Patents by Inventor Yoshiyuki Kataoka

Yoshiyuki Kataoka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11203177
    Abstract: Provided is a decorative sheet which can impart, to molded resin articles, excellent design attractiveness and an excellent touch both due to a rugged shape. The decorative sheet comprises, superposed in the following order, a base layer, a surface layer which is constituted of a cured object obtained from a curable resin composition and has the rugged shape, and a removable thermoplastic resin film.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: December 21, 2021
    Assignee: Dai Nippon Printing Co., Ltd.
    Inventors: Masatoshi Sutou, Yoshiyuki Meiki, Sakie Kataoka, Yoko Takano
  • Patent number: 10948436
    Abstract: A wavelength dispersive X-ray fluorescence spectrometer includes a single one-dimensional detector (10) having detection elements (7) arranged linearly, and includes a detector position change mechanism (11) for setting a position of the one-dimensional detector (10) to either a parallel position at which an arrangement direction of the detection elements (7) is parallel to a spectral angle direction of a spectroscopic device (6) or an intersection position at which the arrangement direction intersects the spectral angle direction. At the parallel position, a receiving surface of the one-dimensional detector (10) is located at a focal point of focused secondary X-rays (42). At the intersection position, a receiving slit (9) is disposed at the focal point of the focused secondary X-rays (42), and the receiving surface is located at a traveling direction side of the focused secondary X-rays (42) farther from the spectroscopic device (6) than the receiving slit (9).
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: March 16, 2021
    Assignee: Rigaku Corporation
    Inventors: Shuichi Kato, Takashi Yamada, Yoshiyuki Kataoka
  • Patent number: 10921267
    Abstract: An X-ray fluorescence analysis method according to an FP method uses a predefined theoretical intensity formula in a standard sample theoretical intensity calculation step for obtaining a sensitivity constant and in an unknown sample theoretical intensity calculation step during iterative calculation. In the formula, only in an absorption term relating to absorption of X-rays, a mass fraction of each component is normalized so that a sum of the mass fractions of all components becomes 1.
    Type: Grant
    Filed: September 3, 2019
    Date of Patent: February 16, 2021
    Assignee: Rigaku Corporation
    Inventors: Yoshiyuki Kataoka, Kosuke Kawakyu
  • Patent number: 10768125
    Abstract: A wavelength dispersive X-ray fluorescence spectrometer of the present invention includes: a position sensitive detector (10) configured to detect intensities of secondary X-rays (41) at different spectral angles, by using detection elements (7) corresponding to the secondary X-rays (41) at different spectral angles; a measured spectrum display unit (14) configured to display a relationship between a position, in an arrangement direction, of each detection element (7), and a detected intensity by the detection element (7), as a measured spectrum, on a display (15); a detection area setting unit (16) configured to be set a peak area and a background area; and a quantification unit (17) configured to calculate, as a net intensity, an intensity of the fluorescent X-rays to be measured, based on a peak intensity in the peak area, a background intensity in the background area, and a background correction coefficient, and to perform quantitative analysis.
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: September 8, 2020
    Assignee: Rigaku Corporation
    Inventors: Shuichi Kato, Yoshiyuki Kataoka, Hajime Fujimura, Takashi Yamada
  • Publication number: 20200003712
    Abstract: An X-ray fluorescence analysis method according to an FP method uses a predefined theoretical intensity formula in a standard sample theoretical intensity calculation step for obtaining a sensitivity constant and in an unknown sample theoretical intensity calculation step during iterative calculation. In the formula, only in an absorption term relating to absorption of X-rays, a mass fraction of each component is normalized so that a sum of the mass fractions of all components becomes 1.
