Patents by Inventor Yoshiteru Katsumura
Yoshiteru Katsumura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230367296Abstract: This industrial system is characterized by being provided with: a storage unit that stores design data used when constructing an industrial line; a simulation execution unit that executes a simulation of movement of the industrial line, based on the design data; and a detection unit that compares a result of the simulation with the movement of the industrial line during operation and detects an abnormality in components of the industrial line. With such a configuration and movement, the present invention can be utilized for line operation support and high-resolution abnormality detection.Type: ApplicationFiled: November 2, 2020Publication date: November 16, 2023Applicant: Hitachi, Ltd.Inventors: Nobuhiro KAKENO, Yoshiteru KATSUMURA, Daiki KAJITA, Takahiro NAKANO, Miho ARAI
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Patent number: 11393050Abstract: Provided is a technique for executing production planning having appropriate responsiveness even when the number of participating companies accommodating resources is increased. A resource accommodation device includes: a resource registration receiving unit that stores a resource registration request including a type of an available resource and an available date and time in a schedule storage unit of a predetermined resource upon receiving the resource registration request; and a resource candidate presentation unit that searches through resources stored in the schedule storage unit upon receiving a type of a requested resource and a date and time of using the resource, selects a resource satisfying a predetermined criterion, and presents the resource as a resource candidate having been selected.Type: GrantFiled: December 22, 2015Date of Patent: July 19, 2022Assignee: HITACHI, LTD.Inventors: Yoshiteru Katsumura, Yuuichi Suginishi, Takahiro Iwata
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Publication number: 20180053262Abstract: Provided is a technique for executing production planning having appropriate responsiveness even when the number of participating companies accommodating resources is increased. A resource accommodation device includes: a resource registration receiving unit that stores a resource registration request including a type of an available resource and an available date and time in a schedule storage unit of a predetermined resource upon receiving the resource registration request; and a resource candidate presentation unit that searches through resources stored in the schedule storage unit upon receiving a type of a requested resource and a date and time of using the resource, selects a resource satisfying a predetermined criterion, and presents the resource as a resource candidate having been selected.Type: ApplicationFiled: December 22, 2015Publication date: February 22, 2018Inventors: Yoshiteru KATSUMURA, Yuuichi SUGINISHI, Takahiro IWATA
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Patent number: 8379338Abstract: Techniques for performing metrology on magnetic media disk formations that are arranged in curvilinear patterns are disclosed. Small integrated test patterns having rectangular periodicity are integrated among the concentric circles of patterned media formations. The test patterns cover only very small areas of the disk so as to not significantly affect disk capacity. The periodicity of the test patterns allows their formations to be more readily measured by metrology technology than those having a curvilinear periodicity.Type: GrantFiled: August 30, 2010Date of Patent: February 19, 2013Assignee: HGST Netherlands B.V.Inventor: Yoshiteru Katsumura
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Patent number: 8059365Abstract: Embodiments of the present invention provide a head stack assembly and a manufacturing method thereof in which manufacturing costs as a multi-disc magnetic device are reduced by increasing the yield and reducing inventory of magnetic heads which can be assembled to the head stack assembly. According to one embodiment, a head stack assembly and a manufacturing method thereof includes plural actuator arms to which magnetic heads are assembled through suspensions. The tolerance of the core width or the write element width of the magnetic heads assembled to inside actuator arms of the plural actuator arms is set to be narrower than the tolerance of the core width or the write element width of the magnetic heads assembled to the outside actuator arms.Type: GrantFiled: February 26, 2009Date of Patent: November 15, 2011Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Hiroshi Fukuyama, Makoto Ono, Yoshiteru Katsumura, Yasunori Nishimoto
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Patent number: 8009381Abstract: A method for manufacturing a hard-disk drive (HDD). The method for manufacturing a HDD includes writing servo tracks, and writing servo tracks into the HDD using a calculated control target value of a calculated servo pattern overlap amount. Writing servo tracks includes a first, second, third and fourth operation. The first operation includes: producing a first control equation for obtaining a servo pattern overlap amount; and, converting a root-mean-square error (RMSE) into a probability distribution. The second operation includes calculating a second control target value that results in an increased product yield, from the RMSE probability distribution. The third operation includes producing a second control equation for obtaining a calculated servo pattern overlap amount, by assigning the second control target value into the first control equation.Type: GrantFiled: December 10, 2009Date of Patent: August 30, 2011Assignee: Hitachi Global Storage Technologies, Netherlands B.V.Inventors: Yoshiteru Katsumura, Yasunori Nishimoto, Alice Okabe, Hiroshi Fukuyama
