Patents by Inventor Yoshitoshi Ito

Yoshitoshi Ito has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5678556
    Abstract: An imaging method for spatial distributions of concentrations of absorbers distributed in an object including a radiation step of applying pulsating or continuous light radiated from predetermined incident positions with predetermined wavelengths to the object in the form of a scattering medium containing the absorbers, and a detection step of detecting intensities of light passing through the object at predetermined detection positions.
    Type: Grant
    Filed: July 14, 1995
    Date of Patent: October 21, 1997
    Assignee: Hitachi, Ltd.
    Inventors: Atsushi Maki, Adi Bonen, Yoshitoshi Ito, Yuichi Yamashita, Yukiko Hirabayashi, Hideaki Koizumi, Fumio Kawaguchi, Hideji Fujii
  • Patent number: 5586554
    Abstract: An optical system is arranged to irradiate light to the inside of a test subject and detect the light passed through the test subject for obtaining information about the inside of the test subject. The optical system includes a light source for generating rays of light having different wavelengths, an apparatus for irradiating the rays of light to corresponding spots on the test subject, an apparatus for detecting the light passed through the test subject at plural detecting spots on the test subject, and an apparatus for dispersing the detected light. The rays of light to be irradiated to the test subject have a visible wavelength to a near infrared one. The apparatus for irradiating light operates to irradiate the rays of light of each of the wavelengths to the test subject substantially at one time or by shifting the irradiating times according to each of the wavelengths. The apparatus for irradiating light contains the apparatus for dispersing the irradiated light into respective wavelengths.
    Type: Grant
    Filed: February 16, 1994
    Date of Patent: December 24, 1996
    Assignee: Hitachi, Ltd.
    Inventors: Atsushi Maki, Fumio Kawaguchi, Yuichi Yamashita, Yoshitoshi Ito
  • Patent number: 5408093
    Abstract: Optical computed tomography equipment adapted to speed up the scanning of a subject under test using irradiated light so as to shorten the measuring time involved. The light from a light source (15-1, 15-2) is guided over an optical fiber thread (12-5c) to an image inverting optical system comprising a dovetail prism (13-1) and two lenses (14-2, 14-1). Past the optical system, the light enters one of the threads making up an optical fiber (12-1). As the dovetail prism (13-1) is rotated around its optical axis, the light from the optical fiber thread (12-5c) consecutively enters different threads of the optical fiber (12-1), causing the irradiation position to scan a subject (11) of the test. The incident light, having passed through the subject (11) in various directions, goes through the respective threads of the optical fiber (12-1) to reach the image inverting optical device.
    Type: Grant
    Filed: March 11, 1994
    Date of Patent: April 18, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitoshi Ito, Fumio Kawaguchi, Yuichi Yamashita, Atsushi Maki
  • Patent number: 5349951
    Abstract: A device for measuring the inside information of a light-scattering specimen using a Line Spread Function (LSF) function of a light-scattering specimen and the intensity distribution of light which is transmitted through the light scattering specimen in repeating light scattering and output from the light scattering specimen. The device comprises: an optical system for illumination for irradiating a specimen to be measured (a light scattering specimen); an optical system for detection for detecting the transmitted light through the specimen; and a data processor for operating the detected transmitted light data. The above-mentioned data processor operates the inside information of a specimen to be measured based on the light intensity distribution of the transmitted light through the specimen and an LSF function which is newly defined, and displays the inside information as a tomograph image.
    Type: Grant
    Filed: March 19, 1993
    Date of Patent: September 27, 1994
    Assignees: Hitachi, Ltd., Tokai University
    Inventors: Yoshitoshi Ito, Fumio Kawaguchi, Yukito Shinohara, Munetaka Haida
  • Patent number: 5239185
    Abstract: In order to make it possible to measure the light absorption coefficient of various sorts of substances contained in a light scattering material with a high precision, the wavelength of light transmitted through the light scattering material is varied and the coefficient of light absorption is calculated, starting from a ratio of variations in the intensity of the transmitted light to variations in the wavelength.
    Type: Grant
    Filed: June 23, 1992
    Date of Patent: August 24, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitoshi Ito, Fumio Kawaguchi, Minoru Yoshida, Keiichi Nagai, Hiroyuki Kohida
  • Patent number: 5193422
    Abstract: A multispindle automatic lathe has a main shaft drive motor (M3) for driving spindles (13) via a driving power transmission system (2a, 12, 14, 15, 20, 21, 22, 27, 28, 31), a feed and index driving motor (M2) operating a low and high speeds in timed sequence for feeding a plurality of cross tool slides (16) via a feed driving system (3a, 61, 62, 64, 65, 67, 68, 69, 70) and indexing the spindle carrier (11) via an index driving system (62, 71, 72, 73, 74, 75, 76, 77), and a feed and index drive motor (M1) for feeding a plurality of end tool slides (18) via a feed driving system (4a, 18a, 78, 79).