    Type: Application
    Filed: September 3, 2019
    Publication date: January 2, 2020
    Applicant: RIGAKU CORPORATION
    Inventors: Yoshiyuki KATAOKA, Kosuke KAWAKYU
  • Publication number: 20190227008
    Abstract: A wavelength dispersive X-ray fluorescence spectrometer includes a single one-dimensional detector (10) having detection elements (7) arranged linearly, and includes a detector position change mechanism (11) for setting a position of the one-dimensional detector (10) to either a parallel position at which an arrangement direction of the detection elements (7) is parallel to a spectral angle direction of a spectroscopic device (6) or an intersection position at which the arrangement direction intersects the spectral angle direction. At the parallel position, a receiving surface of the one-dimensional detector (10) is located at a focal point of focused secondary X-rays (42). At the intersection position, a receiving slit (9) is disposed at the focal point of the focused secondary X-rays (42), and the receiving surface is located at a traveling direction side of the focused secondary X-rays (42) farther from the spectroscopic device (6) than the receiving slit (9).
    Type: Application
    Filed: March 29, 2019
    Publication date: July 25, 2019
    Applicant: Rigaku Corporation
    Inventors: Shuichi KATO, Takashi YAMADA, Yoshiyuki KATAOKA
  • Publication number: 20190072504
    Abstract: A wavelength dispersive X-ray fluorescence spectrometer of the present invention includes: a position sensitive detector (10) configured to detect intensities of secondary X-rays (41) at different spectral angles, by using detection elements (7) corresponding to the secondary X-rays (41) at different spectral angles; a measured spectrum display unit (14) configured to display a relationship between a position, in an arrangement direction, of each detection element (7), and a detected intensity by the detection element (7), as a measured spectrum, on a display (15); a detection area setting unit (16) configured to be set a peak area and a background area; and a quantification unit (17) configured to calculate, as a net intensity, an intensity of the fluorescent X-rays to be measured, based on a peak intensity in the peak area, a background intensity in the background area, and a background correction coefficient, and to perform quantitative analysis.
    Type: Application
    Filed: November 6, 2018
    Publication date: March 7, 2019
    Applicant: Rigaku Corporation
    Inventors: Shuichi KATO, Yoshiyuki KATAOKA, Hajime FUJIMURA, Takashi YAMADA
  • Patent number: 10161889
    Abstract: A quantitative analysis condition setting unit (13) included in a sequential X-ray fluorescence spectrometer according to the present invention: performs qualitative analyses of a plurality of standard samples (14); sets, on the basis of the qualitative analysis results, a peak measurement angle of each measurement line for analytical samples (1) in quantitative analysis conditions; and obtains a single virtual profile by synthesizing peak profiles of the plurality of standard samples (14) subjected to the qualitative analyses and sets, on the basis of the virtual profile and a preset half value width of the peak profile, background measurement angles of each measurement line for the analytical samples (1) in the quantitative analysis conditions.
    Type: Grant
    Filed: February 21, 2018
    Date of Patent: December 25, 2018
    Assignee: Rigaku Corporation
    Inventors: Shinya Hara, Takashi Matsuo, Yasujiro Yamada, Hisashi Honma, Yoshiyuki Kataoka
  • Patent number: 10082475
    Abstract: A scanning-type X-ray fluorescence spectrometer according to the present invention includes a quantitative analysis condition setting unit configured to determine whether or not to add, as an analytical element, a new detected element other than preset sample constituting elements, from an absorption-enhancement effect degree of fluorescent X-rays on an analytical value of an analytical element and an overlapping effect degree by an interfering line on an analytical line of the analytical element, on the basis of qualitative analysis results and semi-quantitative analysis results of standard samples.
    Type: Grant
    Filed: August 26, 2016
    Date of Patent: September 25, 2018
    Assignee: Rigaku Corporation
    Inventors: Shinya Hara, Takashi Matsuo, Yasujiro Yamada, Hisashi Honma, Yoshiyuki Kataoka
  • Publication number: 20180180563
    Abstract: A quantitative analysis condition setting unit (13) included in a sequential X-ray fluorescence spectrometer according to the present invention: performs qualitative analyses of a plurality of standard samples (14); sets, on the basis of the qualitative analysis results, a peak measurement angle of each measurement line for analytical samples (1) in quantitative analysis conditions; and obtains a single virtual profile by synthesizing peak profiles of the plurality of standard samples (14) subjected to the qualitative analyses and sets, on the basis of the virtual profile and a preset half value width of the peak profile, background measurement angles of each measurement line for the analytical samples (1) in the quantitative analysis conditions.