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Patent number: 7957087Abstract: A servo write method for a hard-disk drive. The method includes generating, with an input of characteristics of a magnetic-recording head and a magnetic-recording disk which are incorporated into the hard-disk drive, a yield prediction model from a correlation between yields of the hard-disk drive, and characteristics of the magnetic-recording head and the magnetic-recording disk of the hard-disk drive in a process. The method also includes predicting a yield which is obtained when each magnetic-recording head is used as a position control head, selecting as the position control head a magnetic-recording head that has a highest predicted yield, and writing a servo signal.Type: GrantFiled: December 3, 2009Date of Patent: June 7, 2011Assignee: Hitachi Global Storage Technologies, Netherlands, B.V.Inventors: Yasunori Nishimoto, Yoshiteru Katsumura, Hiroshi Fukuyama, Naoki Shimamura
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Publication number: 20110072644Abstract: A method for manufacturing a hard-disk drive (HDD). The method for manufacturing a HDD includes writing servo tracks, and writing servo tracks into the HDD using a calculated control target value of a calculated servo pattern overlap amount. Writing servo tracks includes a first, second, third and fourth operation. The first operation includes: producing a first control equation for obtaining a servo pattern overlap amount; and, converting a root-mean-square error (RMSE) into a probability distribution. The second operation includes calculating a second control target value that results in an increased product yield, from the RMSE probability distribution. The third operation includes producing a second control equation for obtaining a calculated servo pattern overlap amount, by assigning the second control target value into the first control equation.Type: ApplicationFiled: December 10, 2009Publication date: March 31, 2011Inventors: Yoshiteru Katsumura, Yasunori Nishimoto, Alice Okabe, Hiroshi Fukuyama
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Patent number: 7900341Abstract: A high yield in a manufacture of an HDD having a high recording density and using a patterned medium by a trench-like or a dot-like pattern is realized. In this HDD manufacturing method, a magnetic field size (writing and reading) of a head in a head manufacturing process is measured in a head unit inspection process. According to the result of the measurement, the head is classified into a plurality of groups in a head classifying process. In a patterned medium manufacturing process, a plurality of types of the patterned media which are designed so as to correspond to the classified head groups are manufactured. In an HDD assembly process, the HDD is manufactured by combining the plurality of head groups and the plurality of patterned media following a predetermined rule.Type: GrantFiled: January 29, 2009Date of Patent: March 8, 2011Assignee: Hitachi, Ltd.Inventor: Yoshiteru Katsumura
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Publication number: 20100321813Abstract: Techniques for performing metrology on magnetic media disk formations that are arranged in curvilinear patterns are disclosed. Small integrated test patterns having rectangular periodicity are integrated among the concentric circles of patterned media formations. The test patterns cover only very small areas of the disk so as to not significantly affect disk capacity. The periodicity of the test patterns allows their formations to be more readily measured by metrology technology than those having a curvilinear periodicity.Type: ApplicationFiled: August 30, 2010Publication date: December 23, 2010Applicant: Hitachi Global Storage Technologies Netherlands B.V.Inventor: Yoshiteru Katsumura
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Patent number: 7813075Abstract: Techniques for performing metrology on magnetic media disk formations that are arranged in curvilinear patterns are disclosed. Small integrated test patterns having rectangular or hexagonal periodicity are integrated among the concentric circles of patterned media formations. The test patterns cover only very small areas of the disk so as to not significantly affect disk capacity. The periodicity of the test patterns allows their formations to be more readily measured by metrology technology than those having a curvilinear periodicity.Type: GrantFiled: October 22, 2007Date of Patent: October 12, 2010Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventor: Yoshiteru Katsumura