    Type: Grant
    Filed: October 31, 1991
    Date of Patent: March 16, 1993
    Assignee: Mitsubishi Jukogyo Kabushiki Kaisha
    Inventors: Yuuichi Mukai, Yoshitoshi Ito, Takayuki Nagato, Tamotsu Tonomura
  • Patent number: 5190039
    Abstract: An apparatus and a method for non-invasively measuring oxygen partial pressure in a living body in which light is thrown on a living body to be measured, the oxygen saturation of the living body is obtained from the light absorption spectrum or light scattering spectrum thereof, the temperature and/or pH of the living body is obtained from a nuclear magnetic resonance signal from the living body, and the oxygen partial pressure in the living body, useful for the diagnosis thereof, is determined on the basis of not only the oxygen saturation but also the temperature and/or pH of the living body.
    Type: Grant
    Filed: December 5, 1990
    Date of Patent: March 2, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Takeuchi, Fumio Kawaguchi, Yuichi Yamashita, Kazuo Takeda, Yoshitoshi Ito, Yasuhiro Mitsui, Keiichi Nagai
  • Patent number: 5148022
    Abstract: A method for optically inspecting a human body and an apparatus for the same serve to scan a light pulse having a visible wavelength to an infrared one on a specific sliced portion of a body to be inspected, for obtaining pieces of projection data about light absorption and to reconstruct an image about distribution of light absorption from the projection data with a computer tomogram. The projection data is measured by alternately radiating a first light pulse at a first wavelength in an absorption wavelength band specific to metabolic materials to be imaged and a second light pulse at a second wavelength being closer to said first wavelength. Then, the data about the transmitted beams are produced by deriving a ratio of integrated values of the first signal to the second one residing within a specific time gate.
    Type: Grant
    Filed: February 13, 1990
    Date of Patent: September 15, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Fumio Kawaguchi, Hiroshi Takeuchi, Yasuhiro Mitsui, Yoshitoshi Ito, Munetaka Haida
  • Patent number: 5062942
    Abstract: In a fluorescence detection type electrophoresis apparatus, comprising an electrophoresis separation gel plate (2, 102, 205), an excitation laser beam source (3, 201, 201) for emitting fluorescent light, and a fluorescent light detector (9, 109, 212) for detecting the emitted fluorescent light, a fluorescent light images are divided into a plurality of virtual images by an image divider (5, 7.sub.2, 104, 105, 209) and at the same time, the lights corresponding to the individual divided images are wavelength-selected by bandpass filters (8, 8.sub.3, 107, 108, 120, 227-230), thereby providing highly accurate, sensitive separation and detection of DNA fragments and the like and determination of base sequence of DNA and the like.
    Type: Grant
    Filed: April 10, 1990
    Date of Patent: November 5, 1991
    Assignee: Hitachi, Ltd.
    Inventors: Hideki Kambara, Tetsuo Nishikawa, Tomoaki Sumitani, Keiichi Nagai, Yoshitoshi Ito
  • Patent number: 4957363
    Abstract: In a particle measuring apparatus for measuring characteristics of particles by detecting light scattered at the particles while irradiating the particles in fluid with light, the scattered light is detected by means of a plurality of detectors and the characteristics of particles are determined by using pulse signals of detection signals coming from the plurality of detectors, which are coincident with each other.
    Type: Grant
    Filed: July 1, 1988
    Date of Patent: September 18, 1990
    Assignee: Hitachi, Ltd.
    Inventors: Kazuo Takeda, Yoshitoshi Ito
  • Patent number: 4876458
    Abstract: An apparatus for measuring particles in a liquid, with the apparatus including an arrangement for allowing a sample liquid to flow out from a nozzle into a gas in a stream, an arrangement for radiating light into the sample liquid stream coaxially with the axis of the stream, and an arrangement for collecting ways of light scattered by particles contained in the sample liquid stream at a point outside and by a side of the sample liquid stream and then detecting the collective light rays.
    Type: Grant
    Filed: September 29, 1988
    Date of Patent: October 24, 1989
    Assignee: Hitachi, Ltd.
    Inventors: Kazuo Takeda, Yoshitoshi Ito, Noriaki Honma, Chusuke Munakata
  • Patent number: 4832815
    Abstract: In a wavelength dispersion electrophoresis apparatus which detects fluorescences of unequal wavelengths emitted from the samples of DNA, RNA or the like labeled with a plurality of fluorophores, a direct-vision prism (14) is interposed between a two-dimensional fluorescence detector (7) and an electrophoretic plate (17) in order to separate and discriminate the emission wavelengths of the respective fluorophores. The direct-vision prism (14) is disposed for the wavelength dispersion of the fluorescences in this manner, whereby the fluorescences of the individual wavelengths can be separated and detected at a high sensitivity by a simple mechanism and without distorting a fluorescence image.
    Type: Grant
    Filed: October 18, 1988
    Date of Patent: May 23, 1989
    Assignee: Hitachi, Ltd.