    Type: Application
    Filed: February 21, 2018
    Publication date: June 28, 2018
    Applicant: Rigaku Corporation
    Inventors: Shinya HARA, Takashi MATSUO, Yasujiro YAMADA, Hisashi HONMA, Yoshiyuki KATAOKA
  • Publication number: 20180106736
    Abstract: A scanning-type X-ray fluorescence spectrometer according to the present invention includes a quantitative analysis condition setting unit (13) configured to determine whether or not to add, as an analytical element, a new detected element other than preset sample constituting elements, from an absorption-enhancement effect degree of fluorescent X-rays on an analytical value of an analytical element and an overlapping effect degree by an interfering line on an analytical line of the analytical element, on the basis of qualitative analysis results and semi-quantitative analysis results of standard samples (14).
    Type: Application
    Filed: August 26, 2016
    Publication date: April 19, 2018
    Applicant: Rigaku Corporation
    Inventors: Shinya HARA, Takashi MATSUO, Yasujiro YAMADA, Hisashi HONMA, Yoshiyuki KATAOKA
  • Patent number: 8774356
    Abstract: In the wavelength dispersive X-ray fluorescence spectrometer of the present invention, a counting loss correcting unit (11), when correcting a counting rate of pulses determined by a counting unit (10) on the basis of a dead time of a detector (7), stores beforehand a correlation between a predetermined pulse height range, within which pulses are selected by a pulse height analyzer (9), and the dead time and determines the dead time so as to correspond to the predetermined pulse height range during a measurement on the basis of the stored correlation.
    Type: Grant
    Filed: April 3, 2012
    Date of Patent: July 8, 2014
    Assignee: Rigaku Corporation
    Inventors: Yoshiyuki Kataoka, Hisashi Inoue, Kosuke Kawakyu
  • Publication number: 20130294577
    Abstract: In the wavelength dispersive X-ray fluorescence spectrometer of the present invention, a counting loss correcting unit (11), when correcting a counting rate of pulses determined by a counting unit (10) on the basis of a dead time of a detector (7), stores beforehand a correlation between a predetermined pulse height range, within which pulses are selected by a pulse height analyzer (9), and the dead time and determines the dead time so as to correspond to the predetermined pulse height range during a measurement on the basis of the stored correlation.
    Type: Application
    Filed: April 3, 2012
    Publication date: November 7, 2013
    Applicant: RIGAKU CORPORATION
    Inventors: Yoshiyuki Kataoka, Hisashi Inoue, Kosuke Kawakyu
  • Patent number: 8433035
    Abstract: An X-ray fluorescence analyzing method includes irradiating a liquid sample (3A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (2); measuring the intensity F of fluorescent X-rays (4) from each of elements in the sample (3A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays (12) from the sample (3A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays (12) is so chosen as to be shorter than that of the fluorescent X-rays (4) and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (3A).
    Type: Grant
    Filed: July 1, 2010
    Date of Patent: April 30, 2013
    Assignee: Rigaku Corporation
    Inventors: Kenji Watanabe, Yoshiyuki Kataoka, Yasujiro Yamada, Atsushi Morikawa
  • Publication number: 20110243301
    Abstract: An X-ray fluorescence analyzing method includes irradiating a liquid sample (3A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (2); measuring the intensity F of fluorescent X-rays (4) from each of elements in the sample (3A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays (12) from the sample (3A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays (12) is so chosen as to be shorter than that of the fluorescent X-rays (4) and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (3A).
    Type: Application
    Filed: July 1, 2010
    Publication date: October 6, 2011
    Applicant: RIGAKU CORPORATION
    Inventors: Kenji Watanabe, Yoshiyuki Kataoka, Yasujiro Yamada, Atsushi Morikawa
  • Patent number: 7949093
    Abstract: An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (11), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube (11) having a target with an element including chromium, an X-ray filter (13) disposed on a path of travel of X-rays between the X-ray tube (11) and the sample (S) and having a predetermined transmittance for Cr—K? line from the X-ray tube (11) and made of a material which is an element of which absorption edges do not exist between energies of S—K? line and Cr—K? line, and a proportional counter (18) having a detector gas containing a neon gas or a helium gas.