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Publication number: 20090225476Abstract: Embodiments of the present invention provide a head stack assembly and a manufacturing method thereof in which manufacturing costs as a multi-disc magnetic device are reduced by increasing the yield and reducing inventory of magnetic heads which can be assembled to the head stack assembly. According to one embodiment, a head stack assembly and a manufacturing method thereof includes plural actuator arms to which magnetic heads are assembled through suspensions. The tolerance of the core width or the write element width of the magnetic heads assembled to inside actuator arms of the plural actuator arms is set to be narrower than the tolerance of the core width or the write element width of the magnetic heads assembled to the outside actuator arms.Type: ApplicationFiled: February 26, 2009Publication date: September 10, 2009Inventors: Hiroshi Fukuyama, Makoto Ono, Yoshiteru Katsumura, Yasunori Nishimoto
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Publication number: 20090217510Abstract: A high yield in a manufacture of an HDD having a high recording density and using a patterned medium by a trench-like or a dot-like pattern is realized. In this HDD manufacturing method, a magnetic field size (writing and reading) of a head in a head manufacturing process is measured in a head unit inspection process. According to the result of the measurement, the head is classified into a plurality of groups in a head classifying process. In a patterned medium manufacturing process, a plurality of types of the patterned media which are designed so as to correspond to the classified head groups are manufactured. In an HDD assembly process, the HDD is manufactured by combining the plurality of head groups and the plurality of patterned media following a predetermined rule.Type: ApplicationFiled: January 29, 2009Publication date: September 3, 2009Inventor: Yoshiteru Katsumura
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Publication number: 20090103201Abstract: Techniques for performing metrology on magnetic media disk formations that are arranged in curvilinear patterns are disclosed. Small integrated test patterns having rectangular or hexagonal periodicity are integrated among the concentric circles of patterned media formations. The test patterns cover only very small areas of the disk so as to not significantly affect disk capacity. The periodicity of the test patterns allows their formations to be more readily measured by metrology technology than those having a curvilinear periodicity.Type: ApplicationFiled: October 22, 2007Publication date: April 23, 2009Inventor: Yoshiteru Katsumura
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Patent number: 7052995Abstract: A buried film and a barrier film are polished together using a slurry in which the polishing rate on a substrate material (in particular, silicon oxide), that on a buried-film material (in particular, tungsten) and that on a barrier-film material (in particular, titanium oxide) are substantially equal to one another. This can materialize a buried structure free from any step or steps, at a high polishing rate.Type: GrantFiled: June 24, 2002Date of Patent: May 30, 2006Assignee: Renesas Technology Corp.Inventors: Nobuhito Katsumura, Yoshiteru Katsumura, Hidemi Sato, Norihiro Uchida, Fumiyuki Kanai
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Publication number: 20030025200Abstract: A buried film and a barrier film are polished together using a slurry in which the polishing rate on a substrate material (in particular, silicon oxide), that on a buried-film material (in particular, tungsten) and that on a barrier-film material (in particular, titanium oxide) are substantially equal to one another. This can materialize a buried structure free from any step or steps, at a high polishing rate.Type: ApplicationFiled: June 24, 2002Publication date: February 6, 2003Inventors: Nobuhito Katsumura, Yoshiteru Katsumura, Hidemi Sato, Norihiro Uchida, Fumiyuki Kanai
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Patent number: 6468817Abstract: In the manufacturing method, micro scratches are detected without performing a breakdown inspection on wafers flowing through a mass production process. The method comprises: forming an insulating film on main surfaces of a plurality of first wafers which flow through a mass-production process; preparing a dummy wafer for monitoring, on which a silicon-oxide-based insulating film is formed; performing chemical mechanical polishing on the insulating films respectively formed on main surfaces of the plurality of first wafers and the dummy wafer; performing etching on the insulating film of the dummy wafer with use of a solution containing hydrofluoric acid, after the step of performing the chemical mechanical polishing; and measuring a number of scratches on the insulating film of the dummy wafer subjected to the etching.Type: GrantFiled: August 23, 2001Date of Patent: October 22, 2002Assignee: Hitachi, Ltd.Inventors: Shinichi Nakabayashi, Hisahiko Abe, Hirofumi Tsuchiyama, Yukio Kenbo, Yoshiteru Katsumura
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Publication number: 20020042154Abstract: In the manufacturing method, micro scratches are detected without performing a breakdown inspection on wafers flowing through a mass production process.Type: ApplicationFiled: August 23, 2001Publication date: April 11, 2002Inventors: Shinichi Nakabayashi, Hisahiko Abe, Hirofumi Tsuchiyama, Yukio Kenbo, Yoshiteru Katsumura