Patents by Inventor Yoshiyuki Iwakura

Yoshiyuki Iwakura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9582632
    Abstract: A wiring topology display method, includes: obtaining layout information indicating positions of components and wiring coupling the components; dividing first wiring into first pieces of partial wiring, and generating partial wiring information indicating the first pieces of partial wiring; identifying a first length of the partial wiring and a first angle of the partial wiring for a vector; identifying combinations of second pieces of partial wiring based on the first length and the first angle, the second pieces of partial wiring having second lengths which are a certain length or more, second angles which are different by a certain angle, and a distance which is a certain distance or less; identifying a group having the combinations including pieces of identical partial wiring; and symbolizing third pieces of partial wiring at both ends of the group and fourth pieces of partial wiring between the third pieces of partial wiring.
    Type: Grant
    Filed: October 23, 2015
    Date of Patent: February 28, 2017
    Assignee: FUJITSU LIMITED
    Inventors: Yoshiyuki Iwakura, Hidenobu Shiihara, Tsunaki Iwasaki
  • Patent number: 9389254
    Abstract: A computer-readable-recording-medium stored a program for causing a computer to execute: judging, for each of elements of a plurality of scattering parameters, whether a difference between a first-area in a plane containing an axis representing frequency and an axis representing the element, and a second-area in the plane is within a permissible range, the first-area being surrounded by a first-element-value series of the element that is defined in advance for a plurality of first-frequencies, the second-area being surrounded by a second-element-value series that is obtained by performing interpolation calculation from the first-element-value series for a plurality of second frequencies which are different from the plurality of first-frequencies and which are provided at regular intervals; and determining, by performing the judging for one interval or a plurality of intervals, an interval so that the difference falls within the permissible range for all of the elements of the plurality of scattering parameter
    Type: Grant
    Filed: April 26, 2013
    Date of Patent: July 12, 2016
    Assignee: FUJITSU LIMITED
    Inventors: Kumiko Teramae, Yoshiyuki Iwakura, Tsunaki Iwasaki
  • Publication number: 20160147930
    Abstract: A wiring topology display method, includes: obtaining layout information indicating positions of components and wiring coupling the components; dividing first wiring into first pieces of partial wiring, and generating partial wiring information indicating the first pieces of partial wiring; identifying a first length of the partial wiring and a first angle of the partial wiring for a vector; identifying combinations of second pieces of partial wiring based on the first length and the first angle, the second pieces of partial wiring having second lengths which are a certain length or more, second angles which are different by a certain angle, and a distance which is a certain distance or less; identifying a group having the combinations including pieces of identical partial wiring; and symbolizing third pieces of partial wiring at both ends of the group and fourth pieces of partial wiring between the third pieces of partial wiring.
    Type: Application
    Filed: October 23, 2015
    Publication date: May 26, 2016
    Applicant: FUJITSU LIMITED
    Inventors: Yoshiyuki Iwakura, HIDENOBU SHIIHARA, Tsunaki Iwasaki
  • Publication number: 20130332097
    Abstract: A computer-readable-recording-medium stored a program for causing a computer to execute: judging, for each of elements of a plurality of scattering parameters, whether a difference between a first-area in a plane containing an axis representing frequency and an axis representing the element, and a second-area in the plane is within a permissible range, the first-area being surrounded by a first-element-value series of the element that is defined in advance for a plurality of first-frequencies, the second-area being surrounded by a second-element-value series that is obtained by performing interpolation calculation from the first-element-value series for a plurality of second frequencies which are different from the plurality of first-frequencies and which are provided at regular intervals; and determining, by performing the judging for one interval or a plurality of intervals, an interval so that the difference falls within the permissible range for all of the elements of the plurality of scattering parameter
    Type: Application
    Filed: April 26, 2013
    Publication date: December 12, 2013
    Applicant: FUJITSU LIMITED
    Inventors: Kumiko TERAMAE, Yoshiyuki Iwakura, Tsunaki Iwasaki
  • Patent number: 7975253
    Abstract: An object is to simplify a power supply noise analysis model of a circuit board. CAD data of the circuit board is obtained from a CAD apparatus, and overlapping power supply islands among power supply islands existing in different layers of the circuit board are extracted as a power supply pair. Nodes are arranged in the extracted power supply pair, and the nodes of the power supply pair are projected on the power supply islands to which the power supply pair belongs. A mesh region which encloses each node is determined for each power supply island, and impedance (L, R, C) between nodes is calculated. Then, a power supply noise analysis model is created based on the impedance between nodes in each layer, and a capacitance between layers.
    Type: Grant
    Filed: September 28, 2007
    Date of Patent: July 5, 2011
    Assignee: Fujitsu Limited
    Inventors: Yoshiyuki Iwakura, Shogo Fujimori, Tendou Hirai, Hitoshi Chida, Kazuyoshi Kanei, Koutarou Nimura
  • Publication number: 20080163138
    Abstract: An object is to simplify a power supply noise analysis model of a circuit board. CAD data of the circuit board is obtained from a CAD apparatus, and overlapping power supply islands among power supply islands existing in different layers of the circuit board are extracted as a power supply pair. Nodes are arranged in the extracted power supply pair, and the nodes of the power supply pair are projected on the power supply islands to which the power supply pair belongs. A mesh region which encloses each node is determined for each power supply island, and impedance (L, R, C) between nodes is calculated. Then, a power supply noise analysis model is created based on the impedance between nodes in each layer, and a capacitance between layers.