    Inventors: Hideki Kambara, Yoshitoshi Ito
  • Patent number: 4770532
    Abstract: An equipment for optically measuring the height of step according to the present invention is characterized in that a linearly polarized laser beam from a laser source is guided onto the side of an object through an optical fiber transferring said beam in the state that the plane of polarization thereof is maintained, the beam emitted from the optical fiber is applied onto the spots in proximity to each other on the surface of the object through the intermediary of an optical system separating said beam into two component beams having planes of polarization perpendicular to each other, the beams reflected from the surface of the object are made to go back through the aforesaid optical system so that two optical paths overlap each other, and are passed in the reverse direction through the aforesaid optical fiber and guided onto the side of the laser source, the optical power of the component parallel to the plane of polarization of the incident beam and the component perpendicular thereto out of the reflected
    Type: Grant
    Filed: February 24, 1987
    Date of Patent: September 13, 1988
    Assignee: Hitachi, Ltd.
    Inventor: Yoshitoshi Ito
  • Patent number: 4731855
    Abstract: A pattern defect inspection apparatus detects presence or absence of a defect in a pattern formed on a semiconductor wafer by scanning the pattern normally to the surface thereof by a coherent light beam of a predetermined spot size, detecting reflected diffraction lights generated thereby and processing the detected lights. It comprises an abnormal direction signal detector including photo-detectors having wide light receiving areas arranged in a plurality of spatial areas which the reflected diffraction lights from a normal pattern do not normally reach, a normal pattern detector including photo-detectors having large light receiving areas arranged in a plurality of spatial areas which the reflected diffraction lights from the normal pattern reach, and a defect discriminator for determining if the abnormal direction signals are due to a true defect or not in accordance with the signals from the abnormal direction signal detector and the normal pattern detector.
    Type: Grant
    Filed: April 8, 1985
    Date of Patent: March 15, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Kyo Suda, Shigeharu Kimura, Shinobu Hase, Chusuke Munakata, Kanji Kinameri, Yoshitoshi Ito, Hiroto Nagatomo, Yuzo Taniguchi, Mikihito Saito
  • Patent number: 4589014
    Abstract: A color industrial television camera device for use in a gamma ray environment including a lens system made of radiation resisting glass. The lens system has a spectral transmittance characteristic such that the wavelength for which the lens system has a transmittance equal to one-half of its maximum transmittance in a wavelength range from 0.4 to 0.7 .mu.m is shorter than about 0.48 .mu.m on the shorter wavelength side of the maximum transmittance wavelength in the above wavelength range, thereby enabling the achieving white balance for a color display with the aid of an electric circuit.
    Type: Grant
    Filed: October 12, 1983
    Date of Patent: May 13, 1986
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitoshi Ito, Yuji Takahashi, Morikazu Ayugai, Katsuhiro Mizuno, Atomi Noguchi
  • Patent number: 4311907
    Abstract: In a radiation detector including a radiation sensitive scintillator and a photo-electric conversion element, a film of silicon nitride providing a modified refractive index is interposed between the scintillator and the photo-electric conversion element.
    Type: Grant
    Filed: March 26, 1980
    Date of Patent: January 19, 1982
    Assignees: Hitachi Medical Corporation, National Institute of Radiological Sciences
    Inventors: Katsumi Takami, Yoshitoshi Ito, Kenji Ishimatsu, Eiichi Tanaka
  • Patent number: 4255762
    Abstract: Apparatus for inspecting pipes in a plant, comprising an elongate inspection head portion which is provided with an optical system for receiving an inspection image by approaching an inner surface of a pipe being an object to-be-inspected; at least one proximity sensor which is disposed in the inspection head portion in order to detect a relative distance between the inspection head portion and the proximate object; a positioning mechanism which consists of a plurality of driving shafts for advancing or retreating, rotating, and revolving the inspection head portion; a control device which is capable of programmed operation and which drives and controls the positioning mechanism in a predetermined operation sequence programmed in advance; a data storage device which stores positional data of the respective driving shafts of the positioning mechanism; and an image processor which is disposed at a position remote from the inspection head portion and which reconstructs the inspection image from video signals; th
    Type: Grant
    Filed: July 12, 1979
    Date of Patent: March 10, 1981
    Assignee: Hitachi, Ltd.
    Inventors: Kiyoo Takeyasu, Kanji Kato, Tatsuo Goto, Yoozoo Oouchi, Kazuhiro Yoshida, Yoshitoshi Ito, Katsumi Takami
  • Patent number: 4168512
    Abstract: In an optical system which is mounted on and used with an image pickup device for observing an object including a high brightness area therein, a pinhole is provided between the object and an imaging lens for separating the paths of the light rays from respective points of the object, and a filter which attenuates light from the high brightness area of the object which is separated by the pinhole.
    Type: Grant
    Filed: July 26, 1977
    Date of Patent: September 18, 1979
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitoshi Ito, Noriaki Honma, Katsumi Takami, Shusaku Nagahara, Akira Hashimoto