Abstract: An apparatus detects detecting when an extraordinary behavior is performed when a monitoring task is executed on an information processing apparatus. The detecting apparatus includes: an obtaining section for obtaining a measurement data including an executing timing and an execution time for each occasion of execution when the monitoring task is executed for a number of times on the information processing apparatus; a distance calculating section for calculating a distance between a measured point corresponding to each measurement data in a multi-dimensional space on which an executing timing and an execution time are allocated to different coordinates and another measured point placed in a predetermined range; and a determining section for determining whether an extraordinary behavior is performed when the monitoring task corresponding to the measurement data is executed based on the distance obtained for the measured point corresponding to the measurement data.

Abstract: An inspection method includes an array process of forming a TFT array on a substrate to fabricate an active matrix panel, an inspection process of carrying out a performance test on the fabricated active matrix panel, and a cell process of mounting an OLED on the active matrix panel after the inspection process. In the inspection process, variation in parasitic capacitance through a pixel electrode is measured when driving TFTs constituting the active matrix fabricated in the array process are turned on and when the driving TFTs are turned off, and open/short defects in the driving TFTs are thereby inspected.

Abstract: A detecting apparatus including a cluster storing unit that stores, for each of clusters into which execution time of previously executed monitored tasks are classified, the range of execution times belonging to the cluster, an acquiring unit that acquires an execution time of the monitored task in response to new execution of the monitored task on the information processing apparatus, and a determining unit that determines the occurrence of an extraordinary behavior during the execution of the monitored task if the execution time of the newly executed monitored task does not fall within any of the ranges corresponding to the clusters.

Abstract: A detecting apparatus detects the degree of correlation between first events and second events repeatedly occurring in an observed apparatus includes an acquiring unit that acquires second event count values each indicating the number of second events occurring during each first period between each first event and the first event next thereto. A measuring unit measures an observed number of each second event count value derived from the number of times the second event count value is observed. A calculating unit calculates the degree of correlation between the first events and the second events based on the observed number of each second event count value.

Abstract: Provided are a color display driving principle obtained while taking into account a difference in eye sensitivity to the flickering of differently colored lights, a TFT liquid crystal display module structure that is adequate for this method, and a double-panel projection type display device. The count of the G (green) color data that can be written is increased compared with the count for the other primary colors, or the display period for green can be extended. The repetitive unit is set to R, G, B and G, so that a satisfactory refresh rate can be set for the important color G. Therefore, the overall refresh frequency and the power consumed by the display device can be reduced without deterioration of the display quality, and requests for the time response speeds by the display device can be reduced.

Abstract: An inspection method includes an array process of forming a TFT array on a substrate to fabricate an active matrix panel, an inspection process of carrying out performance inspection of the fabricated active matrix panel, and a cell process of mounting an OLED on the active matrix panel judged as non-defective in the inspection process. In the inspection process, a counter electrode is disposed in the vicinity of a plane, where an OLED connection electrode is exposed, of the active matrix panel fabricated in the array process so as to observe an electric current flowing on a pixel subject to measurement which constitutes the active matrix panel.

Abstract: A detecting apparatus including a cluster storing unit that stores, for each of clusters into which execution time of previously executed monitored tasks are classified, the range of execution times belonging to the cluster, an acquiring unit that acquires an execution time of the monitored task in response to new execution of the monitored task on the information processing apparatus, and a determining unit that determines the occurrence of an extraordinary behavior during the execution of the monitored task if the execution time of the newly executed monitored task does not fall within any of the ranges corresponding to the clusters.

Abstract: Provided is an inspection device which inspects a thin film transistor (TFT) for supplying a current to a light emitting element. The inspection device includes: a first current supply circuit which supplies a drain current between a drain and a source of the TFT; a gate voltage adjustment circuit which adjust a gate voltage to be applied to a gate of the TFT so as to allow a predetermined specified current to flow between the drain and source of the TFT; and a measurement unit which measures the gate voltage adjusted by the gate voltage adjustment circuit.

Abstract: An apparatus detects detecting when an extraordinary behavior is performed when a monitoring task is executed on an information processing apparatus. The detecting apparatus includes: an obtaining section for obtaining a measurement data including an executing timing and an execution time for each occasion of execution when the monitoring task is executed for a number of times on the information processing apparatus; a distance calculating section for calculating a distance between a measured point corresponding to each measurement data in a multi-dimensional space on which an executing timing and an execution time are allocated to different coordinates and another measured point placed in a predetermined range; and a determining section for determining whether an extraordinary behavior is performed when the monitoring task corresponding to the measurement data is executed based on the distance obtained for the measured point corresponding to the measurement data.

Abstract: A detecting apparatus detects the degree of correlation between first events and second events repeatedly occurring in an observed apparatus includes an acquiring unit that acquires second event count values each indicating the number of second events occurring during each first period between each first event and the first event next thereto. A measuring unit measures an observed number of each second event count value derived from the number of times the second event count value is observed. A calculating unit calculates the degree of correlation between the first events and the second events based on the observed number of each second event count value.