    Type: Application
    Filed: September 28, 2007
    Publication date: July 3, 2008
    Applicant: FUJITSU LIMITED
    Inventors: Yoshiyuki Iwakura, Shogo Fujimori, Tendou Hirai, Hitoshi Chida, Kazuyoshi Kanei, Koutarou Nimura
  • Patent number: 6915249
    Abstract: In order to achieve augmentation of the accuracy in calculation of noise and augmentation of the accuracy in a noise check which is performed, for example, when an electronic circuit is designed and further realize significant reduction of the time required for a noise check and augmentation of the operation efficiency by reduction of the man-hours of a designer in a noise analysis, a noise checking apparatus includes a model production section (3) for producing a simulation model of a circuit portion relating to a noticed wiring line, a simulation section (4) for performing a simulation using the simulation model to calculate a signal waveform which propagates in the noticed wiring line and calculate a noise waveform superposed on the signal waveform for each kind of noise, a noise waveform synthesis section (5) for synthesizing the signal waveform and the noise waveforms with generation timings of the noise waveforms taken into consideration to obtain a noise composite waveform, and a noise checking section
    Type: Grant
    Filed: November 9, 2000
    Date of Patent: July 5, 2005
    Assignee: Fujitsu Limited
    Inventors: Toshiro Sato, Yuji Suwa, Yoshiyuki Iwakura, Kazunari Gotou, Toshiaki Sato, Kazuyoshi Kanei, Masaki Tosaka, Yasuhiro Yamashita
  • Publication number: 20040225487
    Abstract: A power supply noise analysis model generator models power supply layers in circuit boards, and includes: a CAD data obtaining section that obtains CAD data; a CAD data conversion section that converts CAD data into data suitable for noise analysis; a power supply pair extraction section that extracts a power supply pair; a mesh division section that divides a power supply pair region into meshes; a ripple processing section that arranges ripples as wave fronts of electromagnetic waves radiated into the power supply pair region from elements thereon; a node layout section that positions plural nodes on the power supply pair region; a node region determination section that determines node regions; an LRC determination section that determines L, R and C connecting the nodes; a power supply layer model generation section that generates a power supply layer model; and a power supply noise analysis model generation section that generates a power supply noise analysis model.
    Type: Application
    Filed: February 26, 2004
    Publication date: November 11, 2004
    Applicant: FUJITSU LIMITED
    Inventors: Yoshiyuki Iwakura, Toshiaki Sato, Kazuyoshi Kanei, Hitoshi Chida, Kotaro Nimura
  • Patent number: 6662132
    Abstract: A noise analyzing method analyzes a crosstalk noise based on circuit data in which buses having the same signal transmitting direction and buses having opposite signal transmitting directions are distinguished from each other, by analyzing the crosstalk noise only for the same signal transmitting direction with respect to the buses having the same signal transmitting direction.
    Type: Grant
    Filed: December 11, 2000
    Date of Patent: December 9, 2003
    Assignee: Fujitsu Limited
    Inventors: Yasuhiro Yamashita, Shogo Fujimori, Ryoji Yamada, Kazuhiko Tokuda, Makoto Suwada, Masaki Tosaka, Jiro Yoneda, Yoshiyuki Iwakura, Kazunari Gotou
  • Publication number: 20020007253
    Abstract: A noise analyzing method analyzes a crosstalk noise based on circuit data in which buses having the same signal transmitting direction and buses having opposite signal transmitting directions are distinguished from each other, by analyzing the crosstalk noise only for the same signal transmitting direction with respect to the buses having the same signal transmitting direction.
    Type: Application
    Filed: December 11, 2000
    Publication date: January 17, 2002
    Inventors: Yasuhiro Yamashita, Shogo Fujimori, Ryoji Yamada, Kazuhiko Tokuda, Makoto Suwada, Masaki Tosaka, Jiro Yoneda, Yoshiyuki Iwakura, Kazunari Gotou
  • Patent number: 6117183
    Abstract: Disclosed is an interactive CAD apparatus for logic circuit packaging design, wherein provisions are made to display delay times in real time when a component is being moved, so that error-contributing components and interconnections can be easily identified and the optimum position can be easily determined.
    Type: Grant
    Filed: August 26, 1997
    Date of Patent: September 12, 2000
    Assignee: Fujitsu Limited
    Inventors: Mieko Teranishi, Yoshiyuki Iwakura, Masaharu Nishimura, Akira Katsumata, Masato Ariyama
  • Patent number: 5898870
    Abstract: A load sharing method for a parallel computer system having a computer group including a plurality of computers and an operation management mechanism which is a computer for managing the operation of the computer group.
    Type: Grant
    Filed: December 13, 1996
    Date of Patent: April 27, 1999
    Assignee: Hitachi, Ltd.
    Inventors: Tooru Okuda, Yoshiyuki Iwakura, Hirofumi Nagasuka
  • Patent number: 5600568
    Abstract: The logic equipment delay time analysis system provides not only a number of parallel dedicated delay time processors which perform calculation of the delay time, but also a processor-to-processor communications device which is connected to each of the delay time processors and performs communications between these delay time processors. The circuit model of the logic equipment is divided by a circuit model division section into a number of small logic circuits, Data with regard to each of the divided circuit models is assigned to the individual delay time processors and initial values are set into each of the delay time processors, so that the delay times for all paths from each pin at which a signal is input to circuits at which output signals are generated are calculated.
    Type: Grant
    Filed: July 20, 1994
    Date of Patent: February 4, 1997
    Assignee: Fujitsu Limited
    Inventors: Yoshiyuki Iwakura, Atsushi Kimura