Abstract: A radio communication device is a radio communication device that performs radio communication by a press-to-talk communication system, and includes an operating unit that receives an operation of a user, an output unit that outputs a received voice signal as a voice, and a volume adjusting unit that adjusts a volume of the voice output by the output unit. The volume adjusting unit acquires source information that indicates a source of the voice signal when a predetermined operation by a user is made with respect to the operating unit, and adjusts the volume of the voice by using an adjustment coefficient that is a degree of adjustment of the volume of the voice, based on the acquired source information.

Abstract: A radio communication device is a radio communication device that performs radio communication by a press-to-talk communication system, and includes an operating unit that receives an operation of a user, an output unit that outputs a received voice signal as a voice, and a volume adjusting unit that adjusts a volume of the voice output by the output unit. The volume adjusting unit acquires source information that indicates a source of the voice signal when a predetermined operation by a user is made with respect to the operating unit, and adjusts the volume of the voice by using an adjustment coefficient that is a degree of adjustment of the volume of the voice, based on the acquired source information.

Abstract: A flexible substrate including: a first part provided with a first device DV1; a second part provided with a second device; a wiring part placed between the first part and the second part and including a plurality of wirings for coupling the first device and the second device; the first device including at least a first data transfer control unit, the second device including at least a second data transfer control unit, the first data transfer control unit and the second data transfer control unit transferring data by using a differential signal, and the plurality of wirings for coupling the first device and the second device including at least one differential signal line pair for transferring data by using a differential signal.

Abstract: A flexible substrate including: a first part provided with a first device DV1; a second part provided with a second device; a wiring part placed between the first part and the second part and including a plurality of wirings for coupling the first device and the second device; the first device including at least a first data transfer control unit, the second device including at least a second data transfer control unit, the first data transfer control unit and the second data transfer control unit transferring data by using a differential signal, and the plurality of wirings for coupling the first device and the second device including at least one differential signal line pair for transferring data by using a differential signal.

Abstract: A placing and wiring method for a master slice type semiconductor integrated circuit is provided. The method is conducted by an automatic placing and routing apparatus with respect to a master slice 100 having a plurality of basic cells 110 formed in a matrix, in which first and second power source wirings 170 and 171 that traverse the plurality of basic cells 110 are connected to a plurality of signal wirings that are formed along a vertical direction to provide connections within each of the plurality of basic cells 110 and/or between the plurality of basic cells 110. The method includes: a first step of registering in the automatic pacing and routing apparatus definitions of effective pin positions A1-A14, B2-B13 and C1-C14; a second step of registering a net list in the automatic placing and routing apparatus; and a third step of determining the placement of pin positions and wiring routes, based on data for the definitions of the effective pin positions and the net list.

Abstract: A method for designing a semiconductor device includes receiving a net list of a semiconductor device, temporarily locating a plurality of functional blocks within a layout area of the semiconductor device and dividing a logic area of the semiconductor device into a plurality of rectangular areas and computing a predicted value of a utilization rate of the logic area and a predicted value of a wiring length of the semiconductor device based on a data base regarding a semiconductor device designed previously and the semiconductor device and the net list of the semiconductor device.

Abstract: A semiconductor integrated circuit is provided in which the transistor size can be minimized by only changing one mask after the performance of a prototype is tested. Impurity regions are formed in predetermined regions (formed of portions surrounded by solid lines and portions surrounded by broken lines) surrounded by a field insulating film on a semiconductor substrate for prototyping, and a prototype semiconductor integrated circuit is thereby manufactured, and then testing is performed. When the prototype semiconductor integrated circuit operates in a desired manner, impurity regions are formed in predetermined regions (formed of portions surrounded by solid lines only) surrounded by a field insulating film on a semiconductor substrate for shipment, and a semiconductor integrated circuit for shipment is thereby manufactured.

Abstract: A placing and wiring method for a master slice type semiconductor integrated circuit is provided. The method is conducted by an automatic placing and routing apparatus with respect to a master slice 100 having a plurality of basic cells 110 formed in a matrix, in which first and second power source wirings 170 and 171 that traverse the plurality of basic cells 110 are connected to a plurality of signal wirings that are formed along a vertical direction to provide connections within each of the plurality of basic cells 110 and/or between the plurality of basic cells 110. The method includes: a first step of registering in the automatic pacing and routing apparatus definitions of effective pin positions A1-A14, B2-B13 and C1-C14; a second step of registering a net list in the automatic placing and routing apparatus; and a third step of determining the placement of pin positions and wiring routes, based on data for the definitions of the effective pin positions and the net list.

Abstract: A placing and wiring method for a master slice type semiconductor integrated circuit is provided. The method is conducted by an automatic placing and routing apparatus with respect to a master slice 100 having a plurality of basic cells 110 formed in a matrix, in which first and second power source wirings 170 and 171 that traverse the plurality of basic cells 110 are connected to a plurality of signal wirings that are formed along a vertical direction to provide connections within each of the plurality of basic cells 110 and/or between the plurality of basic cells 110. The method includes: a first step of registering in the automatic pacing and routing apparatus definitions of effective pin positions A1-A14, B2-B13 and C1-C14; a second step of registering a net list in the automatic placing and routing apparatus; and a third step of determining the placement of pin positions and wiring routes, based on data for the definitions of the effective pin positions and the net list.

Abstract: A semiconductor integrated circuit is provided in which the transistor size can be minimized by only changing one mask after the performance of a prototype is tested. Impurity regions are formed in predetermined regions (formed of portions surrounded by solid lines and portions surrounded by broken lines) surrounded by a field insulating film on a semiconductor substrate for prototyping, and a prototype semiconductor integrated circuit is thereby manufactured, and then testing is performed. When the prototype semiconductor integrated circuit operates in a desired manner, impurity regions are formed in predetermined regions (formed of portions surrounded by solid lines only) surrounded by a field insulating film on a semiconductor substrate for shipment, and a semiconductor integrated circuit for shipment is thereby manufactured.