Abstract: An inspection method includes an array process of forming a TFT array on a substrate to fabricate an active matrix panel, an inspection process of carrying out a performance test on the fabricated active matrix panel, and a cell process of mounting an OLED on the active matrix panel after the inspection process. In the inspection process, variation in parasitic capacitance through a pixel electrode is measured when driving TFTs constituting the active matrix fabricated in the array process are turned on and when the driving TFTs are turned off, and open/short defects in the driving TFTs are thereby inspected.

Abstract: To test electrical characteristics of a Thin Film Transistor (TFT) with a source or drain terminal left open and exposed, using a non-contact current source and protecting the TFTs from adverse effects, such as contamination, destruction, and the like. A tester 100 is provided to test a TFT array substrate 14, the tester including ion flow supply devices 16 and 18 for supplying an ion flow onto the surface of a substrate 14. Thereon, an array 12 of TFTs is formed, each TFT being connected to an electrode having a source or a drain left open and exposed; a control circuit 24 for supplying an operating voltage to a gate electrode of the TFT to be tested in the array; and a measurement circuit 24 for measuring an operating current via the testing TFT source or drain that remain in a non open state.

Abstract: Provided is an inspection device which inspects a thin film transistor (TFT) for supplying a current to a light emitting element. The inspection device includes: a first current supply circuit which supplies a drain current between a drain and a source of the TFT; a gate voltage adjustment circuit which adjust a gate voltage to be applied to a gate of the TFT so as to allow a predetermined specified current to flow between the drain and source of the TFT; and a measurement unit which measures the gate voltage adjusted by the gate voltage adjustment circuit.

Abstract: An inspection method includes an array process of forming a TFT array on a substrate to fabricate an active matrix panel, an inspection process of carrying out a performance test on the fabricated active matrix panel, and a cell process of mounting an OLED on the active matrix panel after the inspection process. In the inspection process, variation in parasitic capacitance through a pixel electrode is measured when driving TFTs constituting the active matrix fabricated in the array process are turned on and when the driving TFTs are turned off, and open/short defects in the driving TFTs are thereby inspected.

Abstract: An inspection method includes an array process of forming a TFT array on a substrate to fabricate an active matrix panel, an inspection process of carrying out performance inspection of the fabricated active matrix panel, and a cell process of mounting an OLED on the active matrix panel judged as non-defective in the inspection process. In the inspection process, a counter electrode is disposed in the vicinity of a plane, where an OLED connection electrode is exposed, of the active matrix panel fabricated in the array process so as to observe an electric current flowing on a pixel subject to measurement which constitutes the active matrix panel.

Abstract: Provided are a color display driving principle obtained while taking into account a difference in eye sensitivity to the flickering of differently colored lights, a TFT liquid crystal display module structure that is adequate for this method, and a double-panel projection type display device. The count of the G (green) color data that can be written is increased compared with the count for the other primary colors, or the display period for green can be extended. The repetitive unit is set to R, G, B and G, so that a satisfactory refresh rate can be set for the important color G. Therefore, the overall refresh frequency and the power consumed by the display device can be reduced without deterioration of the display quality, and requests for the time response speeds by the display device can be reduced.

Abstract: An inspection method includes an array process of forming a TFT array on a substrate to fabricate an active matrix panel, an inspection process of carrying out a performance test on the fabricated active matrix panel, and a cell process of mounting an OLED on the active matrix panel after the inspection process. In the inspection process, variation in parasitic capacitance through a pixel electrode is measured when driving TFTs constituting the active matrix fabricated in the array process are turned on and when the driving TFTs are turned off, and open/short defects in the driving TFTs are thereby inspected.

Abstract: An inspection system for inspecting characteristics of an active matrix panel before formation of OLEDs includes: a roller contact probe having a conductive material on at least a surface thereof and sequentially contacting pixel electrodes formed on the active matrix panel while rotating; probe control circuits having capability to apply a voltage necessary for measurement to TFT arrays including pixel electrodes with which the roller contact probe is in contact; and a computer measuring currents flowing through the TFT arrays to which a voltage is applied and statistically processing the measurement results.

Abstract: A thin film transistor (TFT) array comprises: a drive TFT for driving an organic light emitting diode (OLED), which is an electroluminescence (EL) device; first common wiring disposed for performing a current source or a current sink for the OLED; second common wiring disposed for performing a current source or a current sink for the OLED, the second common wiring being connected alternately with the first common wiring for each horizontal line and each vertical column of a pixel; and a switching TFT, which is a connection switch for connecting either one of the first common wiring and the second common wiring to a pixel electrode.

Abstract: JP920010105US125 A liquid crystal display driver for applying a voltage to liquid crystal cells forming an image display area includes a pulse generation circuit for generating a plurality of reference pulses in which pulse generation densities are weighted, a pulse select/synthesis circuit for generating a pulse string by selecting and synthesizing necessary reference pulses on the basis of digital input data and the reference pulses and an integration circuit (low pass filter) for integrating the pulse string generated by the pulse select/synthesis circuit to output an analog voltage for gamma correction.