    Type: Grant
    Filed: November 24, 2006
    Date of Patent: May 24, 2011
    Assignee: Rigaku Industrial Corporation
    Inventors: Yoshiyuki Kataoka, Hisayuki Kohno, Noboru Yamashita, Makoto Doi
  • Publication number: 20090116613
    Abstract: An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (11), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube (11) having a target with an element including chromium, an X-ray filter (13) disposed on a path of travel of X-rays between the X-ray tube (11) and the sample (S) and having a predetermined transmittance for Cr—K? line from the X-ray tube (11) and made of a material which is an element of which absorption edges do not exist between energies of S—K? line and Cr—K? line, and a proportional counter (18) having a detector gas containing a neon gas or a helium gas.
    Type: Application
    Filed: November 24, 2006
    Publication date: May 7, 2009
    Applicant: RIGAKU INDUSTRIAL CORPORATION
    Inventors: Yoshiyuki Kataoka, Hisayuki Kohno, Noboru Yamashita, Makoto Doi
  • Patent number: 7450685
    Abstract: A scanning X-ray fluorescence spectrometer includes a quantitatively analyzing device (18) which calculates the concentration of hexavalent chrome based on the fact that the peak spectroscopic angle, at which the maximum intensity is attained in Cr—K? line (22), changes depending on the ratio of the concentration of the hexavalent chrome vs. the concentration of the intensity of the total chrome. A plurality of detecting device (23) having different resolutions as a combination of a divergence slit (11), a spectroscopic device (6), a receiving slit (20) and a detector (8) is provided such that when the change of the peak spectroscopic angle is to be detected, a detecting device (23B) having a higher resolution than that of the detecting device (23A), which is selected when the concentration or the intensity of the total chrome is to be determined, is selected.
    Type: Grant
    Filed: October 17, 2006
    Date of Patent: November 11, 2008
    Assignee: Rigaku Industrial Corporation
    Inventors: Yoshiyuki Kataoka, Hisayuki Kohno, Masatsugu Kuraoka, Takashi Shoji, Yasujiro Yamada
  • Patent number: 7356114
    Abstract: An X-ray fluorescence spectrometer includes an X-ray source 7 for irradiating a sample 1 at a predetermined incident angle ø with primary X-rays 6, and a detecting device 9 for measuring an intensity of fluorescent X-rays 8 generated from the sample at a predetermined detection angle ? and ?, wherein with two combinations of the incident angle ø and the detection angle ? and ?, in which combinations the incident angles ø and/or the detection angles ? and ? are different from each other, each intensity of the fluorescent X-rays 8 is measured and, also, the incident angle ø and the detection angle ? and ? in each of the combination are so set that with respect to a measurement depth represented by the coating weight, at which the intensity of the fluorescent X-rays 8 attains a value equal to 99% of the uppermost limit when the coating weight of a target coating to be measured is increased, respective measurement depths in the two combinations may be a value greater than the coating weight of a coating 3.
    Type: Grant
    Filed: September 13, 2006
    Date of Patent: April 8, 2008
    Assignee: Rigaku Industrial Corporation
    Inventors: Yoshiyuki Kataoka, Eiichi Furusawa, Hisayuki Kohno
  • Patent number: 7215729
    Abstract: A resistance member (e.g., fuel holding portion of the lower tie plate) is provided at the lower end of the fuel assembly. Provision is made of a coolant ascending path in which said water rods have coolant inlet ports that are open in a region lower than the resistance member to upwardly guide the coolant, and a coolant descending path which has a coolant delivery port that is open in a region higher than the resistance member to downwardly guide the coolant. The coolant ascending path and the coolant descending path are communicated with each other at their upper end portions.
    Type: Grant
    Filed: June 6, 1995
    Date of Patent: May 8, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Osamu Yokomizo, Yuichiro Yoshimoto, Yoshiyuki Kataoka, Shinichi Kashiwai, Yasuhiro Masuhara, Akio Tomiyama, Akihito Orii, Kotaro Inoue, Takaaki Mochida, Tatsuo Hayashi