculate the numerical value indicated by an index in the image.

Abstract: A measurement apparatus includes a light irradiator, a light receiver, and a processor. The light irradiator is able to apply light from multiple directions to a specific portion of a subject to be measured. The light receiver receives light reflected by the specific portion. The processor is configured to: cause the light irradiator to apply light to the specific portion sequentially from the multiple directions; and acquire information concerning a tilt of a surface of the specific portion, based on information on light received by the light receiver when light is applied to the specific portion from a first direction and information on light received by the light receiver when light is applied to the specific portion from a second direction. The multiple directions include the first and second directions.

Abstract: An information processing apparatus includes a processor configured to: acquire a feature amount related to brightness distribution from a first image captured at an observation location; select an environment light map that is similar to the feature amount, from among plural environment light maps prepared in advance; and control expression of a second image corresponding to an article observed at the observation location using the selected environment light map.

Abstract: An information processing apparatus includes a processor configured to: acquire information on main illumination from an illumination intensity distribution of an image that results from imaging an actual space; and control an expression of a thing using an illumination intensity distribution that is corrected with the information on the main illumination.

Abstract: A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and notify a user of information indicating a relationship between a first orientation of a pattern on the surface detected from the image and a second orientation that gives a direction of imaging in which a sensitivity of detection by the imaging device is high.

Abstract: A surface inspection apparatus includes an imaging device that images a surface of an object to be inspected; and a processor configured to: calculate a texture of the object through processing of an image imaged by the imaging device; and display a symbol representing the texture of the object at a coordinate position on a multidimensional distribution map.

Abstract: An object texture measurement device includes a visual detection unit that detects a visual texture of an object, a tactile detection unit that detects a tactile texture of the object, and an acquisition unit that acquires a detection result of each of the visual detection unit and the tactile detection unit while relatively moving each of the visual detection unit and the tactile detection unit with respect to the object.

Abstract: The disclosure provides a surface inspection apparatus for inspecting a surface of an object, a non-transitory computer readable medium thereof, and a surface inspection method thereof. According to an aspect of the disclosure, the surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and display, on a display device, the image including an index for specifying a position of a portion that has contributed to the calculation of the numerical value and the numerical value.

Abstract: An image quality evaluation method to be executed by an information processing apparatus includes: acquiring information about a step at a boundary portion between an image portion, which is formed using a recording material, and a base material portion, which is a ground of the image portion, and a gloss level of the image portion; and calculating an evaluation value of a relief feel on the basis of the acquired information about the step and the gloss level.

Abstract: A surface inspection apparatus includes an imaging device that images a surface of an object to be inspected, and a processor configured to: calculate an evaluation value of a texture of the object through processing of an image imaged by the imaging device; and detect reflection of a cause of erroneous calculation of the image within a specific range based on at least brightness information of the image.

Abstract: A surface inspection apparatus includes an imaging device that images a surface of an object to be inspected; and a processor configured to: calculate a texture of the object through processing of an image imaged by the imaging device; and display a symbol representing the texture of the object at a coordinate position on a multidimensional distribution map.

Abstract: A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and display, on a display device, the image including an index for specifying a position of a portion that has contributed to the calculation of the numerical value and the numerical value.

Abstract: A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and notify a user of information indicating a relationship between a first orientation of a pattern on the surface detected from the image and a second orientation that gives a direction of imaging in which a sensitivity of detection by the imaging device is high.

Abstract: A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and receive a change in a range used to calculate the numerical value indicated by an index in the image.

Abstract: An information processing apparatus includes: a processor configured to: set a geometrical transformation region for use in generating a geometrical transformation image into which a sample image is geometrically transformed, based on a replacement target region set in a part of an original image; generate the geometrical transformation image by geometrically transforming the sample image such that the transformed sample image has a shape of the geometrical transformation region; and replace the replacement target region using the geometrical transformation image.

Abstract: A measurement apparatus includes a light irradiator that irradiates a measurement target with light and a processor that controls the light irradiator, in which the processor is configured to irradiate a specific place of the measurement target with the light from plural places having different positions in one direction, and irradiate the specific place of the measurement target with the light from the plural places having different positions in a direction intersecting the one direction.

Abstract: An information processing device includes a processor configured to acquire image data including color information, acquire color information of a formed image, the formed image being an image formed on a recording medium on a basis of the image data, acquire light transmittance information expressing a degree of light transmittance of an image-carrying medium, the image-carrying medium being the recording medium on which the formed image is formed, and associate first color information, second color information, and the light transmittance information with each other, the first color information being the color information included in the image data and the second color information being the color information of the formed image.

Abstract: A surface inspection apparatus includes an imaging device that images a portion of an object to be inspected, a first light source that is included in multiple light sources that illuminate the portion and that is configured such that a light component that is included in light emitted from the first light source and that is reflected by specular reflection from the portion to be inspected is a principal light component that is incident on the imaging device, and a second light source that is included in the multiple light sources and that is disposed opposite the first light source with an optical axis of the imaging device interposed therebetween such that a light component that is reflected by diffuse reflection from the portion to be inspected is a principal light component that is incident on the imaging device.